公开(公告)号：US20170186627A1

公开(公告)日：2017-06-29

申请号：US15456767

申请日：2017-03-13

Applicant: Kulicke and Soffa Industries, Inc.

Inventor： Robert N. Chylak ,  Dominick A. DeAngelis ,  Horst Clauberg

IPC: H01L21/449 ,  H01L21/762 ,  H01L25/00 ,  H01L25/065 ,  H01L23/00

CPC classification number: H01L21/449 ,  H01L21/76251 ,  H01L24/11 ,  H01L24/13 ,  H01L24/16 ,  H01L24/17 ,  H01L24/48 ,  H01L24/75 ,  H01L24/81 ,  H01L25/03 ,  H01L25/0657 ,  H01L25/105 ,  H01L25/50 ,  H01L2021/60195 ,  H01L2224/1134 ,  H01L2224/1145 ,  H01L2224/11462 ,  H01L2224/13082 ,  H01L2224/131 ,  H01L2224/13109 ,  H01L2224/13124 ,  H01L2224/13139 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13187 ,  H01L2224/136 ,  H01L2224/13687 ,  H01L2224/16148 ,  H01L2224/16225 ,  H01L2224/16238 ,  H01L2224/48091 ,  H01L2224/48225 ,  H01L2224/75251 ,  H01L2224/75252 ,  H01L2224/75301 ,  H01L2224/75343 ,  H01L2224/75348 ,  H01L2224/75349 ,  H01L2224/75744 ,  H01L2224/75745 ,  H01L2224/759 ,  H01L2224/81121 ,  H01L2224/81193 ,  H01L2224/81201 ,  H01L2224/81203 ,  H01L2224/81205 ,  H01L2224/81207 ,  H01L2224/81355 ,  H01L2224/81409 ,  H01L2224/81424 ,  H01L2224/81439 ,  H01L2224/81444 ,  H01L2224/81447 ,  H01L2224/81801 ,  H01L2224/81895 ,  H01L2224/81906 ,  H01L2224/94 ,  H01L2225/06513 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2924/00014 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/181 ,  H01L2924/19107 ,  H01L2924/20102 ,  H01L2924/20103 ,  H01L2924/20104 ,  H01L2924/20105 ,  H01L2924/20106 ,  H01L2924/20107 ,  H01L2924/20301 ,  H01L2924/20302 ,  H01L2924/20303 ,  H01L2924/20304 ,  H01L2924/20305 ,  H01L2924/20306 ,  H01L2924/20307 ,  H01L2924/01029 ,  H01L2924/01014 ,  H01L2924/00012 ,  H01L2924/014 ,  H01L2224/8121 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/81 ,  H01L2924/04941 ,  H01L2924/04953 ,  H01L2924/0503 ,  H01L2924/01013 ,  H01L2924/0504 ,  H01L2924/0105 ,  H01L2924/0502 ,  H01L2924/0103 ,  H01L2924/0494 ,  H01L2924/0104 ,  H01L2924/0495 ,  H01L2924/01023 ,  H01L2924/0496 ,  H01L2924/01024 ,  H01L2924/05 ,  H01L2924/01028 ,  H01L2924/0543 ,  H01L2924/0544 ,  H01L2924/0542 ,  H01L2924/0534 ,  H01L2924/0535 ,  H01L2924/0536 ,  H01L2924/054 ,  H01L2924/0463 ,  H01L2924/0464 ,  H01L2924/0462 ,  H01L2924/0454 ,  H01L2924/0455 ,  H01L2924/0456 ,  H01L2924/046 ,  H01L2924/01105

Abstract: A method of ultrasonically bonding semiconductor elements includes the steps of: (a) aligning surfaces of a plurality of first conductive structures of a first semiconductor element to respective surfaces of a plurality of second conductive structures of a second semiconductor element; and (b) ultrasonically bonding ones of the first conductive structures to respective ones of the second conductive structures. A bonding surface of at least one of the first conductive structures and the second conductive structures includes a frangible coating.

公开(公告)号：US20180108626A1

公开(公告)日：2018-04-19

申请号：US15642742

申请日：2017-07-06

Applicant: International Business Machines Corporation

Inventor： Ekta Misra ,  Krishna R. Tunga

IPC: H01L23/00

CPC classification number: H01L24/05 ,  H01L24/03 ,  H01L24/11 ,  H01L24/13 ,  H01L2224/02126 ,  H01L2224/0215 ,  H01L2224/02166 ,  H01L2224/02185 ,  H01L2224/0219 ,  H01L2224/03013 ,  H01L2224/0401 ,  H01L2224/05073 ,  H01L2224/05082 ,  H01L2224/05083 ,  H01L2224/05147 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05191 ,  H01L2224/05611 ,  H01L2224/05616 ,  H01L2224/05624 ,  H01L2224/05639 ,  H01L2224/05644 ,  H01L2224/05647 ,  H01L2224/05657 ,  H01L2224/05666 ,  H01L2224/05669 ,  H01L2224/0567 ,  H01L2224/05676 ,  H01L2224/05681 ,  H01L2224/05684 ,  H01L2224/05687 ,  H01L2224/05691 ,  H01L2224/05693 ,  H01L2224/131 ,  H01L2224/13111 ,  H01L2924/07025 ,  H01L2924/3511 ,  H01L2924/35121 ,  H01L2924/014 ,  H01L2924/01047 ,  H01L2924/00014 ,  H01L2924/04953 ,  H01L2924/04941 ,  H01L2924/0455 ,  H01L2924/01073 ,  H01L2924/04541 ,  H01L2924/0469 ,  H01L2924/0463 ,  H01L2924/01013 ,  H01L2924/0476 ,  H01L2924/01074 ,  H01L2924/0496 ,  H01L2924/0538 ,  H01L2924/01044 ,  H01L2924/0479 ,  H01L2924/01027 ,  H01L2924/048 ,  H01L2924/01028 ,  H01L2924/01006

Abstract: Embodiments are directed to a method of forming a semiconductor chip package and resulting structures having an annular PSPI region formed under a BLM pad. An annular region is formed under a barrier layer metallurgy (BLM) pad. The annular region includes a photosensitive polyimide (PSPI). A conductive pedestal is formed on a surface of the BLM pad and a solder bump is formed on a surface of the conductive pedestal. The annular PSPI region reduces wafer warpage and ULK peeling stress.

公开(公告)号：US20170158807A1

公开(公告)日：2017-06-08

申请号：US15321628

申请日：2015-07-01

Applicant: DIC CORPORATION

Inventor： Yasuyo YOSHIMOTO ,  Hiroshi KINOSHITA

IPC: C08G59/32 ,  C09J163/00 ,  C08K9/08 ,  C08K3/36 ,  C08K3/22 ,  H01L23/00 ,  C08K7/02 ,  H05K1/02 ,  H05K1/03 ,  H01L23/29 ,  H01L23/373 ,  C08G59/50 ,  C09J11/04

CPC classification number: C08G59/3218 ,  C08G59/245 ,  C08G59/32 ,  C08G59/5073 ,  C08K3/00 ,  C08K3/22 ,  C08K3/36 ,  C08K7/02 ,  C08K9/08 ,  C08K2003/2227 ,  C08K2201/001 ,  C08L63/00 ,  C09J9/00 ,  C09J11/04 ,  C09J163/00 ,  H01L23/295 ,  H01L23/3737 ,  H01L24/29 ,  H01L2224/2919 ,  H01L2924/01006 ,  H01L2924/04541 ,  H01L2924/0463 ,  H01L2924/04642 ,  H01L2924/0503 ,  H01L2924/05032 ,  H01L2924/05042 ,  H01L2924/0532 ,  H01L2924/0542 ,  H01L2924/05432 ,  H01L2924/05442 ,  H01L2924/0665 ,  H01L2924/186 ,  H05K1/0203 ,  H05K1/0373 ,  H05K2201/0104

Abstract: An epoxy resin composition for electronic material, containing a polyfunctional biphenyl type epoxy resin that is a triglycidyloxybiphenyl or a tetraglycidyloxybiphenyl and at least one of a curing agent and a curing accelerator is provided. Furthermore, the epoxy resin composition for electronic material, further containing a filler, in particular, a thermal conductive filler, is provided. Furthermore, a cured product obtained by curing the epoxy resin composition for electronic material, and an electronic component containing the cured product are provided.

公开(公告)号：US09754905B1

公开(公告)日：2017-09-05

申请号：US15292433

申请日：2016-10-13

Applicant: International Business Machines Corporation

Inventor： Ekta Misra ,  Krishna R. Tunga

IPC: H01L23/00

CPC classification number: H01L24/05 ,  H01L24/03 ,  H01L24/11 ,  H01L24/13 ,  H01L2224/02126 ,  H01L2224/0215 ,  H01L2224/02166 ,  H01L2224/02185 ,  H01L2224/0219 ,  H01L2224/03013 ,  H01L2224/0401 ,  H01L2224/05073 ,  H01L2224/05082 ,  H01L2224/05083 ,  H01L2224/05147 ,  H01L2224/05155 ,  H01L2224/05166 ,  H01L2224/05191 ,  H01L2224/05611 ,  H01L2224/05616 ,  H01L2224/05624 ,  H01L2224/05639 ,  H01L2224/05644 ,  H01L2224/05647 ,  H01L2224/05657 ,  H01L2224/05666 ,  H01L2224/05669 ,  H01L2224/0567 ,  H01L2224/05676 ,  H01L2224/05681 ,  H01L2224/05684 ,  H01L2224/05687 ,  H01L2224/05691 ,  H01L2224/05693 ,  H01L2224/131 ,  H01L2224/13111 ,  H01L2924/07025 ,  H01L2924/3511 ,  H01L2924/35121 ,  H01L2924/014 ,  H01L2924/01047 ,  H01L2924/00014 ,  H01L2924/04953 ,  H01L2924/04941 ,  H01L2924/0455 ,  H01L2924/01073 ,  H01L2924/04541 ,  H01L2924/0469 ,  H01L2924/0463 ,  H01L2924/01013 ,  H01L2924/0476 ,  H01L2924/01074 ,  H01L2924/0496 ,  H01L2924/0538 ,  H01L2924/01044 ,  H01L2924/0479 ,  H01L2924/01027 ,  H01L2924/048 ,  H01L2924/01028 ,  H01L2924/01006

Abstract: Embodiments are directed to a method of forming a semiconductor chip package and resulting structures having an annular PSPI region formed under a BLM pad. An annular region is formed under a barrier layer metallurgy (BLM) pad. The annular region includes a photosensitive polyimide (PSPI). A conductive pedestal is formed on a surface of the BLM pad and a solder bump is formed on a surface of the conductive pedestal. The annular PSPI region reduces wafer warpage and ULK peeling stress.

公开(公告)号：US09779965B2

公开(公告)日：2017-10-03

申请号：US15456767

申请日：2017-03-13

Applicant: Kulicke and Soffa Industries, Inc.

Inventor： Robert N. Chylak ,  Dominick A. DeAngelis ,  Horst Clauberg

IPC: H01L21/449 ,  H01L23/00 ,  H01L25/00 ,  H01L25/065 ,  H01L21/762 ,  H01L21/60

CPC classification number: H01L21/449 ,  H01L21/76251 ,  H01L24/11 ,  H01L24/13 ,  H01L24/16 ,  H01L24/17 ,  H01L24/48 ,  H01L24/75 ,  H01L24/81 ,  H01L25/03 ,  H01L25/0657 ,  H01L25/105 ,  H01L25/50 ,  H01L2021/60195 ,  H01L2224/1134 ,  H01L2224/1145 ,  H01L2224/11462 ,  H01L2224/13082 ,  H01L2224/131 ,  H01L2224/13109 ,  H01L2224/13124 ,  H01L2224/13139 ,  H01L2224/13144 ,  H01L2224/13147 ,  H01L2224/13187 ,  H01L2224/136 ,  H01L2224/13687 ,  H01L2224/16148 ,  H01L2224/16225 ,  H01L2224/16238 ,  H01L2224/48091 ,  H01L2224/48225 ,  H01L2224/75251 ,  H01L2224/75252 ,  H01L2224/75301 ,  H01L2224/75343 ,  H01L2224/75348 ,  H01L2224/75349 ,  H01L2224/75744 ,  H01L2224/75745 ,  H01L2224/759 ,  H01L2224/81121 ,  H01L2224/81193 ,  H01L2224/81201 ,  H01L2224/81203 ,  H01L2224/81205 ,  H01L2224/81207 ,  H01L2224/81355 ,  H01L2224/81409 ,  H01L2224/81424 ,  H01L2224/81439 ,  H01L2224/81444 ,  H01L2224/81447 ,  H01L2224/81801 ,  H01L2224/81895 ,  H01L2224/81906 ,  H01L2224/94 ,  H01L2225/06513 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2924/00014 ,  H01L2924/01047 ,  H01L2924/01049 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/181 ,  H01L2924/19107 ,  H01L2924/20102 ,  H01L2924/20103 ,  H01L2924/20104 ,  H01L2924/20105 ,  H01L2924/20106 ,  H01L2924/20107 ,  H01L2924/20301 ,  H01L2924/20302 ,  H01L2924/20303 ,  H01L2924/20304 ,  H01L2924/20305 ,  H01L2924/20306 ,  H01L2924/20307 ,  H01L2924/01029 ,  H01L2924/01014 ,  H01L2924/00012 ,  H01L2924/014 ,  H01L2224/8121 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/81 ,  H01L2924/04941 ,  H01L2924/04953 ,  H01L2924/0503 ,  H01L2924/01013 ,  H01L2924/0504 ,  H01L2924/0105 ,  H01L2924/0502 ,  H01L2924/0103 ,  H01L2924/0494 ,  H01L2924/0104 ,  H01L2924/0495 ,  H01L2924/01023 ,  H01L2924/0496 ,  H01L2924/01024 ,  H01L2924/05 ,  H01L2924/01028 ,  H01L2924/0543 ,  H01L2924/0544 ,  H01L2924/0542 ,  H01L2924/0534 ,  H01L2924/0535 ,  H01L2924/0536 ,  H01L2924/054 ,  H01L2924/0463 ,  H01L2924/0464 ,  H01L2924/0462 ,  H01L2924/0454 ,  H01L2924/0455 ,  H01L2924/0456 ,  H01L2924/046 ,  H01L2924/01105

Abstract: A method of ultrasonically bonding semiconductor elements includes the steps of: (a) aligning surfaces of a plurality of first conductive structures of a first semiconductor element to respective surfaces of a plurality of second conductive structures of a second semiconductor element; and (b) ultrasonically bonding ones of the first conductive structures to respective ones of the second conductive structures. A bonding surface of at least one of the first conductive structures and the second conductive structures includes a frangible coating.

公开(公告)号：US20170144221A1

公开(公告)日：2017-05-25

申请号：US15316684

申请日：2015-06-12

Applicant: Alpha Metals, Inc.

Inventor： Shamik GHOSHAL ,  V. Sathish KUMAR ,  Pavan VISHWANATH ,  Ranjit S. PANDHER ,  Remya CHANDRAN ,  Sutapa MUKHERJEE ,  Siuli SARKAR ,  Bawa SINGH ,  Ravindra Mohan BHATKAL

IPC: B22F1/00 ,  B23K3/06 ,  H01L21/78 ,  B23K35/30 ,  B22F1/02 ,  H01L23/00 ,  B23K1/00 ,  B23K35/02

CPC classification number: B22F1/0044 ,  B22F1/02 ,  B22F3/1017 ,  B22F3/22 ,  B22F5/006 ,  B22F7/04 ,  B22F2007/047 ,  B22F2301/255 ,  B22F2999/00 ,  B23K1/0016 ,  B23K3/0607 ,  B23K35/0244 ,  B23K35/3006 ,  B23K2101/40 ,  H01L21/6835 ,  H01L21/78 ,  H01L24/05 ,  H01L24/11 ,  H01L24/13 ,  H01L24/16 ,  H01L24/27 ,  H01L24/29 ,  H01L24/32 ,  H01L24/75 ,  H01L24/81 ,  H01L24/83 ,  H01L24/84 ,  H01L24/85 ,  H01L24/94 ,  H01L24/95 ,  H01L24/97 ,  H01L2221/68313 ,  H01L2221/68368 ,  H01L2224/04026 ,  H01L2224/05155 ,  H01L2224/05639 ,  H01L2224/11003 ,  H01L2224/11009 ,  H01L2224/111 ,  H01L2224/11332 ,  H01L2224/11334 ,  H01L2224/11438 ,  H01L2224/1144 ,  H01L2224/11505 ,  H01L2224/11848 ,  H01L2224/13139 ,  H01L2224/13294 ,  H01L2224/13295 ,  H01L2224/13311 ,  H01L2224/13324 ,  H01L2224/13339 ,  H01L2224/13347 ,  H01L2224/13355 ,  H01L2224/13363 ,  H01L2224/1338 ,  H01L2224/13384 ,  H01L2224/13387 ,  H01L2224/1339 ,  H01L2224/13393 ,  H01L2224/13411 ,  H01L2224/13439 ,  H01L2224/13444 ,  H01L2224/13455 ,  H01L2224/13464 ,  H01L2224/13469 ,  H01L2224/1349 ,  H01L2224/16227 ,  H01L2224/27002 ,  H01L2224/27003 ,  H01L2224/27009 ,  H01L2224/271 ,  H01L2224/27312 ,  H01L2224/2732 ,  H01L2224/27332 ,  H01L2224/27334 ,  H01L2224/27438 ,  H01L2224/2744 ,  H01L2224/27505 ,  H01L2224/2782 ,  H01L2224/27821 ,  H01L2224/27848 ,  H01L2224/29139 ,  H01L2224/29294 ,  H01L2224/29295 ,  H01L2224/29311 ,  H01L2224/29324 ,  H01L2224/29339 ,  H01L2224/29344 ,  H01L2224/29347 ,  H01L2224/29355 ,  H01L2224/29363 ,  H01L2224/29364 ,  H01L2224/2938 ,  H01L2224/29384 ,  H01L2224/29387 ,  H01L2224/2939 ,  H01L2224/29393 ,  H01L2224/29411 ,  H01L2224/29439 ,  H01L2224/29444 ,  H01L2224/29455 ,  H01L2224/29464 ,  H01L2224/29469 ,  H01L2224/2949 ,  H01L2224/2969 ,  H01L2224/32225 ,  H01L2224/32245 ,  H01L2224/45014 ,  H01L2224/75251 ,  H01L2224/75316 ,  H01L2224/7598 ,  H01L2224/81002 ,  H01L2224/81191 ,  H01L2224/8184 ,  H01L2224/81948 ,  H01L2224/83002 ,  H01L2224/83191 ,  H01L2224/83193 ,  H01L2224/83222 ,  H01L2224/83439 ,  H01L2224/83444 ,  H01L2224/83447 ,  H01L2224/8384 ,  H01L2224/83948 ,  H01L2224/94 ,  H01L2224/95 ,  H01L2224/97 ,  H01L2924/00014 ,  H01L2924/0463 ,  H01L2924/0503 ,  H01L2924/05032 ,  H01L2924/20105 ,  H01L2924/20106 ,  H01L2924/20107 ,  H01L2924/20108 ,  H01L2924/20109 ,  H01L2924/2011 ,  H01L2924/2064 ,  H05K3/32 ,  H05K2203/1131 ,  B22F1/0018 ,  B22F1/025 ,  H01L2224/11 ,  H01L2924/00012 ,  H01L2224/81 ,  H01L2224/83 ,  H01L2224/27 ,  H01L2924/01046 ,  H01L2924/01029 ,  H01L2924/01042 ,  H01L2924/01028 ,  H01L2924/0105 ,  H01L2924/01006 ,  H01L2924/01005 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2924/206

Abstract: Methods for die attachment of multichip and single components including flip chips may involve printing a sintering paste on a substrate or on the back side of a die. Printing may involve stencil printing, screen printing, or a dispensing process. Paste may be printed on the back side of an entire wafer prior to dicing, or on the back side of an individual die. Sintering films may also be fabricated and transferred to a wafer, die or substrate. A post-sintering step may increase throughput.