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公开(公告)号:US12119055B2
公开(公告)日:2024-10-15
申请号:US17329028
申请日:2021-05-24
Applicant: Micron Technology, Inc.
Inventor: Hernan A. Castro , Everardo Torres Flores , Jeremy M. Hirst
CPC classification number: G11C13/0004 , G11C5/025 , G11C5/063 , G11C13/0023 , H10B63/24 , H10B63/30 , H10B63/80 , H10B63/84 , G11C8/08 , G11C2213/71 , G11C2213/77 , H10N70/231 , H10N70/826 , H10N70/8828
Abstract: Row electrode drivers and column electrode drivers for a memory device are distributed within a footprint share by a memory cell array.
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公开(公告)号:US20240339149A1
公开(公告)日:2024-10-10
申请号:US18749412
申请日:2024-06-20
Applicant: Micron Technology, Inc.
Inventor: Joseph Michael McCrate , Robert John Gleixner , Hari Giduturi , Ramin Ghodsi
IPC: G11C11/408 , G11C11/4091 , G11C13/00
CPC classification number: G11C11/4087 , G11C11/4091 , G11C13/0002 , G11C13/0023 , G11C13/0026 , G11C13/003 , G11C13/004 , G11C13/0069 , G11C2013/0045 , G11C2211/4013
Abstract: The application relates to an architecture that allows for less precision of demarcation read voltages by combining two physical memory cells into a single logical bit. Reciprocal binary values may be written into the two memory cells that make up a memory pair. When activated using bias circuitry and address decoders the memory cell pair creates current paths having currents that may be compared to detect a differential signal. The application is also directed to writing and reading memory cell pairs.
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公开(公告)号:US11984163B2
公开(公告)日:2024-05-14
申请号:US17665123
申请日:2022-02-04
Applicant: HEFEI RELIANCE MEMORY LIMITED
Inventor: Deepak Chandra Sekar , Gary Bela Bronner , Frederick A. Ware
CPC classification number: G11C13/0069 , G11C13/0002 , G11C13/0007 , G11C13/0023 , G11C13/003 , G11C13/004 , G11C13/0097 , G11C2213/15 , G11C2213/72 , G11C2213/74 , G11C2213/75 , G11C2213/78 , G11C2213/79
Abstract: A memory cell includes a first resistive memory element, a second resistive memory element electrically coupled with the first resistive memory element at a common node, and a switching element comprising an input terminal electrically coupled with the common node, the switching element comprising a driver configured to float during one or more operations.
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公开(公告)号:US11887661B2
公开(公告)日:2024-01-30
申请号:US17647578
申请日:2022-01-10
Applicant: Micron Technology, Inc.
Inventor: Innocenzo Tortorelli , Fabio Pellizzer , Mattia Robustelli , Alessandro Sebastiani
IPC: G11C13/00
CPC classification number: G11C13/003 , G11C13/0004 , G11C13/004 , G11C13/0023 , G11C13/0069 , G11C2213/71
Abstract: Methods, systems, and devices for a cross-point pillar architecture for memory arrays are described. Multiple selector devices may be configured to access or activate a pillar within a memory array, where the selector devices may each be or include a chalcogenide material. A pillar access line may be coupled with multiple selector devices, where each selector device may correspond to a pillar associated with the pillar access line. Pillar access lines on top and bottom of the pillars of the memory array may be aligned in a square or rectangle formation, or in a hexagonal formation. Pillars and corresponding selector devices on top and bottom of the pillars may be located at overlapping portions of the pillar access lines, thereby forming a cross point architecture for pillar selection or activation. The selector devices may act in pairs to select or activate a pillar upon application of a respective selection voltage.
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公开(公告)号:US20230402094A1
公开(公告)日:2023-12-14
申请号:US18457188
申请日:2023-08-28
Applicant: Micron Technology, Inc.
Inventor: Hari Giduturi
CPC classification number: G11C13/003 , G11C13/0023 , G11C11/1659 , G11C11/1653
Abstract: Methods and systems include memory devices with multiple access lines arranged in an array to form a multiple intersections. Memory cells are located at the intersections of the multiple access lines. Decoders are configured to drive the multiple memory cells via the multiple access lines. Variable biasing circuitry may bias a voltage on an access line of the multiple access lines to change a variable ramp rate of the voltage on the access line. A control circuit is configured to determine a memory cell of the multiple memory cells to be activated. Based at least in part on a distance from the memory cell to a corresponding decoder, the control circuit may set the variable ramp rate of the biasing circuitry.
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公开(公告)号:US11830548B2
公开(公告)日:2023-11-28
申请号:US17707116
申请日:2022-03-29
Applicant: Micron Technology, Inc.
Inventor: Paolo Amato , Marco Sforzin
CPC classification number: G11C13/0023 , G11C13/0069 , G11C13/0004 , G11C2013/0078 , G11C2013/0092
Abstract: The present disclosure relates to a memory device comprising a plurality of memory cells, each memory cell being programmable to a logic state corresponding to a threshold voltage exhibited by the memory cell in response to an applied voltage, and a logic circuit portion operatively coupled to the plurality of memory cells, wherein the logic circuit portion is configured to scan memory addresses of the memory device, and to generate seasoning pulses to be applied to the addressed pages of the memory device. A related electronic system and related methods are also disclosed.
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公开(公告)号:US11810618B2
公开(公告)日:2023-11-07
申请号:US17453136
申请日:2021-11-01
Applicant: Micron Technology, Inc.
Inventor: Vijay S. Ramesh , Allan Porterfield
CPC classification number: G11C13/0023 , G06F7/57 , G06F9/3001 , G06F9/542 , G06F9/546 , G11C13/004 , G11C13/0069 , G11C2213/71
Abstract: Systems, apparatuses, and methods related to extended memory communication subsystems for performing extended memory operations are described. An example method can include receiving, at a processing unit that is coupled between a host device and a non-volatile memory device, signaling indicative of a plurality of operations to be performed on data written to or read from the non-volatile memory device. The method can further include performing, at the processing unit, at least one operation of the plurality of operations in response to the signaling. The method can further include accessing a portion of a memory array in the non-volatile memory device. The method can further include transmitting additional signaling indicative of a command to perform one or more additional operations of the plurality of operations on the data written to or read from the non-volatile memory device.
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公开(公告)号:US11742028B2
公开(公告)日:2023-08-29
申请号:US18053201
申请日:2022-11-07
Applicant: Micron Technology, Inc.
Inventor: Timothy B. Cowles , George B. Raad , James S. Rehmeyer , Jonathan S. Parry
IPC: G11C16/14 , G11C16/30 , G11C17/16 , G11C17/18 , G11C16/22 , G11C13/00 , G11C11/16 , G11C11/22 , G11C16/08
CPC classification number: G11C16/14 , G11C11/165 , G11C11/1653 , G11C11/1675 , G11C11/1697 , G11C11/225 , G11C11/2253 , G11C11/2275 , G11C11/2297 , G11C13/0004 , G11C13/0023 , G11C13/0038 , G11C13/0059 , G11C13/0097 , G11C16/08 , G11C16/22 , G11C16/30 , G11C17/165 , G11C17/18
Abstract: Memory devices, systems including memory devices, and methods of operating memory devices and systems are provided, in which at least a subset of a non-volatile memory array is configured to behave as a volatile memory by erasing or degrading data in the event of a changed power condition such as a power-loss event, a power-off event, or a power-on event. In one embodiment of the present technology, a memory device is provided, comprising a non-volatile memory array, and circuitry configured to store one or more addresses of the non-volatile memory array, to detect a changed power condition of the memory device, and to erase or degrade data at the one or more addresses in response to detecting the changed power condition.
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公开(公告)号:US11737290B2
公开(公告)日:2023-08-22
申请号:US17542638
申请日:2021-12-06
Inventor: Chin-Chieh Yang , Chih-Yang Chang , Wen-Ting Chu , Yu-Wen Liao
IPC: H10B63/00 , G11C13/00 , H10N70/20 , H10N70/00 , H01L23/522 , H01L23/528 , H01L27/10
CPC classification number: H10B63/82 , G11C13/0011 , G11C13/0069 , H10B63/30 , H10B63/80 , H10N70/063 , H10N70/20 , H10N70/24 , H10N70/826 , H10N70/841 , H10N70/8833 , H10N70/8836 , G11C13/004 , G11C13/0023 , G11C2213/79 , H01L23/5226 , H01L23/5283 , H01L27/101 , H10B63/84 , H10N70/011 , H10N70/023 , H10N70/821 , H10N70/8845
Abstract: The present disclosure, in some embodiments, relates to an integrated chip. The integrated chip includes a first resistive random access memory (RRAM) element over a substrate. The first RRAM element has a first terminal and a second terminal. A second RRAM element is arranged over the substrate and has a third terminal and a fourth terminal. The third terminal is electrically coupled to the first terminal of the first RRAM element. A reading circuit is coupled to the second terminal and the fourth terminal. The reading circuit is configured to read a single data state from both a first non-zero read current received from the first RRAM element and a second non-zero read current received from the second RRAM element.
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公开(公告)号:US20190198102A1
公开(公告)日:2019-06-27
申请号:US16291879
申请日:2019-03-04
Applicant: SK hynix Inc.
Inventor: Jung Hyuk YOON , Yoon Jae SHIN
CPC classification number: G11C13/0028 , G06F3/0604 , G06F3/0659 , G06F3/0673 , G11C11/16 , G11C11/1653 , G11C11/1659 , G11C13/0002 , G11C13/0023 , G11C13/0038 , G11C13/004 , G11C13/0069
Abstract: A semiconductor memory apparatus includes a column address decoding unit configured to decode a column address and generate a column select signal; a row address decoding unit configured to decode a row address and generate a word line select signal; a driving driver unit configured to provide different voltages to a plurality of resistive memory elements in response to the column select signal; a sink current control unit configured to generate a plurality of sink voltages with different voltage levels in response to the word line select signal; and a plurality of current sink units configured to flow current from the plurality of respective resistive memory elements to a ground terminal in response to the plurality of sink voltages.
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