公开(公告)号：US20210391214A1

公开(公告)日：2021-12-16

申请号：US16902655

申请日：2020-06-16

Applicant: APPLIED MATERIALS, INC.

Inventor： Lanlan ZHONG ,  Shirish A. PETHE ,  Fuhong ZHANG ,  Joung Joo LEE ,  Kishor KALATHIPARAMBIL ,  Xiangjin XIE ,  Xianmin TANG

IPC: H01L21/768 ,  H01L21/321

Abstract: A method of filling structures on a substrate uses a semi-dynamic reflow process. The method may include depositing a metallic material on the substrate at a first temperature, heating the substrate to a second temperature higher than the first temperature wherein heating of the substrate causes a static reflow of the deposited metallic material on the substrate, stopping heating of the substrate, and depositing additional metallic material on the substrate causing a dynamic reflow of the deposited additional metallic material on the substrate. RF bias power may be applied during the dynamic reflow to facilitate in maintaining the temperature of the substrate.

公开(公告)号：US20170253959A1

公开(公告)日：2017-09-07

申请号：US15448996

申请日：2017-03-03

Applicant: APPLIED MATERIALS, INC.

Inventor： Xiaodong WANG ,  Joung Joo LEE ,  Fuhong ZHANG ,  Martin Lee RIKER ,  Keith A. MILLER ,  William FRUCHTERMAN ,  Rongjun WANG ,  Adolph Miller ALLEN ,  Shouyin ZHANG ,  Xianmin TANG

IPC: C23C14/35 ,  H01J37/34 ,  C23C14/54

CPC classification number: C23C14/351 ,  C23C14/54 ,  H01J37/3405 ,  H01J37/3447 ,  H01J37/3455 ,  H01J37/3458 ,  H01L21/2855 ,  H01L21/76871 ,  H01L21/76879

Abstract: Methods and apparatus for controlling the ion fraction in physical vapor deposition processes are disclosed. In some embodiments, a process chamber for processing a substrate having a given diameter includes: an interior volume and a target to be sputtered, the interior volume including a central portion and a peripheral portion; a rotatable magnetron above the target to form an annular plasma in the peripheral portion; a substrate support disposed in the interior volume to support a substrate having the given diameter; a first set of magnets disposed about the body to form substantially vertical magnetic field lines in the peripheral portion; a second set of magnets disposed about the body and above the substrate support to form magnetic field lines directed toward a center of the support surface; a first power source to electrically bias the target; and a second power source to electrically bias the substrate support.

公开(公告)号：US20250157790A1

公开(公告)日：2025-05-15

申请号：US18926504

申请日：2024-10-25

Applicant: Applied Materials, Inc.

Inventor： Bencherki MEBARKI ,  Sang-Heum KIM ,  Joung Joo LEE

IPC: H01J37/32 ,  C23C14/34 ,  C23C14/35

Abstract: Embodiments described herein provide an apparatus and method for fabricating semiconductor devices with improved process control and performance. The apparatus includes a processing chamber with first and second RF coil assemblies generating primary and secondary plasmas in distinct regions, along with first and second electromagnet assemblies for independent magnetic field control. A removable biasable flux optimizer is disposed in the apparatus to modulate plasma distribution and directionality. The method involves a three-step sequence comprising Inductive coupled plasma (IMP) low energy deposition, deposition for enhanced step coverage, and etching for overhang removal. The ICP deposition utilizes primary and secondary plasmas generated by the RF coil assemblies, with intensified collisions achieved through chamber pressure increase. Additionally, a simultaneous deposition and etching process can be employed, with optional additional etching steps for improved overhang removal.

公开(公告)号：US20250132146A1

公开(公告)日：2025-04-24

申请号：US18382961

申请日：2023-10-23

Applicant: Applied Materials, Inc.

Inventor： Mohammad Mahdi TAVAKOLI ,  Chandan DAS ,  Bencherki MEBARKI ,  Joung Joo LEE ,  Jiecong TANG ,  Avgerinos V. GELATOS

IPC: H01L21/02 ,  H01L21/3213

Abstract: A method of capping a metal layer includes performing a conversion process to reduce a metal oxide layer formed on a top surface of the metal layer and form a metal sulfide layer on the top surface of the metal layer, exposing the top surface of the metal layer to an oxidizing environment, and performing a removal process to remove the metal sulfide layer.

公开(公告)号：US20240194605A1

公开(公告)日：2024-06-13

申请号：US18534333

申请日：2023-12-08

Applicant: Applied Materials, Inc.

Inventor： Mohammad Mahdi TAVAKOLI ,  Avgerinos V. GELATOS ,  Jiajie CEN ,  Kevin KASHEFI ,  Joung Joo LEE ,  Zhihui LIU ,  Yang ZHOU ,  Zhiyuan WU ,  Meng-Shan WU

IPC: H01L23/532 ,  H01J37/32 ,  H01L21/02 ,  H01L21/768

CPC classification number: H01L23/53266 ,  H01J37/32357 ,  H01L21/02068 ,  H01L21/76843 ,  H01L21/76877 ,  H01J2237/335

Abstract: A semiconductor structure includes a first level comprising a metal layer within a first dielectric layer formed on a substrate, a second level formed on the first level, the second level comprising an interconnect within a second dielectric layer and a barrier layer formed around the interconnect, and a metal capping layer disposed at an interface between the metal layer and the interconnect, wherein the metal capping layer comprises tungsten (W) and has a thickness of between 20 Å and 40 Å.

公开(公告)号：US20220403505A1

公开(公告)日：2022-12-22

申请号：US17348849

申请日：2021-06-16

Applicant: Applied Materials, Inc.

Inventor： Annamalai LAKSHMANAN ,  Jacqueline S. WRENCH ,  Feihu WANG ,  Yixiong YANG ,  Joung Joo LEE ,  Srinivas GANDIKOTA ,  Sang-heum KIM ,  Zhebo CHEN ,  Gang SHEN

IPC: C23C16/02 ,  C23C16/06 ,  C23C16/52 ,  C23C14/16 ,  C23C16/455 ,  C23C16/42 ,  C23C14/06 ,  C23C16/56 ,  C23C14/02 ,  C23C14/58

Abstract: Methods and apparatus for processing a substrate is provided herein. For example, a method for processing a substrate comprises depositing a silicide layer within a feature defined in a layer on a substrate, forming one of a metal liner layer or a metal seed layer atop the silicide layer within the feature via depositing at least one of molybdenum (Mo) or tungsten (W) using physical vapor deposition, and depositing Mo using at least one of chemical vapor deposition or atomic layer deposition atop the at least one of the metal liner layer or the metal seed layer, without vacuum break.

公开(公告)号：US20220020577A1

公开(公告)日：2022-01-20

申请号：US17490840

申请日：2021-09-30

Applicant: APPLIED MATERIALS, INC.

Inventor： Xiaodong WANG ,  Joung Joo LEE ,  Fuhong ZHANG ,  Martin Lee RIKER ,  Keith A. MILLER ,  William FRUCHTERMAN ,  Rongjun WANG ,  Adolph Miller ALLEN ,  Shouyin ZHANG ,  Xianmin TANG

IPC: H01J37/34 ,  C23C14/34 ,  C23C14/35 ,  C23C14/54

Abstract: Methods and apparatus for processing substrates are disclosed. In some embodiments, a process chamber for processing a substrate includes: a body having an interior volume and a target to be sputtered, the interior volume including a central portion and a peripheral portion; a substrate support disposed in the interior volume opposite the target and having a support surface configured to support the substrate; a collimator disposed in the interior volume between the target and the substrate support; a first magnet disposed about the body proximate the collimator; a second magnet disposed about the body above the support surface and entirely below the collimator and spaced vertically below the first magnet; and a third magnet disposed about the body and spaced vertically between the first magnet and the second magnet. The first, second, and third magnets are configured to generate respective magnetic fields to redistribute ions over the substrate.

公开(公告)号：US20210071294A1

公开(公告)日：2021-03-11

申请号：US17101933

申请日：2020-11-23

Applicant: APPLIED MATERIALS, INC.

Inventor： Xiaodong WANG ,  Joung Joo LEE ,  Fuhong ZHANG ,  Martin Lee RIKER ,  Keith A. MILLER ,  William FRUCHTERMAN ,  Rongjun WANG ,  Adolph Miller ALLEN ,  Shouyin ZHANG ,  Xianmin TANG

IPC: C23C14/35 ,  C23C14/54 ,  H01J37/34

Abstract: Methods and apparatus for controlling the ion fraction in physical vapor deposition processes are disclosed. In some embodiments, a physical vapor deposition chamber includes: a body having an interior volume and a lid assembly including a target to be sputtered; a magnetron disposed above the target, wherein the magnetron is configured to rotate a plurality of magnets about a central axis of the physical vapor deposition chamber; a substrate support disposed in the interior volume opposite the target and having a support surface configured to support a substrate; a collimator disposed between the target and the substrate support, the collimator having a central region having a first thickness and a peripheral region having a second thickness less than the first thickness; a first power source coupled to the target to electrically bias the target; and a second power source coupled to the substrate support to electrically bias the substrate support.

公开(公告)号：US20240371771A1

公开(公告)日：2024-11-07

申请号：US18423437

申请日：2024-01-26

Applicant: Applied Materials, Inc.

Inventor： Sahil Jaykumar PATEL ,  Wei LEI ,  Tuerxun AILIHUMAER ,  Joung Joo LEE ,  Rongjun WANG ,  Xianmin TANG

IPC: H01L23/532 ,  H01L21/768

Abstract: Embodiments of the disclosure include an apparatus and method of forming a semiconductor structure that includes metal contacts with a low resistance. In some embodiments, the semiconductor device generally includes an interconnect. The interconnect generally includes a dielectric layer with a tungsten (W) plug formed therein, a feature formed in the dielectric layer and over the W plug, a liner layer formed on an exposed surface of the W plug and on sidewalls of the feature, an interruption layer formed on the liner layer, and a conductive material substantially filling the feature. The liner layer includes molybdenum (Mo) or W, and the interruption layer includes Mo.

公开(公告)号：US20240332023A1

公开(公告)日：2024-10-03

申请号：US18621828

申请日：2024-03-29

Applicant: Applied Materials, Inc.

Inventor： Ying-Bing JIANG ,  In Seok HWANG ,  Zhijun CHEN ,  Avgerinos V. GELATOS ,  Joung Joo LEE ,  Xianmin TANG ,  Fredrick FISHBURN ,  Le ZHANG ,  Wangee KIM ,  Mahendra PAKALA

IPC: H01L21/285 ,  C23C16/24 ,  C23C16/34 ,  C23C16/40 ,  C23C16/455

CPC classification number: H01L21/28518 ,  C23C16/24 ,  C23C16/345 ,  C23C16/401 ,  C23C16/45557

Abstract: The present disclosure relates to a method of selectively forming a silicide in high-aspect ratio structures by use of a multistep deposition process. A first precursor gas is delivered to a surface disposed within a processing region of a process chamber maintained at a first process pressure, where the substrate is maintained at a first temperature for a first period of time. A purge gas is delivered to for a second period of time after the first period of time has elapsed. A second precursor gas is delivered to the surface of the substrate. The second precursor being maintained at a second process pressure while the substrate is maintained at a second temperature for a third period of time. The purge gas is delivered to the processing region for a fourth period of time after the third period of time has elapsed.