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公开(公告)号:US11948640B2
公开(公告)日:2024-04-02
申请号:US17371568
申请日:2021-07-09
Applicant: Kioxia Corporation
Inventor: Makoto Iwai , Hiroshi Nakamura
CPC classification number: G11C16/0483 , G11C11/56 , G11C11/5628 , G11C11/5635 , G11C11/5642 , G11C16/06 , G11C16/08 , G11C16/26 , G11C16/3436 , G11C16/3454 , G11C16/3459
Abstract: A memory includes first and second select gate transistors, memory cells, a source line, a bit line, a selected word line which is connected to a selected memory cell as a target of a verify reading, a non-selected word line which is connected to a non-selected memory cell except the selected memory cell, a potential generating circuit for generating a selected read potential which is supplied to the selected word line, and generating a non-selected read potential larger than the selected read potential, which is supplied to the non-selected word line, and a control circuit which classifies a threshold voltage of the selected memory cell to one of three groups by verifying which area among three area which are isolated by two values does a cell current of the selected memory cell belong, when the selected read potential is a first value.
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公开(公告)号:US20240006001A1
公开(公告)日:2024-01-04
申请号:US18369479
申请日:2023-09-18
Applicant: Micron Technology, Inc.
Inventor: Eric N. Lee , Dheeraj Srinivasan
CPC classification number: G11C16/3436 , G11C16/26 , G11C7/1084 , G11C7/1057 , G11C16/10
Abstract: A system includes a memory component and a processing device, operatively coupled with the memory component, to send a read command to the memory component while a program or erase operation being executed by the memory component is suspended. The processing device, operatively coupled with the memory component, can then send an auto resume command to the memory component to automatically resume execution of the program or erase operation after the read command is executed.
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公开(公告)号:US11749345B2
公开(公告)日:2023-09-05
申请号:US17393027
申请日:2021-08-03
Applicant: SK hynix Inc.
Inventor: Sang Heon Lee
CPC classification number: G11C16/08 , G11C11/4074 , G11C16/12 , G11C16/16 , G11C16/26 , G11C16/3436
Abstract: The present technology includes a memory device and a method of operating the memory device. The memory device includes a memory block including a plurality of memory cells connected to word lines, peripheral circuits configured to generate operation voltages to be applied to the word lines, and control logic configured to control the peripheral circuits in response to a program command, a read command, or an erase command. The peripheral circuits include a voltage generator that adjusts a section of threshold voltage distributions of memory cells to be programmed among the memory cells, according to a distance between the word lines.
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公开(公告)号:US20230252265A1
公开(公告)日:2023-08-10
申请号:US18126233
申请日:2023-03-24
Inventor: Farnood Merrikh Bayat , Xinjie Guo , Dmitri Strukov , Nhan Do , Hieu Van Tran , Vipin Tiwari , Mark Reiten
IPC: G06N3/04 , G06N3/063 , G11C11/54 , G11C16/34 , G11C29/38 , G06N3/045 , G11C16/08 , G11C16/12 , G11C16/16 , G06F3/06
CPC classification number: G06N3/04 , G06N3/063 , G11C11/54 , G11C16/3436 , G11C29/38 , G06N3/045 , G11C16/08 , G11C16/12 , G11C16/16 , G06F3/061 , G06F3/0655 , G06F3/0688
Abstract: A method of scanning N×N pixels using a vector-by-matrix multiplication array by (a) associating a filter of M×M pixels adjacent first vertical and horizontal edges, (b) providing values for the pixels associated with different respective rows of the filter to input lines of different respective N input line groups, (c) shifting the filter horizontally by X pixels, (d) providing values for the pixels associated with different respective rows of the horizontally shifted filter to input lines, of different respective N input line groups, which are shifted by X input lines, (e) repeating steps (c) and (d) until a second vertical edge is reached, (f) shifting the filter horizontally to be adjacent the first vertical edge, and shifting the filter vertically by X pixels, (g) repeating steps (b) through (e) for the vertically shifted filter, and (h) repeating steps (f) and (g) until a second horizontal edge is reached.
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公开(公告)号:US20180342305A1
公开(公告)日:2018-11-29
申请号:US15926419
申请日:2018-03-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: SANG-SOO CHA , YOUNG-SEOP SHIM , DAE-WON KIM
CPC classification number: G11C16/3404 , G06F13/1673 , G06F13/4068 , G11C11/5642 , G11C13/0033 , G11C13/0035 , G11C13/004 , G11C16/26 , G11C16/3418 , G11C16/3436 , G11C16/3495 , G11C2013/0057
Abstract: A method of operating a storage device includes: performing a background read operation on a nonvolatile memory by using a default read voltage level; performing a read retry operation on the nonvolatile memory by using a corrected read voltage level when the background read operation fails; storing the corrected read voltage level in a history buffer when the read retry operation succeeds; and performing a host read operation on the nonvolatile memory by using the history buffer in response to a read request received from a host.
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公开(公告)号:US10074439B2
公开(公告)日:2018-09-11
申请号:US15174667
申请日:2016-06-06
Applicant: SK hynix Inc.
CPC classification number: G11C16/3431 , G11C7/02 , G11C11/5628 , G11C16/0483 , G11C16/10 , G11C16/3427 , G11C16/3436 , G11C2029/0411
Abstract: Memory systems may include a memory including a plurality of wordlines, each wordline including a plurality of cells, and a controller suitable for obtaining an initial voltage threshold and a target state for each of the plurality of cells, applying a pulse based on a pulse value to the plurality of cells, and calculating at least one coupling effect to neighboring cells.
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公开(公告)号:US20180075910A1
公开(公告)日:2018-03-15
申请号:US15606798
申请日:2017-05-26
Applicant: SK hynix Inc.
Inventor: Jin Yong SEONG
IPC: G11C16/10 , G11C16/04 , G11C16/34 , G11C16/26 , G11C16/30 , G11C16/08 , G11C16/24 , G11C11/34 , G11C11/063
CPC classification number: G11C16/10 , G06F13/16 , G11C7/1063 , G11C11/063 , G11C11/34 , G11C16/0483 , G11C16/08 , G11C16/22 , G11C16/24 , G11C16/26 , G11C16/30 , G11C16/3436
Abstract: Provided herein are a semiconductor memory device and a method of operating the same. The semiconductor memory device includes a memory cell array including a plurality of memory cells, a status signal generator configured to output an internal status signal indicating whether an operation of the memory cell array has been completed or is being performed and a ready/busy line input mode control unit configured to output a ready/busy signal through a ready/busy line based on the internal status signal or to receive an input signal from an external device through the ready/busy line.
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公开(公告)号:US20180024948A1
公开(公告)日:2018-01-25
申请号:US15458561
申请日:2017-03-14
Applicant: SANDISK TECHNOLOGIES LLC
Inventor: Wanfang Tsai , Yan Li
CPC classification number: G06F13/1673 , G06F3/061 , G06F3/0655 , G06F3/0688 , G06F5/065 , G06F13/1642 , G06F2205/067 , G06F2212/2022 , G06F2212/7203 , G11C7/1039 , G11C7/106 , G11C7/1066 , G11C16/0483 , G11C16/10 , G11C16/3427 , G11C16/3436 , G11C16/3454 , G11C29/84
Abstract: Systems and methods for controlling data flow and data alignment using data expand and compress circuitry arranged between a variable data rate bi-directional first in, first out (FIFO) buffer and one or more memory arrays to compensate for bad column locations within the one or more memory arrays are described. The bi-directional FIFO may have a variable data rate with the array side and a fixed data rate with a serializer/deserializer (SERDES) circuit that drives input/output (I/O) circuitry. The data expand and compress circuitry may pack and unpack data and then align the data passing between the one or more memory arrays and the bi-directional FIFO using a temporary buffer, data shuffling logic, and selective pipeline stalls.
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公开(公告)号:US09857992B2
公开(公告)日:2018-01-02
申请号:US15076963
申请日:2016-03-22
Applicant: Intel Corporation
Inventor: Kiran Pangal , Ravi J. Kumar
IPC: G11C29/02 , G11C29/50 , G11C29/10 , G11C29/04 , G06F3/06 , G06F11/10 , G06F11/20 , G11C11/56 , G11C16/14 , G11C16/26 , G11C16/34 , G11C29/52 , G11C16/00
CPC classification number: G06F3/0616 , G06F3/064 , G06F3/0653 , G06F3/0659 , G06F3/0679 , G06F11/1068 , G06F11/2094 , G11C11/5635 , G11C11/5642 , G11C16/00 , G11C16/14 , G11C16/26 , G11C16/3436 , G11C29/021 , G11C29/026 , G11C29/028 , G11C29/50016 , G11C29/52 , G11C2029/0401
Abstract: Methods and apparatus to provide dynamic window to improve NAND (Not And) memory endurance are described. In one embodiment, a program-erase window associated with a NAND memory device is dynamically varied by starting with a higher erase verify (TEV) voltage and lowering the TEV voltage with subsequent cycles over a life of the NAND memory device based on a current cycle count value. Alternatively, the program-erase window is dynamically varied by starting with a higher erase verify (PV) voltage and erase verify (TEV) voltage and lowering the PV and TEV voltages with subsequent cycles over a life of the NAND memory device based on the current cycle count value. Other embodiments are also disclosed and claimed.
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公开(公告)号:US09620228B1
公开(公告)日:2017-04-11
申请号:US15078416
申请日:2016-03-23
Applicant: Marvell International Ltd.
Inventor: Amey Dattatray Inamdar
CPC classification number: G11C16/16 , G11C16/04 , G11C16/105 , G11C16/3436
Abstract: A monotonically increasing persistent counter is described that is persistent across reboots of a system in which it is incorporated. The described counter employs an event counter module that counts events that are generated by various event generators within the system. One type of event that can be counted by the described counter is a state change. In various implementations, the event counter module, when employed as a state change counter module, includes a state change counter that counts state changes, and a journal mode component which provides journaling functionality which makes it possible to accommodate large numbers of state changes while, at the same time, recover the counter in the event of a system failure. In at least some embodiments, one or both of the state change counter and the journal mode component are implemented using NOR flash memory.
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