Memory cell array circuit and method of forming the same

    公开(公告)号:US12165705B2

    公开(公告)日:2024-12-10

    申请号:US18362863

    申请日:2023-07-31

    Abstract: A method of operating a memory circuit includes generating a first current in response to a first voltage. The first current includes a first set of leakage currents and a first write current. The method further includes generating, by a tracking circuit, a second set of leakage currents configured to track the first set of leakage currents of the first column of memory cells, and mirroring the first current in a first path with a second current in a second path by a first current mirror. The second current includes the second set of leakage currents and a second write current. The first write current corresponds to the second write current. The first set of leakage currents corresponds to the second set of leakage currents.

    Sense amplifier control
    35.
    发明授权

    公开(公告)号:US11978518B2

    公开(公告)日:2024-05-07

    申请号:US17585031

    申请日:2022-01-26

    CPC classification number: G11C16/28 G11C16/10 H03K19/20

    Abstract: A sense amplifier control system includes a precharge control switch configured to receive a precharge signal. A reference cell is configured to receive a reference word line signal. In a precharge phase, the control switch is controlled in response to the precharge signal to precharge the reference input node to a predetermined precharge level. In a sensing phase subsequent to the pre-charge phase, the trigger circuit is configured to output a triggering signal at the output terminal in response to the reference input node reaching a triggering level.

    Sense amplifier
    39.
    发明授权

    公开(公告)号:US11783870B2

    公开(公告)日:2023-10-10

    申请号:US17843786

    申请日:2022-06-17

    CPC classification number: G11C7/062 G11C2207/063

    Abstract: A sense amplifier is provided. A first terminal of a first invertor is connected to a power node and a second terminal of the first invertor is connected to a cell current source. A first terminal of a second invertor is connected to the power node and a second terminal of the second invertor is connected to a reference current source. The first invertor is cross coupled with the second invertor at a first node and a second node. A pre-charge circuit is connected to the first node and the second node. A first pull up transistor and a second pull up transistor are connected between a supply voltage node and the power node. A signal level detector circuit is connected to the second pull up transistor. The signal level detector circuit switches on the second pull up transistor when a remaining voltage on one of the first node and the second node is below a reference voltage.

    MEMORY DEVICE AND SCHEDULING METHOD FOR MEMORY DEVICE

    公开(公告)号:US20230273752A1

    公开(公告)日:2023-08-31

    申请号:US18313374

    申请日:2023-05-08

    CPC classification number: G06F3/0659 G06F1/28 G06F3/0604 G06F3/0673 G06F9/4893

    Abstract: A memory device including a memory array with a plurality of memory macros, a power supplying circuit, and a controller is provided. The power supplying circuit is coupled to the memory array. The controller is coupled to the memory array. The power supplying circuit is configured to provide power to perform write operations to a number of the memory macros at the same time. The number of the memory macros for the write operations performed at the same time is not higher than a maximum number of the memory macros. The controller obtains the maximum number of the memory macros for the write operations performed at the same time by the power supplying circuit. The controller re-arranges a schedule for a sequence of the write operations of the memory macros to generate a re-arranged schedule. The maximum number is taken as a threshold value. In the re-arranged schedule, a number of part of the memory macros for the write operations performed at the same time is equal to or less then the threshold value.

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