摘要:
A 16 megabit (2.sup.24) or greater density single deposition layer metal Dynamic Random Access Memory (DRAM) part is described which allows for a die that fits within an industry-standard 300 ml wide SOJ (Small Outline J-wing) package or a TSOP (Thin, Small Outline Package) with little or no speed loss over previous double metal deposition layered 16 megabit DRAM designs. This is accomplished using a die architecture which allows for a single metal layer signal path, together with the novel use of a lead frame to remove a substantial portion of the power busing from the die, allowing for a smaller, speed-optimized DRAM. The use of a single deposition layer metal results in lower production costs, and shorter production time.
摘要:
A memory array architecture is described which uses active digit lines at array edges. To maximize array area using active digit lines, a memory array architecture is employed where interior rows of memory cells intersect X columns of memory cells. Rows located along the edge of the array, however, intersect less than X columns of memory cells. Two rows of memory cells located along the edge of the array must be accessed together to form a complete row of X columns.
摘要:
A circuit regulates a voltage by controlling a voltage generator. A voltage divider is coupled between the regulated voltage and a supply voltage, and generates a sense voltage. A clamp circuit is coupled to the divider, and reduces the sensitivity between the supply voltage and the regulated voltage by substantially prohibiting the voltage across itself from exceeding a predetermined value A detector circuit is coupled between the divider and the voltage generator, and provides a control signal that deactivates the generator when the sense voltage reaches a first predetermined threshold, and activates the generator when the sense voltage reaches a second predetermined threshold.
摘要:
A self compensating clamp circuit and a method which limit the voltage of a pump circuit node to a maximum potential. A first pump circuit provides a first pumped potential at a first node which is greater than a supply potential. The first pumped potential is fed to a second pump circuit which generates a second pumped potential at a second node. The clamp circuit is interposed between the first and the second nodes and limits the maximum value of the first pumped potential to the second pumped potential plus a threshold voltage of the clamp circuit.
摘要:
A pull-up circuit for a DRAM P-channel sense amplifier includes an NMOS transistor and a PMOS transistor connected in parallel with each other between a supply voltage and a pull-up node for the sense amplifier. The transistors are connected to a control circuit that turns on the NMOS transistor during a pull-up cycle and turns on the PMOS transistor only during the initial portion of the pull-up cycle.
摘要:
This invention is an improved pull-up circuit for P-channel sense amplifiers in dynamic random access memory arrays having non-bootstrapped wordlines. The improved pull-up circuit features a voltage-comparator-controlled P-channel device which couples the power supply bus to a pull-up node for high current flow to the node and to digit lines which are coupled to the node via P-channel isolation devices. During the pull-up cycle, the P-channel device remains "on" as long as a reference voltage is greater than a variable voltage which represents the voltage level on portions of the digit lines farthest from the P-channel sense amplifier. The pull-up circuit also has an N-channel device which couples the power supply node to the pull-up node for maintenance of a desired voltage level equal to V.sub.cc minus the threshold voltage of the N-channel device.
摘要:
The CMOS voltage compensating input buffer circuit of the present invention provides a means to stabilize input level trip points and is comprised of a voltage compensating circuit having an input node and an output drive node coupled to an input buffer. The voltage compensating circuit receives its input from a voltage adjusting circuit that follows changes in V.sub.CC while its output drive node is coupled to the series connected CMOS input buffer circuit having an input node and an output node. The buffer's input node receives a signal that VIH/VIL trip points will determine if the output is to be a high or a low and the buffer's output node then couples the resultant level to an output buffer circuit comprised of a CMOS inverter which provides the final output drive. The present invention provides trip point levels corresponding to industry standard VIH/VIL levels to accurately determine the corresponding output with operating voltage supplies (regulated or unregulated) operating between 2 V to 7.5 V.
摘要:
A pulldown circuit for a sense amplifier includes an output node for coupling to a common node of one or more sense amplifiers in a DRAM. The drain of an N-channel pulldown transistor is coupled to the output node. Additional pulldown circuitry includes an inverter, a P-channel transistor, and a bias circuit coupled to the supply voltage for providing a gate signal to the gate of the N-channel pulldown transistor. The slope of the gate signal is substantially insensitive to the value of the power supply voltage, thus changing the rate at which the common node is discharged to the enabling ground level. Since the rate of discharge is substantially the same at higher power supply voltages, the instantaneous current is substantially the same, which in turn prevents the internal ground lines from developing an additional undesirable ground voltage increase.
摘要:
A sense circuit for reading a resistance level of a programmable conductor random access memory (PCRAM) cell is provided. A voltage potential difference is introduced across a PCRAM cell by activating an access transistor from a raised rowline voltage. Both a digit line and a digit complement reference line are precharged to a first predetermined voltage. The cell being sensed has the precharged voltage discharged through the resistance of the programmable conductor memory element of the PCRAM cell. A comparison is made of the voltage read at the digit line and at the reference conductor. If the voltage at the digit line is greater than the reference voltage, the cell is read as a high resistance value (e.g., logic HIGH); however, if the voltage measured at the digit line is lower than that of the reference voltage, the cell is read as a low resistance value (e.g., logic LOW).
摘要:
A drive circuit includes drive input and output terminals, a supply terminal, a drive transistor, and a drive-control circuit. The drive transistor includes a control terminal, a first transistor terminal coupled to the drive output terminal, and a second transistor terminal coupled to the supply terminal. The drive-control circuit has an input terminal coupled to the drive input terminal and has an output terminal coupled to the control terminal of the drive transistor. The drive-control circuit generates on the control terminal of the drive transistor a signal level that changes at a first rate during a first time period and at a second higher rate during a second time period following the first time period. As a result, when used as a data-output driver, one can adjust the first and second rates and time periods such that the drive circuit meets both the 50-ohm and 50 pf falling-slew-rate ranges specified in the Intel® PC-100 specification.