Semiconductor circuit and semiconductor circuit system

    公开(公告)号:US11900993B2

    公开(公告)日:2024-02-13

    申请号:US17637312

    申请日:2020-08-13

    发明人: Yusuke Shuto

    摘要: A semiconductor circuit according to the present disclosure includes: a first circuit configured to apply an inverted voltage of a voltage at a first node to a second node; a second circuit configured to apply an inverted voltage of a voltage at a second node to the first node; a first storage element including first, second, and third terminals; a first transistor including a drain coupled to the first node and a source coupled to the first terminal of the first storage element; a second transistor including a gate coupled to the first node or the second node and a drain coupled to the second terminal of the first storage element; and a third transistor including a gate coupled to the first node or the second node and a drain coupled to the second terminal of the first storage element. The first storage element is configured to set a resistance state between the first terminal and the second and third terminals in accordance with a direction of a current flowing between the second and third terminals.

    Data transmission circuit and method, and storage apparatus

    公开(公告)号:US11862286B2

    公开(公告)日:2024-01-02

    申请号:US17649068

    申请日:2022-01-27

    发明人: Liang Zhang

    IPC分类号: G11C7/10 G11C11/413

    摘要: A data transmission circuit includes: a comparison circuit, configured to compare received first data on a data bus with received second data on a global data line and output a comparison result of whether a number of different bits between the first data and the second data exceeds a preset threshold; a data conversion circuit, configured to: if the comparison result indicates that the number of different bits exceeds the preset threshold, invert the first data and transmit the inverted first data to the global data line, and otherwise, transmit the first data to the global data line; and a read-write conversion circuit, configured to: if the comparison result indicates that the number of different bits exceeds the preset threshold, transmit data on the global data line to a complementary local data line, and otherwise, transmit data on the global data line to a local data line.

    SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOF

    公开(公告)号:US20230343388A1

    公开(公告)日:2023-10-26

    申请号:US18340214

    申请日:2023-06-23

    申请人: SK hynix Inc.

    发明人: Nam Jae LEE

    IPC分类号: G11C11/413

    CPC分类号: G11C11/413 H10B10/00

    摘要: There are provided a semiconductor memory device and a manufacturing method thereof. The semiconductor memory device includes: a source layer; a channel structure extending in a first direction from within the source layer; a source-channel contact layer surrounding the channel structure on the source layer; a first select gate layer overlapping with the source-channel contact layer and surrounding the channel structure; a stack including interlayer insulating layers and conductive patterns that are alternately stacked in the first direction and surrounding the channel structure, the stack overlapping with the first select gate layer; and a first insulating pattern that is formed thicker between the first select gate layer and the channel structure than between the stack and the channel structure.

    TUNABLE CMOS CIRCUIT, TEMPLATE MATCHING MODULE, NEURAL SPIKE RECORDING SYSTEM, AND FUZZY LOGIC GATE

    公开(公告)号:US20230259751A1

    公开(公告)日:2023-08-17

    申请号:US18139760

    申请日:2023-04-26

    摘要: A tunable CMOS circuit comprising a CMOS element and a tunable load. The CMOS element is configured to receive an analogue input signal. The tunable load is connected to the CMOS element and configured to set a switch point of the CMOS element. The CMOS element is configured to output an output current that is largest when the analogue input signal is equal to the switch point. The combination of a CMOS element with a tunable load may also provide a hardware implementation of fuzzy logic. A fuzzy logic gate comprises an input node, a CMOS logic gate, a tunable load, and an output node. The input node is configured to receive an analogue input signal. The CMOS logic gate is connected to the input node. The tunable load is connected to the CMOS logic gate such that the tunable load is provided on a current path connected to the output node. The output node is configured to output an analogue output signal.

    Manufacturing method of three-dimensional semiconductor device

    公开(公告)号:US11705189B2

    公开(公告)日:2023-07-18

    申请号:US17473648

    申请日:2021-09-13

    申请人: SK hynix Inc.

    发明人: Nam Jae Lee

    CPC分类号: G11C11/413 H10B10/00

    摘要: There are provided a semiconductor memory device and a manufacturing method thereof. The semiconductor memory device includes: a source layer; a channel structure extending in a first direction from within the source layer; a source-channel contact layer surrounding the channel structure on the source layer; a first select gate layer overlapping with the source-channel contact layer and surrounding the channel structure; a stack including interlayer insulating layers and conductive patterns that are alternately stacked in the first direction and surrounding the channel structure, the stack overlapping with the first select gate layer; and a first insulating pattern that is formed thicker between the first select gate layer and the channel structure than between the stack and the channel structure.