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公开(公告)号:US11475952B2
公开(公告)日:2022-10-18
申请号:US17179418
申请日:2021-02-19
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Hsien Huang , Yu-Tse Kuo , Shu-Ru Wang , Chun-Yen Tseng , Chun-Chieh Chang
IPC: G11C15/04
Abstract: A ternary content addressable memory and a two-port SRAM are provided and include a storage cell and two transistors. The storage cell includes a first active region, a second active region, a third active region, and a fourth active region, extending along a first direction, and a first gate line, a second gate line, a third gate line, and a fourth gate line extending along a second direction. The first gate line crosses the third active region and the fourth active region, the second gate line crosses the fourth active region, the third gate line crosses the first active region, and the fourth gate line crosses the first active region and the second active region. The transistors are electrically connected to the storage cell, and the transistors and the storage cell are arranged along the first direction.
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2.
公开(公告)号:US10892013B2
公开(公告)日:2021-01-12
申请号:US16439680
申请日:2019-06-12
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Hsien Huang , Ching-Cheng Lung , Yu-Tse Kuo , Shu-Ru Wang , Chun-Yen Tseng
Abstract: A two-port ternary content addressable memory (TCAM) and layout pattern thereof, and associated memory device are provided. The two-port TCAM may include a first storage unit, a second storage unit, a set of first search terminals, a set of second search terminals, a first comparison circuit, a second comparison circuit, a first match terminal and a second match terminal, wherein the first comparison circuit is respectively coupled to the first storage unit, the second storage unit, the set of first search terminals and the first match terminal, and the second comparison circuit is respectively coupled to the first storage unit, the second storage unit, the set of second search terminals and the second match terminal. First search data and second search data may be concurrently inputted into the two-port TCAM for determining whether the first search data and the second search data match content data within the two-port TCAM.
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3.
公开(公告)号:US10410684B2
公开(公告)日:2019-09-10
申请号:US15900811
申请日:2018-02-21
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Yen Tseng , Ting-Hao Chang , Ching-Cheng Lung , Yu-Tse Kuo , Shih-Hao Liang , Chun-Hsien Huang , Shu-Ru Wang , Hsin-Chih Yu
IPC: G11C5/02 , H01L27/108 , H01L27/105 , G11C11/409 , G11C11/419 , H01L27/11 , H01L29/786
Abstract: The present invention provides a memory device, the memory device includes a first region having a plurality of oxide semiconductor static random access memories (OSSRAM) arranged in a first direction, and each of the OSSRAMs comprising a static random access memory (SRAM) and at least an oxide semiconductor dynamic random access memory (DOSRAM), wherein the DOSRAM is connected to the SRAM, wherein each of the DOSRAMs comprises an oxide semiconductor gate (OSG), and each of the OSGs extending in a second direction perpendicular to the first direction, and an oxide semiconductor channel extending in the first direction, an oxide semiconductor gate connection extending in the first direction to connect each of the OSGs, and a word line, a Vcc connection line and a Vss connection line extend in the first direction and are connected to the SRAMs in each OSSRAM.
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公开(公告)号:US20180315763A1
公开(公告)日:2018-11-01
申请号:US16028442
申请日:2018-07-06
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Hsien Huang , Yu-Tse Kuo , Shu-Ru Wang
CPC classification number: H01L27/1108 , H01L21/823431 , H01L21/845 , H01L27/1104 , H01L27/1116 , H01L29/6681 , H01L29/785
Abstract: A static random-access memory (SRAM) cell array forming method includes the following steps. A plurality of fin structures are formed on a substrate, wherein the fin structures include a plurality of active fins and a plurality of dummy fins, each PG (pass-gate) FinFET shares at least one of the active fins with a PD (pull-down) FinFET, and at least one dummy fin is disposed between the two active fins having two adjacent PU (pull-up) FinFETs thereover in a static random-access memory cell. At least a part of the dummy fins are removed. The present invention also provides a static random-access memory (SRAM) cell array formed by said method.
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公开(公告)号:US20180006040A1
公开(公告)日:2018-01-04
申请号:US15691764
申请日:2017-08-31
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Hsien Huang , Yu-Tse Kuo , Shu-Ru Wang
CPC classification number: H01L27/1108 , H01L27/1104 , H01L27/1116 , H01L29/6681 , H01L29/785
Abstract: A static random-access memory (SRAM) cell array forming method includes the following steps. A plurality of fin structures are formed on a substrate, wherein the fin structures include a plurality of active fins and a plurality of dummy fins, each PG (pass-gate) FinFET shares at least one of the active fins with a PD (pull-down) FinFET, and at least one dummy fin is disposed between the two active fins having two adjacent PU (pull-up) FinFETs thereover in a static random-access memory cell. At least a part of the dummy fins are removed. The present invention also provides a static random-access memory (SRAM) cell array formed by said method.
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公开(公告)号:US09859282B1
公开(公告)日:2018-01-02
申请号:US15280333
申请日:2016-09-29
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Yen Tseng , Ching-Cheng Lung , Yu-Tse Kuo , Chun-Hsien Huang , Shu-Ru Wang
IPC: H01L27/108 , H01L29/78
CPC classification number: H01L27/10805 , H01L27/0207 , H01L27/10855 , H01L27/10885 , H01L27/10888
Abstract: A high-density semiconductor structure includes a substrate, a bit line and a first memory unit. The bit line, disposed on the substrate, has a first side and a second side. The first memory unit includes a first transistor, a first capacitor, a second transistor and a second capacitor. The first transistor disposed on the substrate has a first terminal and a second terminal. The first terminal connects the bit line. The first capacitor connects the second terminal of the first transistor. The second transistor disposed on the substrate has a third terminal and a fourth terminal. The third terminal connects the bit line. The second capacitor connects the fourth terminal of the second transistor. The first capacitor and the second capacitor are separated from the bit line in a direction perpendicular to an extending direction of the bit line and located on the first side of the bit line.
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公开(公告)号:US09786647B1
公开(公告)日:2017-10-10
申请号:US15092630
申请日:2016-04-07
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Hsien Huang , Yung-Feng Cheng , Yu-Tse Kuo , Chia-Wei Huang , Li-Ping Huang , Shu-Ru Wang
IPC: H01L23/528 , H01L23/522 , H01L27/11 , H01L27/02
CPC classification number: H01L27/0207 , H01L23/5226 , H01L23/528 , H01L27/1104
Abstract: A semiconductor layout structure includes a substrate comprising a cell edge region and a dummy region abutting thereto, a plurality of dummy contact patterns disposed in the dummy region and arranged along a first direction, and a plurality of dummy gate patterns disposed in the dummy region and arranged along the first direction. The dummy contact patterns and the dummy gate patterns are alternately arranged. Each dummy contact pattern includes an inner dummy contact proximal to the cell edge region and an outer dummy contact distal to the cell edge region, and the inner dummy contact and the outer dummy contact are arranged along a second direction perpendicular to the first direction and spaced apart from each other by a first gap.
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公开(公告)号:US11915755B2
公开(公告)日:2024-02-27
申请号:US17580591
申请日:2022-01-20
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Yen Tseng , Yu-Tse Kuo , Shu-Ru Wang , Chun-Hsien Huang , Hsin-Chih Yu , Meng-Ping Chuang , Li-Ping Huang , Yu-Fang Chen
IPC: G11C15/04
CPC classification number: G11C15/04
Abstract: A layout of a semiconductor memory device includes a substrate and a ternary content addressable memory (TCAM). The TCAM is disposed on the substrate and includes a plurality of TCAM bit cells, where at least two of the TCAM bit cells are mirror-symmetrical along an axis of symmetry, and each of the TCAM bit cells includes two storage units electrically connected to two word lines respectively, and a logic circuit electrically connected to the storage units. The logic circuit includes two first reading transistors, and two second reading transistors, where each of the second reading transistors includes a gate and source and drain regions, the source and drain regions of the second reading transistors are electrically connected to two matching lines and the first reading transistors, respectively, where the word lines are disposed parallel to and between the matching lines.
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公开(公告)号:US20230282261A1
公开(公告)日:2023-09-07
申请号:US17707934
申请日:2022-03-29
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Yen Tseng , Yu-Tse Kuo , Shu-Ru Wang , Jen-Yu Wang , Li-Ping Huang , Yi-Ting Wu , Jia-Rong Wu , Chun-Hsien Huang
CPC classification number: G11C11/161 , G11C11/1655 , G11C11/1657 , G11C11/1673 , G11C11/1675 , H01L27/228 , H01L43/02 , H01L43/08
Abstract: The present invention provides a spin-orbit torque magnetic random access memory (SOT-MRAM) circuit, including a read transistor pair with two read transistors in parallel, a write transistor pair with two write transistors in parallel, a SOT memory cell with a magnetic tunnel junction (MTJ) and a SOT layer, wherein one end of the MTJ is connected to the source of the read transistor pair and the other end of the MTJ is connected to the SOT layer, and one end of the SOT layer is connected to a source line and the other of the SOT layer is connected to the source of the write transistor pair, a read bit line is connected to the drain of the read transistor pair and a write bit line is connected to the drain of the read transistor.
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公开(公告)号:US20230207648A1
公开(公告)日:2023-06-29
申请号:US17583225
申请日:2022-01-25
Applicant: UNITED MICROELECTRONICS CORP.
Inventor: Chun-Hsien Huang , Yu-Tse Kuo , Shu-Ru Wang , Chien-Hung Chen , Li-Ping Huang , Chun-Yen Tseng
IPC: H01L29/423 , H01L27/11 , G11C11/412 , G11C5/06 , H01L29/78
CPC classification number: H01L29/42376 , G11C5/063 , G11C11/412 , H01L27/1104 , H01L29/7851
Abstract: The present invention provides a layout pattern of static random access memory, comprising a PU1 (first pull-up transistor), a PU2 (second pull-up transistor), a PD1A (first pull-down transistor), a PD1B (second pull-down transistor), a PD2A (third pull-down transistor), a PD2B (fourth pull-down transistor), a PG1A (first access transistor), a PG1B (second access transistor), a PG2A (third access transistor) and a PG2B (fourth access transistor) located on the substrate. The PD1A and the PD1B are connected in parallel with each other, the PD2A and the PD2B are connected in parallel with each other, wherein the gate structures include a first J-shaped gate structure, and the first J-shaped gate structure is an integrally formed structure.
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