Abstract:
Certain aspects of the present disclosure generally relate to a semiconductor variable capacitor, and techniques for fabricating the same, implemented using a threshold voltage implant region. For example, the semiconductor variable capacitor generally includes a first non-insulative region disposed above a first semiconductor region, a second non-insulative region disposed above the first semiconductor region, and a threshold voltage (Vt) implant region interposed between the first non-insulative region and the first semiconductor region and disposed adjacent to the second non-insulative region. In certain aspects, the semiconductor variable capacitor also includes a control region disposed above the first semiconductor region such that a capacitance between the first non-insulative region and the second non-insulative region is configured to be adjusted by varying a control voltage applied to the control region.
Abstract:
A heterojunction bipolar transistor unit cell may include a compound semiconductor substrate. The heterojunction bipolar transistor unity may also include a base mesa on the compound semiconductor substrate. The base mesa may include a collector region on the compound semiconductor substrate and a base region on the collector region. The heterojunction bipolar transistor unity may further include a single emitter mesa on the base mesa.
Abstract:
An OTP memory array includes a plurality of differential P-channel metal oxide semiconductor (PMOS) OTP memory cells programmable and readable in predetermined states of program and read operations, and is capable of providing sufficient margins against global process variations and temperature variations while being compatible with standard logic fin-shaped field effect transistor (FinFET) processes to obviate the need for additional masks and costs associated with additional masks.
Abstract:
Non-volatile memory devices and logic devices are fabricated using processes compatible with high dielectric constant/metal gate (HK/MG) processes for increased cell density and larger scale integration. A doped oxide layer, such as a silicon-doped hafnium oxide (HfO2) layer, is implemented as a ferroelectric dipole layer in a non-volatile memory device
Abstract:
Methods and apparatuses, wherein the method includes providing a logic device. The method substantially surrounds a metal gate with a transition metal oxide on at least one side, wherein the transition metal oxide is comprised of hafnium oxalate and silicon dioxide. The method provides a bottom electrode (BE), wherein the BE is comprised of at least one of silicon or tungsten.
Abstract:
A perpendicular magnetic tunnel junction (pMTJ) device includes a perpendicular reference layer, a tunnel barrier layer on a surface of the perpendicular reference layer, and a perpendicular free layer on a surface of the tunnel barrier layer. The pMTJ device also includes a dielectric passivation layer on the tunnel barrier layer and surrounding the perpendicular free layer. The pMTJ device further includes a high permeability material on the dielectric passivation layer that is configured to be magnetized by the perpendicular reference layer and to provide a stray field to the perpendicular free layer that compensates for a stray field from the perpendicular reference layer.
Abstract:
Disclosed are devices that include a contact for electrical connection with a source/drain. The contact occupies a full width of a contact well other than areas occupied by sidewall spacers. As a result, high resistivity (due to the presence of liners and nucleation layers within the contact well in conventional devices) is reduced or eliminated.
Abstract:
An integrated circuit (IC) includes back-end-of-line (BEOL) interconnects in a first intermetal dielectric (IMD) layer on a substrate. The IC also includes second BEOL interconnects on the first IMD layer, coupled to the first BEOL interconnects through first BEOL vias in the first IMD layer. The IC further includes a second IMD layer on the second BEOL interconnects to seal airgaps between the plurality of second BEOL interconnects. The IC also includes etch stop spacers on portions of sidewalls of the second BEOL interconnects to separate the portions of the sidewalls from the second IMD layer. The IC further includes third BEOL interconnects on the second IMD layer and coupled to one or more of the second BEOL interconnects through second BEOL vias in the second IMD layer.
Abstract:
Disclosed are complementary field effect transistors (CFETs) with balanced n and p drive current, and methods for making the same. In an aspect, a CFET structure comprises an nFET with horizontal p-doped nanosheet channels arranged in a first vertical stack, each horizontal p-doped nanosheet channel having a width W1, and connecting a first source contact to a first drain contact through a first gate-all-around (GAA) region having a length L1. The CFET structure further comprises a pFET with horizontal n-doped nanosheet channels arranged in a second vertical stack disposed on the first vertical stack, each horizontal n-doped nanosheet channel having a width W2, and connecting a second source contact to a second drain contact through a second GAA region having a length L2, wherein W2/L2 is not equal to W1/L1.
Abstract:
A system includes a first park circuit having a signal input, an output, and a control input. The system also includes a first signal path having an input and an output, wherein the input of the first signal path is coupled to the output of the first park circuit. The system also includes a second park circuit having a signal input, an output, and a control input, wherein the signal input of the second park circuit is coupled to the output of the first signal path. The system further includes a second signal path having an input and an output, wherein the input of the second signal path is coupled to the output of the second park circuit.