SEMICONDUCTOR DEVICE
    4.
    发明公开

    公开(公告)号:US20240222232A1

    公开(公告)日:2024-07-04

    申请号:US18604939

    申请日:2024-03-14

    Applicant: Rohm Co., Ltd.

    Inventor: Akihiro KIMURA

    Abstract: A semiconductor device includes a substrate, a lead, and a semiconductor element. The substrate has an obverse surface facing in a thickness direction. The lead includes a die pad bonded to the substrate and a terminal connected to the pad. The semiconductor element is bonded to the pad. The bonding layer is disposed between the obverse surface and the pad. The obverse surface includes a first edge extending in a first direction crossing the thickness direction and a second edge extending in a second direction crossing the thickness direction and the first direction. As viewed in the thickness direction, the terminal protrudes outward from the obverse surface relative to the first edge. The distance from the first edge to the bonding layer in the second direction is shorter than the distance from the second edge to the bonding layer in the first direction.

    SEMICONDUCTOR DEVICE
    5.
    发明申请

    公开(公告)号:US20220223568A1

    公开(公告)日:2022-07-14

    申请号:US17607346

    申请日:2020-05-12

    Applicant: ROHM CO., LTD.

    Abstract: The semiconductor device A1 includes a support member 2, a metal part 30 having obverse and reverse surfaces 301-302 spaced in z direction, with the reverse surface 302 bonded to the support member 2, a second bonding layer 42 boding the support member 2 and the metal part 30, a semiconductor element 10 facing the obverse surface 301 and bonded to the metal part 30, and a sealing member 7 covering the support member 2, metal part 30, second bonding layer 42 and semiconductor element 10. The metal part 30 includes a first body 31 of a first material and a second body 32 of a second material, with a boundary between the bodies 31-32. The second material has a linear thermal expansion coefficient smaller than that of the first material. The semiconductor device is improved in reliability by reducing thermal stress from heat generation of the semiconductor element.

    SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE

    公开(公告)号:US20200066675A1

    公开(公告)日:2020-02-27

    申请号:US16669066

    申请日:2019-10-30

    Applicant: ROHM CO., LTD.

    Abstract: A semiconductor device is provided with a semiconductor element having a plurality of electrodes, a plurality of terminals electrically connected to the plurality of electrodes, and a sealing resin covering the semiconductor element. The sealing resin covers the plurality of terminals such that a bottom surface of the semiconductor element in a thickness direction is exposed. A first terminal, which is one of the plurality of terminals, is disposed in a position that overlaps a first electrode, which is one of the plurality of electrodes, when viewed in the thickness direction. The semiconductor device is provided with a conductive connection member that contacts both the first terminal and the first electrode.

    SEMICONDUCTOR DEVICE
    8.
    发明公开

    公开(公告)号:US20240250014A1

    公开(公告)日:2024-07-25

    申请号:US18626980

    申请日:2024-04-04

    Applicant: Rohm Co., Ltd.

    Inventor: Akihiro KIMURA

    Abstract: A semiconductor device includes a lead, a semiconductor element, and a sealing resin. The lead includes a mounting surface facing in a thickness direction, and an end surface facing in a direction orthogonal to the thickness direction and connected to the mounting surface. The semiconductor element is electrically bonded to the mounting surface. The sealing resin covers the semiconductor element and is in contact with the mounting surface and the end surface. The end surface is formed with a first portion that includes at least one of a projecting portion protruding from the end surface or a recessed portion recessed from the end surface. The projecting portion is located outside an outer edge of the mounting surface as viewed in the thickness direction. The recessed portion is enclosed in the outer edge as viewed in the thickness direction.

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