公开(公告)号：US20160163650A1

公开(公告)日：2016-06-09

申请号：US14704714

申请日：2015-05-05

申请人： Invensas Corporation

发明人： Guilian GAO ,  Cyprian Emeka UZOH ,  Charles G. WOYCHIK ,  Hong SHEN ,  Arkalgud R. SITARAM ,  Liang WANG ,  Akash AGRAWAL ,  Rajesh KATKAR

IPC分类号： H01L23/538 ,  H01L25/00 ,  H01L23/00 ,  H01L25/065

CPC分类号： H01L23/5385 ,  H01L21/486 ,  H01L21/6835 ,  H01L23/147 ,  H01L23/15 ,  H01L23/3128 ,  H01L23/3135 ,  H01L23/49827 ,  H01L24/05 ,  H01L24/08 ,  H01L24/16 ,  H01L24/32 ,  H01L24/48 ,  H01L24/49 ,  H01L24/83 ,  H01L25/0652 ,  H01L25/0655 ,  H01L25/0657 ,  H01L25/50 ,  H01L2221/68331 ,  H01L2224/0401 ,  H01L2224/05644 ,  H01L2224/05647 ,  H01L2224/05655 ,  H01L2224/08225 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/32105 ,  H01L2224/32106 ,  H01L2224/32225 ,  H01L2224/48091 ,  H01L2224/48101 ,  H01L2224/48105 ,  H01L2224/48137 ,  H01L2224/48227 ,  H01L2224/49097 ,  H01L2224/73204 ,  H01L2924/00014 ,  H01L2924/15153 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18161 ,  H01L2924/351 ,  H01L2924/3511 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/45099

摘要： Die (110) and/or undiced wafers and/or multichip modules (MCMs) are attached on top of an interposer (120) or some other structure (e.g. another integrated circuit) and are covered by an encapsulant (160). Then the interposer is thinned from below. Before encapsulation, a layer (410) more rigid than the encapsulant is formed on the interposer around the die to reduce or eliminate interposer dishing between the die when the interposer is thinned by a mechanical process (e.g. CMP). Other features are also provided.

摘要翻译： 模具（110）和/或未开封的晶片和/或多芯片模块（MCM）被附接在插入器（120）或一些其它结构（例如另一集成电路）的顶部上并被密封剂（160）覆盖。 然后插入器从下面变薄。 在封装之前，在封装周围的插入件周围形成比密封剂更刚性的层（410），以通过机械工艺（例如CMP）来减小或消除插入件在裸片间的凹陷。 还提供其他功能。

公开(公告)号：US20190157199A1

公开(公告)日：2019-05-23

申请号：US16238786

申请日：2019-01-03

申请人： Invensas Corporation

发明人： Cyprian Emeka UZOH ,  Charles G. WOYCHIK ,  Arkalgud R. SITARAM ,  Hong Shen ,  Zhuowen SUN ,  Liang WANG ,  Guilian GAO

IPC分类号： H01L23/522 ,  H01L21/768 ,  H01L21/8234 ,  H01L49/02

CPC分类号： H01L23/5223 ,  H01L21/76802 ,  H01L21/76877 ,  H01L21/823431 ,  H01L21/823475 ,  H01L23/5226 ,  H01L28/60 ,  H01L2924/0002 ,  H01L2924/00

摘要： In a microelectronic component having conductive vias (114) passing through a substrate (104) and protruding above the substrate, one or more conductive features (120E.A, 120E.B, or both) are provided above the substrate that wrap around the conductive vias' protrusions (114′) to form capacitors, electromagnetic shields, and possibly other elements. Other features and embodiments are also provided.

公开(公告)号：US20170084539A1

公开(公告)日：2017-03-23

申请号：US15364534

申请日：2016-11-30

申请人： Invensas Corporation

发明人： Guilian GAO ,  Cyprian Emeka UZOH ,  Charles G. WOYCHIK ,  Hong SHEN ,  Arkalgud R. SITARAM ,  Liang WANG ,  Akash AGRAWAL ,  Rajesh KATKAR

IPC分类号： H01L23/538 ,  H01L23/31 ,  H01L21/48

CPC分类号： H01L23/5385 ,  H01L21/486 ,  H01L21/6835 ,  H01L23/147 ,  H01L23/15 ,  H01L23/3128 ,  H01L23/3135 ,  H01L23/49827 ,  H01L24/05 ,  H01L24/08 ,  H01L24/16 ,  H01L24/32 ,  H01L24/48 ,  H01L24/49 ,  H01L24/83 ,  H01L25/0652 ,  H01L25/0655 ,  H01L25/0657 ,  H01L25/50 ,  H01L2221/68331 ,  H01L2224/0401 ,  H01L2224/05644 ,  H01L2224/05647 ,  H01L2224/05655 ,  H01L2224/08225 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/32105 ,  H01L2224/32106 ,  H01L2224/32225 ,  H01L2224/48091 ,  H01L2224/48101 ,  H01L2224/48105 ,  H01L2224/48137 ,  H01L2224/48227 ,  H01L2224/49097 ,  H01L2224/73204 ,  H01L2924/00014 ,  H01L2924/15153 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18161 ,  H01L2924/351 ,  H01L2924/3511 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/45099

摘要： Die (110) and/or undiced wafers and/or multichip modules (MCMs) are attached on top of an interposer (120) or some other structure (e.g. another integrated circuit) and are covered by an encapsulant (160). Then the interposer is thinned from below. Before encapsulation, a layer (410) more rigid than the encapsulant is formed on the interposer around the die to reduce or eliminate interposer dishing between the die when the interposer is thinned by a mechanical process (e.g. CMP). Other features are also provided.

公开(公告)号：US20170018510A1

公开(公告)日：2017-01-19

申请号：US15280175

申请日：2016-09-29

申请人： Invensas Corporation

发明人： Hong SHEN ,  Liang WANG ,  Rajesh KATKAR ,  Charles G. WOYCHIK ,  Guilian GAO

IPC分类号： H01L23/00 ,  H01L23/053 ,  H01L23/498 ,  H01L23/31 ,  H01L25/065 ,  H01L21/48

CPC分类号： H01L23/562 ,  H01L21/481 ,  H01L21/4853 ,  H01L21/486 ,  H01L21/561 ,  H01L23/053 ,  H01L23/145 ,  H01L23/147 ,  H01L23/15 ,  H01L23/295 ,  H01L23/3114 ,  H01L23/3128 ,  H01L23/3675 ,  H01L23/49827 ,  H01L23/49838 ,  H01L23/5384 ,  H01L24/13 ,  H01L24/16 ,  H01L24/32 ,  H01L24/48 ,  H01L24/73 ,  H01L24/92 ,  H01L24/97 ,  H01L25/0655 ,  H01L2224/0401 ,  H01L2224/04042 ,  H01L2224/13111 ,  H01L2224/16227 ,  H01L2224/32225 ,  H01L2224/32245 ,  H01L2224/48227 ,  H01L2224/73204 ,  H01L2224/73253 ,  H01L2224/92225 ,  H01L2224/97 ,  H01L2924/00014 ,  H01L2924/10253 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/157 ,  H01L2924/15788 ,  H01L2924/16153 ,  H01L2924/16235 ,  H01L2924/16251 ,  H01L2924/16315 ,  H01L2924/1632 ,  H01L2924/167 ,  H01L2924/16787 ,  H01L2924/16788 ,  H01L2924/3511 ,  H01L2224/81 ,  H01L2224/85 ,  H01L2224/83 ,  H01L2924/01029 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/45099

摘要： Die (110) are attached to an interposer (420), and the interposer/die assembly is placed into a lid cavity (510). The lid (210) is attached to the top of the assembly, possibly to the encapsulant (474) at the top. The lid's legs (520) surround the cavity and extend down below the top surface of the interposer's substrate (420S), possibly to the level of the bottom surface of the substrate or lower. The legs (520) may or may not be attached to the interposer/die assembly. In fabrication, the interposer wafer (420SW) has trenches (478) which receive the lid's legs during the lid placement. The interposer wafer is later thinned to remove the interposer wafer portion below the legs and to dice the interposer wafer. The thinning process also exposes, on the bottom, conductive vias (450) passing through the interposer substrate. Other features are also provided.

摘要翻译： 模具（110）附接到插入件（420），并且插入器/模具组件被放置在盖腔（510）中。 盖（210）附接到组件的顶部，可能附接到顶部的密封剂（474）。 盖的腿（520）围绕空腔并且向下延伸到插入器的衬底（420S）的顶表面下方，可能地到衬底的底表面的高度或更低。 腿（520）可以或可以不附接到插入件/模具组件。 在制造中，插入器晶片（420SW）具有在盖放置期间接收盖的腿的沟槽（478）。 中间层晶片稍后变薄以去除腿下方的插入片晶片部分并且切割插入片晶片。 薄化工艺还在底部暴露穿过内插衬底的导电通孔（450）。 还提供其他功能。

公开(公告)号：US20150270209A1

公开(公告)日：2015-09-24

申请号：US14220912

申请日：2014-03-20

申请人： Invensas Corporation

发明人： Charles G. WOYCHIK ,  Cyprian Emeka UZOH ,  Ron ZHANG ,  Daniel BUCKMINSTER ,  Guilian GAO

IPC分类号： H01L23/498 ,  H01L23/48 ,  H01L21/52 ,  H01L21/78 ,  H01L23/00

CPC分类号： H01L25/0657 ,  H01L21/304 ,  H01L21/4853 ,  H01L21/486 ,  H01L21/52 ,  H01L21/565 ,  H01L21/76898 ,  H01L21/78 ,  H01L23/13 ,  H01L23/3114 ,  H01L23/481 ,  H01L23/49827 ,  H01L23/49838 ,  H01L23/49894 ,  H01L24/13 ,  H01L24/16 ,  H01L24/17 ,  H01L24/32 ,  H01L24/73 ,  H01L24/85 ,  H01L24/92 ,  H01L24/94 ,  H01L24/97 ,  H01L25/0652 ,  H01L25/0655 ,  H01L25/50 ,  H01L2224/13025 ,  H01L2224/131 ,  H01L2224/13147 ,  H01L2224/16145 ,  H01L2224/16146 ,  H01L2224/16225 ,  H01L2224/16235 ,  H01L2224/16238 ,  H01L2224/1703 ,  H01L2224/17181 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/32245 ,  H01L2224/73204 ,  H01L2224/73253 ,  H01L2224/92125 ,  H01L2224/94 ,  H01L2224/97 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06541 ,  H01L2225/06544 ,  H01L2225/06548 ,  H01L2225/06555 ,  H01L2225/06582 ,  H01L2225/06589 ,  H01L2924/00014 ,  H01L2924/15159 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/16152 ,  H01L2924/16235 ,  H01L2924/16251 ,  H01L2924/181 ,  H01L2924/18161 ,  H01L2924/3511 ,  H01L2224/83 ,  H01L2224/81 ,  H01L2924/014 ,  H01L2924/0105 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2924/00012

摘要： An apparatus relates generally to an integrated circuit package. In such an apparatus, a package substrate has a first plurality of via structures extending from a lower surface of the package substrate to an upper surface of the package substrate. An die has a second plurality of via structures extending to a lower surface of the die. The lower surface of the die faces the upper surface of the package substrate in the integrated circuit package. The package substrate does not include a redistribution layer. The die and the package substrate are coupled to one another.

摘要翻译： 装置一般涉及集成电路封装。 在这种装置中，封装衬底具有从封装衬底的下表面延伸到封装衬底的上表面的第一多个通孔结构。 模具具有延伸到模具的下表面的第二多个通孔结构。 模具的下表面在集成电路封装中面向封装衬底的上表面。 封装基板不包括再分布层。 管芯和封装衬底彼此耦合。

公开(公告)号：US20180233447A1

公开(公告)日：2018-08-16

申请号：US15952935

申请日：2018-04-13

申请人： Invensas Corporation

发明人： Cyprian Emeka UZOH ,  Charles G. WOYCHIK ,  Arkalgud R. SITARAM ,  Hong SHEN ,  Zhuowen SUN ,  Liang WANG ,  Guilian GAO

IPC分类号： H01L23/522 ,  H01L21/768 ,  H01L49/02 ,  H01L21/8234

CPC分类号： H01L23/5223 ,  H01L21/76802 ,  H01L21/76877 ,  H01L21/823431 ,  H01L21/823475 ,  H01L23/5226 ,  H01L28/60 ,  H01L2924/0002 ,  H01L2924/00

摘要： In a microelectronic component having conductive vias (114) passing through a substrate (104) and protruding above the substrate, conductive features (120E.A, 120E.B) are provided above the substrate that wrap around the conductive vias' protrusions (114′) to form capacitors, electromagnetic shields, and possibly other elements. Other features and embodiments are also provided.

公开(公告)号：US20170278787A1

公开(公告)日：2017-09-28

申请号：US15619160

申请日：2017-06-09

申请人： Invensas Corporation

发明人： Cyprian Emeka UZOH ,  Charles G. WOYCHIK ,  Arkalgud R. SITARAM ,  Hong SHEN ,  Zhuowen SUN ,  Liang WANG ,  Guilian GAO

IPC分类号： H01L23/522 ,  H01L49/02 ,  H01L21/8234 ,  H01L21/768

CPC分类号： H01L23/5223 ,  H01L21/76802 ,  H01L21/76877 ,  H01L21/823431 ,  H01L21/823475 ,  H01L23/5226 ,  H01L28/60 ,  H01L2924/0002 ,  H01L2924/00

摘要： In a microelectronic component having conductive vias (114) passing through a substrate (104) and protruding above the substrate, conductive features (120E.A, 120E.B) are provided above the substrate that wrap around the conductive vias' protrusions (114′) to form capacitors, electromagnetic shields, and possibly other elements. Other features and embodiments are also provided.

公开(公告)号：US20160379885A1

公开(公告)日：2016-12-29

申请号：US14749529

申请日：2015-06-24

申请人： Invensas Corporation

发明人： Cyprian Emeka UZOH ,  Guilian GAO ,  Liang WANG ,  Hong SHEN ,  Arkalgud R. SITARAM

IPC分类号： H01L21/82 ,  H01L23/00 ,  H01L23/31 ,  H01L21/56 ,  H01L23/522

CPC分类号： H01L21/82 ,  H01L21/486 ,  H01L21/561 ,  H01L23/3128 ,  H01L23/5389 ,  H01L23/562 ,  H01L24/96 ,  H01L24/97 ,  H01L24/98 ,  H01L2224/04105 ,  H01L2924/15311 ,  H01L2924/15313 ,  H01L2924/157 ,  H01L2924/15788 ,  H01L2924/3511 ,  H01L2924/3512

摘要： A device and method of forming the device that includes cavities formed in a substrate of a substrate device, the substrate device also including conductive vias formed in the substrate. Chip devices, wafers, and other substrate devices can be mounted to the substrate device. Encapsulation layers and materials may be formed over the substrate device in order to fill the cavities.

摘要翻译： 一种形成该器件的器件和方法，该器件包括形成在衬底器件的衬底中的腔体，该衬底器件还包括形成在衬底中的导电通孔。 芯片器件，晶片和其他衬底器件可以安装到衬底器件上。 可以在衬底装置上形成封装层和材料以便填充空腔。

公开(公告)号：US20150255364A1

公开(公告)日：2015-09-10

申请号：US14201473

申请日：2014-03-07

申请人： Invensas Corporation

发明人： Guilian GAO

IPC分类号： H01L23/367 ,  H01L23/373 ,  H01L21/321 ,  H01L21/306 ,  H01L21/311 ,  H01L21/308 ,  H01L23/48 ,  H01L21/768

CPC分类号： H01L23/3677 ,  H01L21/30604 ,  H01L21/30625 ,  H01L21/308 ,  H01L21/31111 ,  H01L21/3212 ,  H01L21/486 ,  H01L21/4882 ,  H01L21/76829 ,  H01L21/76843 ,  H01L21/76898 ,  H01L23/481 ,  H01L23/538 ,  H01L2224/16145 ,  H01L2224/16225 ,  H01L2224/32225 ,  H01L2224/73204 ,  H01L2224/73253 ,  H01L2924/15311 ,  H01L2924/16152 ,  H01L2924/00

摘要： An apparatus relating generally to a substrate is disclosed. In such an apparatus, the substrate has formed therein a plurality of vias. A liner layer is located on the substrate, including being located in a subset of the plurality of vias. At least one of the plurality of vias does not have the liner layer located therein. A thermally conductive material is disposed in the at least one of the plurality of vias to provide a thermal via structure.

摘要翻译： 公开了一般涉及基板的装置。 在这种装置中，衬底在其中形成有多个通孔。 衬垫层位于衬底上，包括位于多个通孔的子集中。 多个通孔中的至少一个不具有位于其中的衬垫层。 导热材料设置在多个通孔中的至少一个通孔中以提供热通孔结构。