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公开(公告)号:US11012246B2
公开(公告)日:2021-05-18
申请号:US15259948
申请日:2016-09-08
发明人: Shih-Lien Linus Lu , Wei-Min Chan , Chien-Chen Lin
IPC分类号: H04L9/32 , G11C7/20 , G11C8/12 , H04L9/08 , G06F12/14 , G11C11/417 , G11C29/14 , G11C16/34 , G11C29/44
摘要: A memory device includes a memory block comprises a plurality of bits, wherein at least a first bit of the plurality of bits presents an initial logic state each time it is powered on; a start-up circuit configured to power on and off the memory block N times, where N is an odd integer greater than 1, and wherein the at least first bit presents an initial state after each respective power cycle of the memory block; and an authentication circuit, coupled to the memory block, and comprising an election engine that is configured to elect an initial state that occurs (N+1)/2 or more times after N power cycles that are performed by the start-up circuit, as a majority initial logic state for the first bit.
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公开(公告)号:US10439827B2
公开(公告)日:2019-10-08
申请号:US15288382
申请日:2016-10-07
发明人: Chien-Chen Lin , Shih-Lien Linus Lu , Wei-Min Chan
IPC分类号: G11C11/419 , H04L9/32 , G06F12/14 , G06F21/44 , G06F21/73
摘要: A memory device includes a memory block that includes a plurality of memory bits, wherein each bit is configured to present a first logical state; and an authentication circuit, coupled to the plurality of memory bits, wherein the authentication circuit is configured to access a first bit under either a reduced read margin or a reduced write margin condition to determine a stability of the first bit by detecting whether the first logical state flips to a second logical state, and based on the determined stability of at least the first bit, to generate a physically unclonable function (PUF) signature.
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公开(公告)号:US11675505B2
公开(公告)日:2023-06-13
申请号:US17717491
申请日:2022-04-11
发明人: Yu-Hao Hsu , Cheng Hung Lee , Chen-Lin Yang , Chiting Cheng , Fu-An Wu , Hung-Jen Liao , Jung-Ping Yang , Jonathan Tsung-Yung Chang , Wei Min Chan , Yen-Huei Chen , Yangsyu Lin , Chien-Chen Lin
IPC分类号: G06F3/06 , G11C5/14 , G11C11/4074 , G11C16/12 , G11C16/30 , H04B10/03 , H04B10/27 , H04J14/02
CPC分类号: G06F3/0625 , G06F3/0679 , G11C5/147 , G11C11/4074 , G11C16/12 , G11C16/30 , H04B10/03 , H04B10/27 , H04J14/0228 , H04J14/0268
摘要: Various embodiments for configurable memory storage systems are disclosed. The configurable memory storages selectively choose an operational voltage signal from among multiple voltage signals to dynamically control various operational parameters. For example, the configurable memory storages selectively choose a maximum voltage signal from among the multiple voltage signals to maximize read/write speed. As another example, the configurable memory storages selectively choose a minimum voltage signal from among the multiple voltage signals to minimize power consumption.
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公开(公告)号:US11301148B2
公开(公告)日:2022-04-12
申请号:US17201931
申请日:2021-03-15
发明人: Yu-Hao Hsu , Cheng Hung Lee , Chen-Lin Yang , Chiting Cheng , Fu-An Wu , Hung-Jen Liao , Jung-Ping Yang , Jonathan Tsung-Yung Chang , Wei Min Chan , Yen-Huei Chen , Yangsyu Lin , Chien-Chen Lin
IPC分类号: G11C5/14 , G06F3/06 , G11C11/4074 , G11C16/30 , G11C16/12 , H04B10/03 , H04B10/27 , H04J14/02
摘要: Various embodiments for configurable memory storage systems are disclosed. The configurable memory storages selectively choose an operational voltage signal from among multiple operational voltage signals to dynamically control various operational parameters. For example, the configurable memory storages selectively choose a maximum operational voltage signal from among the multiple operational voltage signals to maximize read/write speed. As another example, the configurable memory storages selectively choose a minimum operational voltage signal from among the multiple operational voltage signals to minimize power consumption.
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公开(公告)号:US11263331B2
公开(公告)日:2022-03-01
申请号:US16561052
申请日:2019-09-05
摘要: An electronic device for checking a randomness of an identification key device, a random key checker circuit for an electronic device and a method of checking randomness for an electronic device. An electronic device for checking a randomness of an identification key device includes an identification key generator, configured to generate an identification key. A random key checker circuit, configured to receive the identification key from the identification key generator, calculates a randomness value of the identification key according to the identification key for checking a randomness of the identification key and generates an output of the identification key with high randomness.
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公开(公告)号:US10949100B2
公开(公告)日:2021-03-16
申请号:US16685722
申请日:2019-11-15
发明人: Yu-Hao Hsu , Cheng Hung Lee , Chen-Lin Yang , Chiting Cheng , Fu-An Wu , Hung-Jen Liao , Jung-Ping Yang , Jonathan Tsung-Yung Chang , Wei Min Chan , Yen-Huei Chen , Yangsyu Lin , Chien-Chen Lin
IPC分类号: G11C5/14 , G06F3/06 , G11C11/4074 , G11C16/30 , G11C16/12 , H04B10/03 , H04B10/27 , H04J14/02
摘要: Various embodiments for configurable memory storage systems are disclosed. The configurable memory storages selectively choose an operational voltage signal from among multiple operational voltage signals to dynamically control various operational parameters. For example, the configurable memory storages selectively choose a maximum operational voltage signal from among the multiple operational voltage signals to maximize read/write speed. As another example, the configurable memory storages selectively choose a minimum operational voltage signal from among the multiple operational voltage signals to minimize power consumption.
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公开(公告)号:US10964389B2
公开(公告)日:2021-03-30
申请号:US16911049
申请日:2020-06-24
发明人: Hidehiro Fujiwara , Hung-Jen Liao , Hsien-Yu Pan , Chih-Yu Lin , Yen-Huei Chen , Chien-Chen Lin
IPC分类号: G11C15/00 , G11C15/04 , H01L27/02 , G11C11/412
摘要: A cell structure is disclosed. The cell structure includes a first unit comprising a first group of transistors and a first data latch, a second unit comprising a second group of transistors and a second data latch a read port unit comprising a plurality of p-type transistors, a search line and a complementary search line, the search line and the complementary search line function as input of the cell structure, and a master line, the master line functions as an output of the cell structure, the first unit is coupled to the second unit, both the first and the second units are coupled to the read port unit. According to some embodiments, the first data latch comprises a first and a second p-type transistors, a first and a second n-type transistors.
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公开(公告)号:US10770134B2
公开(公告)日:2020-09-08
申请号:US16202584
申请日:2018-11-28
发明人: Chien-Chen Lin , Wei-Min Chan , Chih-Yu Lin , Shih-Lien Linus Lu , Yen-Huei Chen
IPC分类号: G06F21/00 , G11C11/419 , G11C11/418 , H04L9/32 , G11C7/20 , G11C7/24 , G11C11/413 , G09C1/00 , G11C29/44
摘要: A memory device includes a memory cell array comprising a plurality of memory cells wherein each of the plurality of memory cells is configured to be in a data state, and a physically unclonable function (PUF) generator. The PUF generator further includes a first sense amplifier, coupled to the plurality of memory cells, wherein while the plurality of memory cells are being accessed, the first sense amplifier is configured to compare accessing speeds of first and second memory cells of the plurality of memory cells, and based on the comparison, provide a first output signal for generating a first PUF signature.
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公开(公告)号:US10153035B2
公开(公告)日:2018-12-11
申请号:US15288342
申请日:2016-10-07
发明人: Chien-Chen Lin , Wei Min Chan , Chih-Yu Lin , Shih-Lien Linus Lu , Yen-Huei Chen
IPC分类号: G06F21/00 , G11C11/419 , G11C11/418 , H04L9/32 , G11C7/20 , G11C7/24 , G11C11/413 , G11C29/44
摘要: A memory device includes a memory cell array comprising a plurality of memory cells wherein each of the plurality of memory cells is configured to be in a data state, and a physically unclonable function (PUF) generator. The PUF generator further includes a first sense amplifier, coupled to the plurality of memory cells, wherein while the plurality of memory cells are being accessed, the first sense amplifier is configured to compare accessing speeds of first and second memory cells of the plurality of memory cells, and based on the comparison, provide a first output signal for generating a first PUF signature.
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公开(公告)号:US11574674B2
公开(公告)日:2023-02-07
申请号:US17014622
申请日:2020-09-08
发明人: Chien-Chen Lin , Wei Min Chan , Chih-Yu Lin , Shih-Lien Linus Lu , Yen-Huei Chen
IPC分类号: G06F21/00 , G11C11/419 , G11C11/418 , H04L9/32 , G11C7/20 , G11C7/24 , G11C11/413 , G09C1/00 , G11C29/44
摘要: A memory device includes a memory cell array comprising a plurality of memory cells wherein each of the plurality of memory cells is configured to be in a data state, and a physically unclonable function (PUF) generator. The PUF generator further includes a first sense amplifier, coupled to the plurality of memory cells, wherein while the plurality of memory cells are being accessed, the first sense amplifier is configured to compare accessing speeds of first and second memory cells of the plurality of memory cells, and based on the comparison, provide a first output signal for generating a first PUF signature.
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