Memory controller, memory module and memory system

    公开(公告)号:US10083728B2

    公开(公告)日:2018-09-25

    申请号:US14324228

    申请日:2014-07-06

    Applicant: MEDIATEK INC.

    CPC classification number: G11C8/12 G06F12/00 G06F13/1668

    Abstract: A memory module, comprising: a first pin, arranged to receive a first signal; a second pin, arranged to receive a second signal; a first conducting path, having a first end coupled to the first pin; at least one memory chip, coupled to the first conducting path for receiving the first signal; a predetermined resistor, having a first terminal coupled to a second end of the first conducting path; and a second conducting path, having a first end coupled to second pin for conducting the second to a second terminal of the predetermined resistor; wherein the first signal and the second are synchronous and configured to be a differential signal, for enabling a selected memory chip from the at least one memory chip to be accessed.

    Printed circuit board for mobile platforms
    3.
    发明授权
    Printed circuit board for mobile platforms 有权
    用于移动平台的印刷电路板

    公开(公告)号:US09131602B2

    公开(公告)日:2015-09-08

    申请号:US13747738

    申请日:2013-01-23

    Applicant: MediaTek Inc.

    Abstract: The invention provides a printed circuit board for mobile platforms. An exemplary embodiment of the printed circuit board for mobile platforms includes a core substrate having a first side. A ground plane covers the first side. A first insulating layer covers the ground plane. A plurality of first signal traces and a plurality of first ground traces are alternatively arranged on the first insulating layer. A second insulating layer connects to the first insulating layer. A plurality of second signal traces separated from each other is disposed on the second insulating layer, wherein the second signal traces are disposed directly on spaces between the first signal traces and the first ground traces adjacent thereto.

    Abstract translation: 本发明提供一种用于移动平台的印刷电路板。 用于移动平台的印刷电路板的示例性实施例包括具有第一侧的芯基板。 地平面覆盖第一面。 第一绝缘层覆盖接地层。 多个第一信号迹线和多个第一接地迹线交替地布置在第一绝缘层上。 第二绝缘层连接到第一绝缘层。 彼此分离的多个第二信号迹线设置在第二绝缘层上,其中第二信号迹线直接设置在第一信号迹线和与其相邻的第一接地迹线之间的空间上。

    DEVICE FOR TESTING CHIP OR DIE WITH BETTER SYSTEM IR DROP

    公开(公告)号:US20230125573A1

    公开(公告)日:2023-04-27

    申请号:US18087832

    申请日:2022-12-23

    Applicant: MEDIATEK INC.

    Abstract: The present invention provides a device for testing a chip, wherein the device includes a testing board and an interposer. The testing board has a plurality of pads for providing a plurality of test signals. The interposer board includes a plurality of passive components, and at least one of the passive components is coupled between a supply voltage and a ground voltage, and the supply voltage and the ground voltage are received from a power pad and a ground pad of the plurality of pads of the testing board, respectively; wherein the chip is positioned in the device, the chip receives the test signals including the supply voltage and the ground voltage from the power pad and the ground pad of the testing board, respectively.

    Microelectronic system including printed circuit board having improved power/ground ball pad array

    公开(公告)号:US10194530B2

    公开(公告)日:2019-01-29

    申请号:US15847852

    申请日:2017-12-19

    Applicant: MEDIATEK INC.

    Abstract: A microelectronic system includes a base and a semiconductor package mounted on the base. The base includes an internal conductive layer and a build-up layer on the internal conductive layer. The build-up layer includes a top conductive layer. A plurality of microvias is disposed in the build-up layer to electrically connect the top conductive layer with the internal conductive layer. A power/ground ball pad array is disposed in the top conductive layer. The power/ground ball pad array includes power ball pads and ground ball pads arranged in an array with a fixed ball pad pitch P, and the power/ground ball pad array includes a 4-ball pad unit area comprised of only one ground ball pad and three power ball pads, or comprised of only one power ball pad and three ground ball pads. The 4-ball pad unit area has a rectangular shape and a dimension of about 2P×2P.

    DEVICE FOR TESTING CHIP OR DIE WITH BETTER SYSTEM IR DROP

    公开(公告)号:US20200326368A1

    公开(公告)日:2020-10-15

    申请号:US16828925

    申请日:2020-03-24

    Applicant: MEDIATEK INC.

    Abstract: The present invention provides a device for testing a chip, wherein the device includes a testing board and an interposer. The testing board has a plurality of pads for providing a plurality of test signals. The interposer board includes a plurality of passive components, and at least one of the passive components is coupled between a supply voltage and a ground voltage, and the supply voltage and the ground voltage are received from a power pad and a ground pad of the plurality of pads of the testing board, respectively; wherein the chip is positioned in the device, the chip receives the test signals including the supply voltage and the ground voltage from the power pad and the ground pad of the testing board, respectively.

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