Extended contact area for leadframe strip testing
    4.
    发明授权
    Extended contact area for leadframe strip testing 有权
    用于引线框条测试的扩展接触区域

    公开(公告)号:US09252063B2

    公开(公告)日:2016-02-02

    申请号:US14324295

    申请日:2014-07-07

    CPC classification number: H01L22/14 H01L21/78 H01L22/32 H01L2224/97

    Abstract: A leadframe strip includes a plurality of unit leadframes connected to a periphery of the leadframe strip, each unit leadframe having a die paddle, a plurality of leads and a semiconductor die attached to the die paddle. The leadframe strip is tested by electrically isolating at least the leads from the periphery of the leadframe strip such that at least some of the leads extend uninterrupted beyond a final lead outline of the unit leadframes after electrical isolation from the periphery of the leadframe strip. The semiconductor dies are tested, which includes probing the die paddles and the leads that extend uninterrupted beyond the final lead outline of the unit leadframes after electrical isolation from the periphery of the leadframe strip. The unit leadframes are severed from the leadframe strip along the final lead outline of the unit leadframes after testing the semiconductor dies.

    Abstract translation: 引线框条包括连接到引线框带的周边的多个单元引线框架,每个单元引线框架具有管芯焊盘,多个引线和连接到管芯焊盘的半导体管芯。 引线框条通过至少将引线与引线框带的周边电隔离来进行测试,使得至少一些引线在与引线框带的外围电绝缘之后不间断延伸超过单元引线框架的最终引线轮廓。 测试半导体管芯,其包括在与引线框架条的周边电绝缘之后探测管芯焊盘和引线,其延伸不间断地超过单元引线框架的最终引线轮廓。 在测试半导体裸片之后,单元引线框架沿引线框架沿着单元引线框架的最终引线轮廓被切断。

    SEMICONDUCTOR DIE PACKAGE WITH MULTIPLE MOUNTING CONFIGURATIONS
    7.
    发明申请
    SEMICONDUCTOR DIE PACKAGE WITH MULTIPLE MOUNTING CONFIGURATIONS 有权
    具有多个安装配置的半导体封装

    公开(公告)号:US20150279757A1

    公开(公告)日:2015-10-01

    申请号:US14242114

    申请日:2014-04-01

    Abstract: A semiconductor die package includes first, second and third metal blocks insulated from one another. The first metal block has a thinner inner section, a first thicker outer section at a first end of the thinner inner section and a second thicker outer section at a second end of the thinner inner section opposing the first end. The second metal block has a thicker outer section and a thinner inner section protruding inward from the thicker outer section. The third metal block has a thicker outer section and a thinner inner section protruding inward from the thicker outer section. A semiconductor die has a first terminal attached to the thinner inner section of the first metal block, a second terminal attached to the thinner inner section of the second metal block, and a third terminal attached to the thinner inner section of the third metal block.

    Abstract translation: 半导体管芯封装包括彼此绝缘的第一,第二和第三金属块。 第一金属块具有更薄的内部部分,在较薄内部部分的第一端处的第一较厚外部部分和在较薄内部部分的与第一端部相对的第二端处的第二较厚外部部分。 第二金属块具有较厚的外部部分和从较厚的外部部分向内突出的较薄的内部部分。 第三金属块具有较厚的外部部分和从较厚的外部部分向内突出的较薄的内部部分。 半导体管芯具有附接到第一金属块的较薄内部的第一端子,附接到第二金属块的较薄内部的第二端子和附接到第三金属块的较薄内部的第三端子。

    Semiconductor die package with multiple mounting configurations
    9.
    发明授权
    Semiconductor die package with multiple mounting configurations 有权
    具有多种安装配置的半导体管芯封装

    公开(公告)号:US09508625B2

    公开(公告)日:2016-11-29

    申请号:US14242114

    申请日:2014-04-01

    Abstract: A semiconductor die package includes first, second and third metal blocks insulated from one another. The first metal block has a thinner inner section, a first thicker outer section at a first end of the thinner inner section and a second thicker outer section at a second end of the thinner inner section opposing the first end. The second metal block has a thicker outer section and a thinner inner section protruding inward from the thicker outer section. The third metal block has a thicker outer section and a thinner inner section protruding inward from the thicker outer section. A semiconductor die has a first terminal attached to the thinner inner section of the first metal block, a second terminal attached to the thinner inner section of the second metal block, and a third terminal attached to the thinner inner section of the third metal block.

    Abstract translation: 半导体管芯封装包括彼此绝缘的第一,第二和第三金属块。 第一金属块具有更薄的内部部分,在较薄内部部分的第一端处的第一较厚外部部分和在较薄内部部分的与第一端部相对的第二端处的第二较厚外部部分。 第二金属块具有较厚的外部部分和从较厚的外部部分向内突出的较薄的内部部分。 第三金属块具有较厚的外部部分和从较厚的外部部分向内突出的较薄的内部部分。 半导体管芯具有附接到第一金属块的较薄内部的第一端子,附接到第二金属块的较薄内部的第二端子和附接到第三金属块的较薄内部的第三端子。

Patent Agency Ranking