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    Particle counter and classification system
    63.
    发明授权
    Particle counter and classification system 有权
    粒子计数器和分类系统

    公开(公告)号：US09274041B2

    公开(公告)日：2016-03-01

    申请号：US14253354

    申请日：2014-04-15

    Applicant: Spectro Scientific, Inc.

    Inventor： Patrick F. Henning ,  Eric J. Olson ,  John Glaberson ,  Thomas Barraclough

    IPC: G01N27/74 ,  G01N27/72 ,  G01R33/12 ,  G01R33/00 ,  G01N21/00 ,  G01N15/10 ,  G01N15/06

    CPC classification number: G01N15/10 ,  G01N15/02 ,  G01N15/0656 ,  G01N15/1031 ,  G01N15/1459 ,  G01N15/1463 ,  G01N33/2858 ,  G01N2015/0053 ,  G01N2015/0294 ,  G01N2015/0693 ,  G01N2015/1087 ,  G01N2015/1093 ,  G01N2015/1493 ,  G01N2015/1497

    Abstract: A particle counter and classification system including an imaging subsystem configured to determine the size and morphology of particles above a predetermined size in a fluid in a sample cell. A first stage magnetometer sensor subsystem is tuned to detect and determine the size of ferrous and/or conducting particles. An optional second stage magnetometer sensor subsystem is tuned to detect the overall ferrous particle content of the fluid. A processor subsystem is configured to calculate and report the number of particles in the fluid in a plurality of size ranges, their morphology, their classification as a particular particle type according to their characteristic morphology, the number of ferrous and/or conducting particles, and the overall ferrous content of the fluid.

    Abstract translation: 一种粒子计数器和分类系统，包括成像子系统，该成像子系统构造成在样品池中的流体中确定高于预定尺寸的颗粒的尺寸和形态。 调整第一级磁力计传感器子系统以检测和确定亚铁和/或导电颗粒的尺寸。 调整可选的第二级磁力计传感器子系统以检测流体的总铁含量。 处理器子系统被配置为根据其特征形态，亚铁和/或导电粒子的数量来计算和报告多个尺寸范围内的流体中的颗粒数，其形态，其作为特定颗粒类型的分类，以及 流体的总铁含量。

    SYSTEM FOR SAMPLING AND/OR ANALYSIS OF PARTICLES IN A GASEOUS ENVIRONMENT
    67.
    发明申请
    SYSTEM FOR SAMPLING AND/OR ANALYSIS OF PARTICLES IN A GASEOUS ENVIRONMENT 有权
    气体环境中颗粒采样和/或分析系统

    公开(公告)号：US20150377764A1

    公开(公告)日：2015-12-31

    申请号：US14740676

    申请日：2015-06-16

    Applicant: U.S. Army Research Laboratory ATTN: RDRL-LOC-l

    Inventor： Yongle Pan

    IPC: G01N15/14 ,  G01N21/65

    CPC classification number: G01N15/1434 ,  G01N15/1463 ,  G01N21/65 ,  G01N2015/0065

    Abstract: A system for trapping particles in a gas comprising a chamber; an intake for intake of a gas containing at least one particle to be trapped and released, and an outlet for exit of the gas out of the chamber containing at least one particle; a first passage operatively connected to the intake operating to create a flow of a gas containing at least one particle into the chamber, a second passage operatively connected to the outlet for flow of the gas; a third passage operatively connected to a gaseous flow for creating a flow of fluid in a direction substantially opposite to the transfer of gas from the first passage so as to counteract the flow of gas from the first passage; an image sensor for recording an image; and a laser for generating a light beam for forming a photophoretic trap between the first and third passages.

    Abstract translation: 一种用于在包括腔室的气体中捕集颗粒的系统; 用于摄入含有至少一个被捕获和释放的颗粒的气体的入口和用于从包含至少一个颗粒的室中排出气体的出口; 第一通道，其操作性地连接到进气口，以操作以产生包含至少一个颗粒的气体流入所述室;第二通道，其可操作地连接到所述出口，用于气体流动; 第三通道，其可操作地连接到气流，用于在与第一通道的气体转移基本相反的方向上产生流体流，以抵消来自第一通道的气体流动; 用于记录图像的图像传感器; 以及用于产生用于在第一和第三通道之间形成光致阱的光束的激光器。

    Apparatus and method for optically characterizing materials
    68.
    发明授权
    Apparatus and method for optically characterizing materials 有权
    用于光学表征材料的装置和方法

    公开(公告)号：US09222879B2

    公开(公告)日：2015-12-29

    申请号：US13818188

    申请日：2011-09-09

    Applicant: Matthias Hartrumpf

    Inventor： Matthias Hartrumpf

    IPC: G01N21/21 ,  G01N15/14

    CPC classification number: G01N21/21 ,  G01N15/1434 ,  G01N15/1463 ,  G01N15/1475 ,  G01N21/84 ,  G01N2015/144 ,  G01N2021/845 ,  G01N2201/0438 ,  G01N2201/06113

    Abstract: The present invention relates to a device for optical characterization of a sample and/or of the material(s) of the same having an illumination unit that can be orientated to illuminate with incident light a sample spatial portion into which the sample can be introduced, a detection unit which is orientated or can be orientated to image the sample introduced into the sample spatial portion by receiving light reflected by the sample, and which is configured to detect at least two different, preferably orthogonal, polarization components in the reflected light, and an evaluation unit with which, in the imaging data recorded by the detection unit, those imaged surface elements (reflection elements) of the sample can be identified, and with which the detected different polarization components for these reflection elements can be evaluated for optical characterization.

    Abstract translation: 本发明涉及一种用于光学表征样品和/或其材料的装置，该装置具有照明单元，该照明单元可以被定向为用入射光照射样品可以引入其中的样品空间部分， 一个检测单元，其被定向或可以被定向以通过接收由样本反射的光来对引入到样本空间部分中的样品成像，并且被配置为检测反射光中的至少两个不同的，优选正交的偏振分量;以及 评估单元，在由检测单元记录的成像数据中，可以识别样品的那些成像表面元件（反射元件），并且可以通过该评估单元评估用于这些反射元件的检测到的不同偏振分量用于光学表征。

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