Vacuum manifold for filtration microscopy

    公开(公告)号:US12070725B2

    公开(公告)日:2024-08-27

    申请号:US18315911

    申请日:2023-05-11

    申请人: Optofluidics Inc.

    摘要: A vacuum manifold for filtration microscopy includes a manifold top having multiple openings, and a capture membrane positioned above and spaced apart from the manifold top, where the capture membrane is configured to deflect into contact with a surface of the manifold top when a negative pressure is applied to the multiple openings. A method for filtration microscopy includes the steps of providing a vacuum manifold including a manifold top having a plurality of openings, and a capture membrane positioned above and spaced apart from the manifold top; applying sample drops to sample spots on the membrane, the sample spots positioned above the plurality of openings; applying a negative pressure to the openings such that the capture membrane contacts a surface of the manifold top; and optically imaging particulates on the capture membrane.

    Methods and devices for correction in particle size measurement

    公开(公告)号:US11988590B2

    公开(公告)日:2024-05-21

    申请号:US17594507

    申请日:2020-04-27

    申请人: CytoChip Inc.

    发明人: Wendian Shi

    摘要: Methods and devices for correction in particle size measurement are disclosed. In some embodiments, a method includes the following steps: (1) measuring a signal from a target particle and a reference particle in a cartridge device; (2) analyzing the measured signal to obtain signal information of the target particle and signal information of the reference particle; and (3) determining size information of the target particle by correcting the signal information of the target particle with the signal information of the reference particle. In other embodiments, a device includes a cartridge and an analyzer. The analyzer is configured to receive the cartridge into the analyzer, measure a signal from the target particle and the reference particle, analyze the measured signal to obtain signal information, and determine size information of the target particle.