Memory circuit and cache circuit configuration
    21.
    发明授权
    Memory circuit and cache circuit configuration 有权
    存储电路和缓存电路配置

    公开(公告)号:US09431064B2

    公开(公告)日:2016-08-30

    申请号:US13667924

    申请日:2012-11-02

    Abstract: A cache memory die includes a substrate, a predetermined number of sets of memory cells on the substrate, a first set of input/output terminals on a first surface of the cache memory die, and a second set of input/output terminals on a second surface of the cache memory die. The first set of input/output terminals are connected to a primary memory circuit outside the cache memory die. A portion of the second set of input/output terminals are compatible with the first set of input/output terminals.

    Abstract translation: 高速缓冲存储器管芯包括衬底,衬底上的预定数量的存储器单元组,高速缓冲存储器管芯的第一表面上的第一组输入/输出端子和第二组输入/输出端子 缓冲存储器表面死亡。 第一组输入/输出端子连接到高速缓冲存储器管芯外部的主存储器电路。 第二组输入/输出端子的一部分与第一组输入/输出端子兼容。

    Substrate bias control circuit
    22.
    发明授权
    Substrate bias control circuit 有权
    基板偏置控制电路

    公开(公告)号:US09158324B2

    公开(公告)日:2015-10-13

    申请号:US14025171

    申请日:2013-09-12

    CPC classification number: G05F3/205 H03K19/00384

    Abstract: An integrated circuit includes a process voltage temperature (PVT) effect transducer responsive to a PVT effect, a PVT effect quantifier coupled to the PVT effect transducer and configured to quantify the PVT effect to provide an output, and a bias controller configured to receive the output of the PVT effect quantifier and provide a bias voltage for a substrate of an NMOS or a PMOS transistor. The bias controller is configured to compare the output received from the PVT effect quantifier to a threshold value, and decrease or increase the bias voltage depending on whether the output is higher or lower than the threshold value.

    Abstract translation: 集成电路包括响应于PVT效应的过程电压温度(PVT)效应传感器,耦合到PVT效应传感器并被配置为量化PVT效应以提供输出的PVT效应量化器,以及配置成接收输出的偏置控制器 的PVT效应量化器,并为NMOS或PMOS晶体管的衬底提供偏置电压。 偏置控制器被配置为将从PVT效应量化器接收的输出与阈值进行比较,并且根据输出是高于还是低于阈值来降低或增加偏置电压。

    Power-aware scan partitioning
    27.
    发明授权

    公开(公告)号:US10685157B2

    公开(公告)日:2020-06-16

    申请号:US16135804

    申请日:2018-09-19

    Abstract: Methods of a scan partitioning a circuit are disclosed. One method includes calculating a power score for circuit cells within a circuit design based on physical cell parameters of the circuit cells. For each of the circuit cells, the circuit cell is assigned to a scan group according to the power score for the circuit cell and a total power score for each scan group. A plurality of scan chains is formed. Each of the scan chains is formed from the circuit cells in a corresponding scan group based at least in part on placement data within the circuit design for each of the circuit cells. Interconnect power consumption can be assessed to determine routing among circuit cells in the scan chains.

    Image processing apparatus on integrated circuit and method thereof

    公开(公告)号:US10440281B2

    公开(公告)日:2019-10-08

    申请号:US14458815

    申请日:2014-08-13

    Abstract: An apparatus comprises an integrated circuit and at least one lens. The integrated circuit comprises an image sensor having a light sensing region. The light sensing region is partitioned into sub-regions. The integrated circuit also comprises a processor coupled with and beneath the image sensor. The processor is configured to generate a first processed image based on an image captured by one sub-region, and a second processed image based on another image captured by another sub-region. The first processed image and the second processed image are generated based on a pixel correction process executed by the processor which corrects one or more of the image or the another image based on a predefined light reception factor associated with the sub-regions. The image sensor is configured to receive light via the light sensing region through the at least one lens.

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