Particle characterization
    4.
    发明授权

    公开(公告)号:US11747257B2

    公开(公告)日:2023-09-05

    申请号:US17355430

    申请日:2021-06-23

    发明人: Jason Corbett

    IPC分类号: G01N15/02 G01N15/00

    摘要: An apparatus for particle characterisation, comprising: a sample cell for holding a sample; a light source configured to illuminate the sample with an illuminating beam and a plurality of light detectors, each light detector configured to receive scattered light resulting from the interaction between the illuminating beam and the sample along a respective detector path, wherein each respective detector path is at substantially the same angle to the illuminating beam.

    OBSERVATION SYSTEM AND OBSERVATION METHOD
    6.
    发明申请

    公开(公告)号:US20180013971A1

    公开(公告)日:2018-01-11

    申请号:US15637086

    申请日:2017-06-29

    IPC分类号: H04N5/374 H04N3/14

    摘要: An observation system includes: a plurality of imaging sections to image one or more samples; a plurality of driving mechanisms that respectively move the imaging sections to change an imaging position for the samples; and a control circuit that controls operations of the driving mechanisms and the imaging sections to cause the imaging sections to image the samples, while causing the driving mechanisms to respectively move the imaging sections. The control circuit imposes different limitations on movement patterns of the imaging sections depending on a characteristic of the samples.

    MICROPARTICLE DETECTION APPARATUS
    7.
    发明申请
    MICROPARTICLE DETECTION APPARATUS 审中-公开
    微波检测装置

    公开(公告)号:US20120162644A1

    公开(公告)日:2012-06-28

    申请号:US13336486

    申请日:2011-12-23

    IPC分类号: G01N21/47

    摘要: A microparticle detection apparatus is provided. The microparticle detection apparatus includes a light emitting optical element, a converging optical system disposed in an advancing direction of light emitted from the optical element to converge the light, a particle path located in an advancing direction of the light having passed through the converging optical system so that the particle path intersects the light, a beam blocking unit to block direct light having passed through the particle path, a condensing lens disposed at the rear of the beam blocking unit, and a detector disposed at the rear of the condensing lens to detect light scattered by particles. A focal point of light formed by the optical element and the converging optical system may be located at the rear of the particle path. A focal point of light irradiated to the particles may be different from the introduction position of the particles.

    摘要翻译: 提供了微粒检测装置。 微粒检测装置包括发光光学元件,会聚光学系统,其沿着从光学元件发射的光的行进方向配置以会聚光,位于沿着通过会聚光学系统的光的前进方向上的粒子路径 使得粒子路径与光相交,光束阻挡单元阻止通过粒子路径的直接光,设置在光束阻挡单元的后部的聚光透镜和设置在聚光透镜后部的检测器 微粒散射光。 由光学元件和会聚光学系统形成的光的焦点可以位于粒子路径的后部。 照射到颗粒的光的焦点可以不同于颗粒的引入位置。

    PARTICULATE MATTER DETECTOR AND METHOD FOR DETECTING PARTICULATE MATTER

    公开(公告)号:US20240210296A1

    公开(公告)日:2024-06-27

    申请号:US18573961

    申请日:2022-06-24

    申请人: ams-OSRAM AG

    摘要: A particulate matter detector includes a light emitter configured to emit light, a first, a second and a third waveguide, a waveguide splitter, a detector, and a controller. The third waveguide is free of cladding. The first waveguide is coupled to the light emitter and guides emitted light toward the waveguide splitter. The first waveguide includes an interrogation region formed by a cladding-free surface of the first waveguide. During a measurement phase, a first intensity of the light in the first waveguide is set for determining a change in the intensity of the light detected by the detector. An indication of an opacity of the surface of the first waveguide with accumulated particulate matter is output. During a cleaning phase, a second intensity of the light in the first waveguide is set for directing the accumulated particulate matter from the interrogation region to the third waveguide via optical forces.