Latch array with mask-write functionality

    公开(公告)号:US11810636B2

    公开(公告)日:2023-11-07

    申请号:US17574431

    申请日:2022-01-12

    CPC classification number: G11C7/1009 G11C7/1087

    Abstract: An aspect of the disclosure relates to a latch array, including: a first set of master latches including a first set of clock inputs configured to receive a master clock, a first set of data inputs configured to receive a first set of data, and a first set of data outputs coupled to a set of bitlines, respectively; a second set of master latches including a second set of clock inputs configured to receive the master clock, a first set of write-bit inputs configured to receive a set of write-bit signals, and a set of write-bit outputs coupled to a set of write-bit lines, respectively; and an array of slave latches, wherein the slave latches in columns of the array include a second set of data inputs coupled to the set of bitlines, and a second set of write-bit inputs coupled to the set of write-bit lines, respectively.

    True single phase clock (TSPC) based latch array

    公开(公告)号:US11695393B2

    公开(公告)日:2023-07-04

    申请号:US17162647

    申请日:2021-01-29

    CPC classification number: H03K3/037 H03K19/20 H04B1/40

    Abstract: A latch array including a row of master latches coupled to columns of slave latches. Each master latch includes an OR-AND-Inverter (OAI) gate cross-coupled with a NAND gate to receive and latch an input data, and each slave latch includes an AND-OR-Inverter (AOI) gate cross-coupled with a NOR gate to receive and latch the data from the master latch, and an inverter including an input coupled to the AOI gate and an output to produce an output data based on the input data. Alternatively, each master latch includes an AND-OR-Inverter (AOI) gate cross-coupled with a NOR gate to receive and latch an input data, and each slave latch includes an OR-AND-Inverter (OAI) gate cross-coupled with a NAND gate to receive and latch the data from the master latch, and an inverter including an input coupled to the OAI gate and an output to produce an output data.

    Back end of line (BEOL) process corner sensing

    公开(公告)号:US11823962B2

    公开(公告)日:2023-11-21

    申请号:US17180652

    申请日:2021-02-19

    CPC classification number: H01L22/14 G06F30/398 H01L22/34

    Abstract: Aspects of the disclosure are directed to sensing integrated circuit (IC) Back End Of Line (BEOL) process corners. In one aspect, an apparatus for sensing IC BEOL process corners includes a ring oscillator including a plurality of ring oscillator stages configured to generate an output waveform with a frequency state; and a shield net circuit including a plurality of shield net stages corresponding to the plurality of ring oscillator stages, the shield net circuit having a toggle input. And, a method includes generating an output waveform with a frequency state using a ring oscillator that includes a plurality of ring oscillator stages; modifying a plurality of ring oscillator stage time delays through a coupling between a plurality of shield net stages and the plurality of ring oscillator stages; and selecting the frequency state using a toggle input of a shield net circuit which includes the plurality of shield net stages.

    True random number generator based on period jitter

    公开(公告)号:US11334321B2

    公开(公告)日:2022-05-17

    申请号:US16913631

    申请日:2020-06-26

    Abstract: A true random number generator (TRNG) for generating a sequence of random numbers of bits is disclosed. The TRNG includes a TRNG cell configured to generate a sequence of bits logically alternating with a mean frequency and with substantially random period jitter; a period monitor configured to generate a first sequence of random bits based on a set of periods of the sequence of logically alternating bits; and a sampling circuit configured to sample the first sequence of random bits in response to a sampling clock to generate a second sequence of random bits.

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