Abstract:
A method includes, in a host that stores data in a storage device, detecting an event that is indicative, statistically and not deterministically, of an imminent power shutdown in the host. A notification is sent to the storage device responsively to the detected event, so as to cause the storage device to initiate preparatory action for the imminent power shutdown.
Abstract:
A device includes a memory and a read/write (R/W) unit. The memory includes multiple gates coupled to a common charge-trap layer. The R/W unit is configured to program and read the memory by creating and reading a set of electrically-charged regions in the common charge-trap layer, wherein at least a given region in the set is not uniquely associated with any single one of the gates.
Abstract:
A method includes, in a memory device, receiving a command that specifies a peak power consumption that is not to be exceeded by the memory device. A memory of the memory device is configured in accordance with the peak power consumption specified in the command. A data storage operation in the configured memory is performed, while complying with the specified peak power consumption.
Abstract:
A method includes, in a host that stores data in a storage device, detecting an event that is indicative, statistically and not deterministically, of an imminent power shutdown in the host. A notification is sent to the storage device responsively to the detected event, so as to cause the storage device to initiate preparatory action for the imminent power shutdown.
Abstract:
A method for data storage includes storing data in a group of analog memory cells by writing respective storage values into the memory cells in the group. One or more of the memory cells in the group are read using a first readout operation that senses the memory cells with a first sense time. At least one of the memory cells in the group is read using a second readout operation that senses the memory cells with a second sense time, longer than the first sense time. The data stored in the group of memory cells is reconstructed based on readout results of the first and second readout operations.
Abstract:
A method for data storage includes, for a memory including groups of memory cells, defining a normal mode and a protected mode, wherein in the protected mode a respective analog value of each memory cell remains at all times unambiguously indicative of a respective data value stored in that memory cell. Data is initially stored in the memory using the normal mode. In response to an event, the protected mode is reverted to for at least one of the groups of the memory cells.
Abstract:
A device includes a memory and a read/write (R/W) unit. The memory includes multiple gates coupled to a common charge-trap layer. The R/W unit is configured to program and read the memory by creating and reading a set of electrically-charged regions in the common charge-trap layer, wherein at least a given region in the set is not uniquely associated with any single one of the gates.
Abstract:
A storage device includes a non-volatile memory, a volatile memory and a controller. The volatile memory supports a normal mode and a self-refresh mode. The controller is configured to store data for a host in the non-volatile memory while using the volatile memory in the normal mode and, in response to receiving a power-down command from the host, to deactivate at least part of the storage device and to switch the volatile memory from the normal mode to the self-refresh mode.
Abstract:
A method includes, in a memory controller that controls a memory, evaluating an available memory space remaining in the memory to write data. A redundant storage configuration is selected in the memory controller depending on the available memory space. Redundancy information is calculated over the data using the selected redundant storage configuration. The data and the redundancy information are written to the available memory space in the memory.
Abstract:
A method includes defining a normal voltage configuration for application to word lines (WLs) and Bit lines (BLs) of a memory block, and a an abnormal voltage configuration, different from the normal voltage configuration, for application to the WLs and the BLs of the memory block when a word-line-to-word-line (WL-WL) short-circuit is found between at least two of the WLs in the memory block. If no WL-WL short-circuit is found in the memory block, a data storage operation is performed in the memory block by applying the normal voltage configuration. If a WL-WL short-circuit is found in the memory block, the data storage operation is performed in the memory block by applying the abnormal voltage configuration.