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    Spectrometer
    21.
    发明授权
    Spectrometer 有权

    公开(公告)号：US11841270B1

    公开(公告)日：2023-12-12

    申请号：US17824614

    申请日：2022-05-25

    Applicant: VisEra Technologies Company Ltd.

    Inventor： Lai-Hung Lai ,  Hsin-Yi Hsieh ,  Chin-Chuan Hsieh

    IPC: G02B6/42 ,  G01J3/28 ,  G02B27/30 ,  G01J3/18 ,  G01J3/02 ,  H01L27/146 ,  H10K39/32

    CPC classification number: G01J3/2823 ,  G01J3/0208 ,  G01J3/18 ,  G02B6/42 ,  G02B6/4215 ,  G02B27/30 ,  H01L27/14625 ,  H10K39/32

    Abstract: The spectrometer includes a lightguide substrate, an upper grating layer, a lower grating layer, an image sensor, and a readout circuit. The upper grating layer is disposed on the lightguide substrate and configured to receive a light. The upper grating layer includes a first grating structure, a second grating structure, and a third grating structure, and the first, second, and third grating structures have different grating periods. The lightguide substrate is configured to diffract the light when the light propagates into the lightguide substrate, such that multiple diffraction lights are formed and each of the multiple diffraction lights has different wavelengths and different optical path. The lower grating layer is disposed under the lightguide substrate and configured to emit the multiple diffraction lights. The image sensor is disposed under the lower grating layer. The readout circuit is disposed under the image sensor.

    APPARATUS AND METHOD FOR MULTIPLE SOURCE EXCITATION RAMAN SPECTROSCOPY
    23.
    发明公开
    APPARATUS AND METHOD FOR MULTIPLE SOURCE EXCITATION RAMAN SPECTROSCOPY 审中-公开

    公开(公告)号：US20230324303A1

    公开(公告)日：2023-10-12

    申请号：US17715862

    申请日：2022-04-07

    Applicant: Onto Innovation Inc.

    Inventor： George Andrew ANTONELLI

    IPC: G01N21/65 ,  G01J3/44 ,  G01J3/02 ,  G01J3/10 ,  G02B27/14 ,  G01J3/18

    CPC classification number: G01N21/65 ,  G01J3/4412 ,  G01J3/0208 ,  G01J3/10 ,  G02B27/141 ,  G01J3/0224 ,  G01J3/18

    Abstract: An optical metrology device performs multi-wavelength polarized confocal Raman spectroscopy. The optical metrology device uses a first light source to produce a first light beam with a first wavelength and a second light source to produce a second light beam with a second wavelength. A dichroic beam splitter partially reflects the first light beam and transmits the second light beam to combine the light beams along a same optical axis that is incident on a sample. The dichroic beam splitter directs the Raman response emitted from the sample in response to the first light beam and the second light beam together towards at least one spectrometer and directs the first light beam away from the at least one spectrometer. A chopper may be used to isolate the Raman response to the first and second light beams that is received and spectrally measured by the at least one spectrometer.

    Support structure and method for focus adjustment
    24.
    发明授权
    Support structure and method for focus adjustment 有权

    公开(公告)号：US11781909B2

    公开(公告)日：2023-10-10

    申请号：US17684603

    申请日：2022-03-02

    Applicant: THERMO ELECTRON SCIENTIFIC INSTRUMENTS LLC

    Inventor： Matthew Meyer ,  Francis Deck

    IPC: G01J3/02 ,  G01J3/18

    CPC classification number: G01J3/0202 ,  G01J3/021 ,  G01J3/0208 ,  G01J3/0237 ,  G01J3/18

    Abstract: An embodiment of a support structure for adjusting the position of a plurality of optical elements is described that comprises a base plate comprising a centering pin, a first translation slot, and a second translation slot; and a translatable plate configured to operatively couple with a plurality of the optical elements and move relative to the base plate, wherein the translatable plate comprises a centering slot configured to engage with the centering pin, a first cam configured to engage with the first translation slot and control movement of the translatable plate along a first axis, and a second cam configured to engage with the second translation slot and control movement of the translatable plate along a second axis.

    DYNAMIC JOINT DISTRIBUTION ALIGNMENT NETWORK-BASED BEARING FAULT DIAGNOSIS METHOD UNDER VARIABLE WORKING CONDITIONS
    25.
    发明公开
    DYNAMIC JOINT DISTRIBUTION ALIGNMENT NETWORK-BASED BEARING FAULT DIAGNOSIS METHOD UNDER VARIABLE WORKING CONDITIONS 审中-公开

    公开(公告)号：US20230314795A1

    公开(公告)日：2023-10-05

    申请号：US17760583

    申请日：2020-12-19

    Applicant: SOOCHOW UNIVERSITY

    Inventor： Jian BAO ,  Qiuyang SHEN ,  Xinhua CHEN ,  Weimin SHEN

    IPC: G02B27/00 ,  G01J3/14 ,  G01J3/18 ,  G01J3/28

    CPC classification number: G02B27/0012 ,  G01J3/14 ,  G01J3/18 ,  G01J3/2823 ,  G01J2003/1208

    Abstract: The invention discloses a design method of a wavenumber linearity dispersion optical system and an imaging spectrometer, including: building an optical system including a grating, a prism and an objective lens that are sequentially arranged, the grating adjoins the prism; defining a linearity evaluation coefficient RMS; assigning a minimum value to the linearity evaluation coefficient RMS through adjustment to the vertex angle of the prism, when the linearity evaluation coefficient RMS is at minimum, the vertex angle of the prism being α1; acquiring compensations for distortion and longitudinal chromatic aberration of the objective lens based on the interval between equal-difference wavenumbers on the image plane when the vertex angle of the prism is α1; and optimizing the objective lens based on the compensations for distortion and longitudinal chromatic aberration of the objective lens to obtain an optimized optical system. Higher wavenumber linearity can be achieved through objective-lens-aberration compensated wavenumber linearity.

    PULSED-LIGHT SPECTROSCOPIC DEVICE
    26.
    发明公开
    PULSED-LIGHT SPECTROSCOPIC DEVICE 审中-公开

    公开(公告)号：US20230314216A1

    公开(公告)日：2023-10-05

    申请号：US18022719

    申请日：2021-10-14

    Applicant: Ushio Denki Kabushiki Kaisha

    Inventor： Kazuki Shinoyama

    IPC: G01J3/10 ,  G02F1/365 ,  G01N21/359 ,  G01J3/18 ,  G01J3/02

    CPC classification number: G01J3/10 ,  G02F1/365 ,  G01N21/359 ,  G01J3/1895 ,  G01J3/0218 ,  G01N2201/06113

    Abstract: The pulse width of light from a pulsed light source 1 is stretched by a stretching element 2 such that an elapsed time and the wavelength of the light in the pulsed light correspond to each other on a one-to-one basis, and the stretched light radiates to an object S. The output of a light receiver 4 that has received light from the object S is digitized by an AD converter 6 and the digitized signal is supplied to a calculation means 5. A trigger signal generated by a trigger signal generator 7 in response to the rise of the pulsed light is delayed by a trigger delay section 74 and supplied to the AD converter 6 after the completion of a dead time T3.

    METHOD OF ANALYZING A SPECTRAL PEAK
    28.
    发明公开
    METHOD OF ANALYZING A SPECTRAL PEAK 审中-公开

    公开(公告)号：US20230194344A1

    公开(公告)日：2023-06-22

    申请号：US18064651

    申请日：2022-12-12

    Applicant: Thermo Fisher Scientific (Bremen) GmbH

    Inventor： Ning Ning Pan

    IPC: G01J3/28 ,  G01J3/18

    CPC classification number: G01J3/2803 ,  G01J3/1809 ,  G01J2003/284 ,  G01J2003/2859

    Abstract: Systems, devices, and methods of analyzing an interfered peak of a sample spectrum is disclosed. The sample spectrum may be generated using a detector of an optical spectrometer. The interfered peak may be produced by a plurality of spectral peaks of different wavelengths. The method may include generating interfered curve parameters representative of the peak shape of each spectral emission in the interfered peak based at least in part on a model of expected curve parameters for the optical spectrometer and a location of the interfered peak on the detector of the optical spectrometer; fitting a plurality of curves to the interfered peak, each curve corresponding to one of the plurality of spectral emissions of different wavelengths forming the interfered peak, wherein each curve is fitted using the interfered curve parameters provided by the model of expected peak parameters; and outputting the plurality of curves for further analysis.

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