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公开(公告)号:US20240344920A1
公开(公告)日:2024-10-17
申请号:US18685086
申请日:2022-08-22
申请人: AMGEN INC.
发明人: Al Patrick Goodwin , Joseph Peter Bermacki , Thomas Clark Pearson , Graham F. Milne , Jonathan Parsons , Corey Bishop , Barry Donohoe , Osvaldo Perez-Varela
CPC分类号: G01M3/38 , G01B11/2522 , G01N21/909 , G01N2201/0612
摘要: An apparatus, system, or method for vial seal inspection may be based on three-dimensional data that is representative of at least a portion of a vial seal. More particularly, apparatuses, systems, and methods for vial seal inspection may include at least one laser triangulation sensor.
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公开(公告)号:US20240311992A1
公开(公告)日:2024-09-19
申请号:US18606756
申请日:2024-03-15
申请人: KRONES AG
发明人: Anton NIEDERMEIER , Thomas BOCK , Stefan POESCHL
CPC分类号: G06T7/0004 , B65D51/24 , G01M3/38 , G06T7/40 , G06T7/73
摘要: Disclosed is a method for inspecting containers provided with closures for checking a sealing function between the closure and a container provided therewith in order to check the sealing function, the at least one spatially resolved image is recorded by the at least one image recording device in such a way that, viewed in the closure direction, a relative position of the closure with respect to the container provided therewith is depicted, and an image evaluation device determines, on the basis of the relative position depicted in the at least one spatially resolved image, at least one sealing variable that is characteristic of performing the sealing function.
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公开(公告)号:US20240248003A1
公开(公告)日:2024-07-25
申请号:US18626799
申请日:2024-04-04
发明人: Craig COLLINS , Jesus ELIZONDO , Pedro BUHIGAS
CPC分类号: G01M15/108 , G01M3/38 , G07C3/143
摘要: An exemplary embodiment may include a control hub configured to receive data from an emissions analyzer and a leak detection camera. The emissions analyzer may detect levels of various gases and relay such information to the control hub. In an exemplary embodiment, the emissions analyzer may purge after every test to ensure longevity and accuracy. A leak detection camera may implement quantifying optical gas imaging in order to continuously monitor for fugitive leaks on a compressor package. If a leak is detected, it may be logged and the user or an operating group may be alerted.
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公开(公告)号:US12044600B2
公开(公告)日:2024-07-23
申请号:US17297857
申请日:2019-09-09
申请人: Konica Minolta, Inc.
发明人: Motohiro Asano , Takashi Morimoto
CPC分类号: G01M3/04 , G01J5/00 , G01J5/0014 , G01M3/16 , G01M3/18 , G01M3/38 , G01J2005/0077 , G06T7/20
摘要: A gas flow rate estimation device includes a first calculation unit that calculates, by using an average movement vector of a gas region included in an image, a gas passage time for leaked gas to pass through the gas region, a second calculation unit that calculates a gas volume in the gas region by using a gas concentration thickness product of the gas region, and a third calculation unit that calculates an estimated value of a flow rate of the gas by using the gas passage time and the gas volume.
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公开(公告)号:US12031871B2
公开(公告)日:2024-07-09
申请号:US17647190
申请日:2022-01-06
申请人: SAAB AB
发明人: Roy Josefsson , Daniel Eckerstroem
CPC分类号: G01K11/3206 , G01D3/10 , G01D5/35316 , G01D5/35387 , G01D5/3539 , G01K11/32 , G01L1/246 , G01M3/002 , G01M3/38
摘要: A method is provided for determining temperature changes of an optical fibre having Fiber Bragg Grating patterns provided in at least one portion of the optical fibre. The method involves: emitting light into the optical fibre in a first direction from a first detector arrangement, receiving reflections from the patterns of such emitted light by the first detector arrangement, and processing the reflections for determining a current temperature change related to the optical fibre; and on the basis of predetermined criteria, emitting light into the optical fibre in an opposite, second, direction from a second detector arrangement, receiving reflections from the patterns of such emitted light by the second detector arrangement, and processing the reflections for determining a current temperature change related to the optical fibre. A computer program product comprising program code for implementing the above-described method is also provided, along with an associated system and platform.
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公开(公告)号:US20240186162A1
公开(公告)日:2024-06-06
申请号:US18444299
申请日:2024-02-16
IPC分类号: H01L21/67 , G01M3/38 , H01L21/677
CPC分类号: H01L21/67265 , G01M3/38 , H01L21/67259 , H01L21/67288 , H01L21/67772
摘要: An apparatus for inspecting wafer carriers is disclosed. In one example, the apparatus includes: a housing; a load port; a robot arm inside the housing; and a processor. The load port is configured to load a wafer carrier into the housing. The robot arm is configured to move a first camera connected to the robot arm. The first camera is configured to capture a plurality of images of the wafer carrier. The processor is configured to process the plurality of images to inspect the wafer carrier.
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公开(公告)号:US11971329B2
公开(公告)日:2024-04-30
申请号:US17538717
申请日:2021-11-30
发明人: Brandon S. Good , Bijan Chitsaz , Guanghua Wang , Bernard P. Bewlay , Gyeong Woo Cheon , Alberto Santamaria-Pang
CPC分类号: G01M3/38 , F02C7/00 , G01J5/0003 , G06T7/0002 , G06T7/90 , G08B21/182 , H04N23/90 , F05D2260/80 , G01J2005/0077 , G06T2207/10048 , G06T2207/20084
摘要: Methods, apparatus, systems, and articles of manufacture are disclosed to autonomously detect thermal anomalies. Disclosed examples include an example apparatus to detect engine anomalies comprising: at least one memory; instructions in the apparatus; and processor circuitry to execute the instructions to: control a plurality of infrared cameras to capture a baseline image set, the baseline image set including at least two thermal images; generate emissivity data based on the baseline image set; provide the baseline image set and the emissivity data to an artificial intelligence model, the artificial intelligence model to generate a reconstructed image set; determine a difference between the baseline image set and the reconstructed image set; and in response to the difference exceeding a threshold, generate an alert indicating detection of an engine anomaly.
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公开(公告)号:US11933685B2
公开(公告)日:2024-03-19
申请号:US17407659
申请日:2021-08-20
发明人: Shubham Kumar , Vikas Pandey , Graig E. DeCarr
IPC分类号: G01L1/24 , G01K11/3206 , G01M3/38 , G08B21/18
CPC分类号: G01L1/246 , G01K11/3206 , G01M3/38 , G08B21/182
摘要: A method of monitoring corrosion of an electrical enclosure in a hazardous environment is provided. The method is implemented with at least one computing device in communication with at least one FBG optical sensor reflecting UV light in the electrical enclosure. The method includes measuring wavelength changes of UV light reflected by the at least one sensor, wherein the wavelength changes are a function of corrosion-related strain in the electrical enclosure. The method also includes computing, by the at least one computing device, the corrosion-related strain in the electrical enclosure based on the measured wavelength changes. The method further includes comparing, by the at least one computing device, the computed corrosion-related strain with a predetermined threshold, and recommending preventive corrosion-related maintenance based on the comparison.
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公开(公告)号:US11929271B2
公开(公告)日:2024-03-12
申请号:US16927089
申请日:2020-07-13
IPC分类号: H01L21/67 , G01M3/38 , H01L21/677
CPC分类号: H01L21/67265 , G01M3/38 , H01L21/67259 , H01L21/67288 , H01L21/67772
摘要: An apparatus for inspecting wafer carriers is disclosed. In one example, the apparatus includes: a housing; a load port; a robot arm inside the housing; and a processor. The load port is configured to load a wafer carrier into the housing. The robot arm is configured to move a first camera connected to the robot arm. The first camera is configured to capture a plurality of images of the wafer carrier. The processor is configured to process the plurality of images to inspect the wafer carrier.
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公开(公告)号:US20240024068A1
公开(公告)日:2024-01-25
申请号:US18457461
申请日:2023-08-29
申请人: Medivators Inc.
发明人: Mark Jackson , Joshua J. Korth
IPC分类号: A61B90/70 , B08B9/032 , G01M3/28 , G01M3/38 , G01N21/88 , G01N21/954 , G06F3/0488 , H04N7/18 , H04N23/66 , H04N23/69
CPC分类号: A61B90/70 , B08B9/032 , G01M3/2815 , G01M3/38 , G01N21/8851 , G01N21/954 , G06F3/0488 , H04N7/183 , H04N23/66 , H04N23/69 , A61B2090/701 , A61B2090/702 , B08B2209/032 , H04N23/555
摘要: Embodiments of a system and method for endoscope cleaning and inspection are disclosed. In an example, an endoscope cleaning and inspection unit includes cleaning and testing capabilities operated via control equipment and a display screen, to operate leak testing equipment, flush control equipment, and optical inspection equipment for leak testing, flushing, rinsing, and inspection of an endoscope interior chamber (lumen) and exterior surfaces. In a further example, the endoscope cleaning and inspection unit may further operate and receive information from a borescope imaging device or a magnification imaging device, using an imaging sensor to capture images of an endoscope lumen or surface respectively, as captured or output on the display screen. Further embodiments provide for control, monitoring, data collection, data input, and data output with such imaging devices via the endoscope cleaning and inspection.
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