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    METHOD OF ANALYZING A SPECTRAL PEAK
    1.
    发明公开
    METHOD OF ANALYZING A SPECTRAL PEAK 审中-公开

    公开(公告)号：US20230194344A1

    公开(公告)日：2023-06-22

    申请号：US18064651

    申请日：2022-12-12

    Applicant: Thermo Fisher Scientific (Bremen) GmbH

    Inventor： Ning Ning Pan

    IPC: G01J3/28 ,  G01J3/18

    CPC classification number: G01J3/2803 ,  G01J3/1809 ,  G01J2003/284 ,  G01J2003/2859

    Abstract: Systems, devices, and methods of analyzing an interfered peak of a sample spectrum is disclosed. The sample spectrum may be generated using a detector of an optical spectrometer. The interfered peak may be produced by a plurality of spectral peaks of different wavelengths. The method may include generating interfered curve parameters representative of the peak shape of each spectral emission in the interfered peak based at least in part on a model of expected curve parameters for the optical spectrometer and a location of the interfered peak on the detector of the optical spectrometer; fitting a plurality of curves to the interfered peak, each curve corresponding to one of the plurality of spectral emissions of different wavelengths forming the interfered peak, wherein each curve is fitted using the interfered curve parameters provided by the model of expected peak parameters; and outputting the plurality of curves for further analysis.

    IMAGING SPECTROMETER WITH REFLECTIVE GRATING
    2.
    发明申请
    IMAGING SPECTROMETER WITH REFLECTIVE GRATING 审中-公开

    公开(公告)号：US20180094977A1

    公开(公告)日：2018-04-05

    申请号：US15718475

    申请日：2017-09-28

    Applicant: European Space Agency

    Inventor： Matteo Taccola

    IPC: G01J3/26 ,  G02B17/06 ,  G02B5/18 ,  G01J3/18 ,  G01J3/28

    CPC classification number: G01J3/26 ,  G01J3/021 ,  G01J3/0291 ,  G01J3/18 ,  G01J3/1809 ,  G01J3/2823 ,  G01J2003/262 ,  G02B5/1861 ,  G02B17/061 ,  G02B17/0615

    Abstract: An imaging spectrometer receives a beam of light from a slit and outputs the beam of light to a focal plane. The output beam of light at the focal plane is dispersed in accordance with a spectral composition of the beam of light received from the slit. The imaging spectrometer comprises first to fourth curved reflective portions. The first to fourth curved reflective portions are arranged so that the beam of light, in its passage from the slit to the focal plane, sequentially strikes the first to fourth curved reflective portions and is reflected by the first to fourth curved reflective portions. Further, the first to fourth curved reflective portions are alternatingly concave or convex, respectively, along the passage of the beam of light. At least one of the first to fourth curved reflective portions has a reflective grating structure. Further disclosed is a method of manufacturing such imaging spectrometer.

    Echelle grating multi-order imaging spectrometer utilizing a catadioptric lens
    5.
    发明授权
    Echelle grating multi-order imaging spectrometer utilizing a catadioptric lens 有权
    Echelle光栅多阶成像光谱仪利用反折射透镜

    公开(公告)号：US08736836B2

    公开(公告)日：2014-05-27

    申请号：US13086233

    申请日：2011-04-13

    Applicant: Michael P. Chrisp ,  Joel M. Bowers

    Inventor： Michael P. Chrisp ,  Joel M. Bowers

    IPC: G01J3/02 ,  G01J3/18

    CPC classification number: G01J3/0208 ,  G01J3/0256 ,  G01J3/0286 ,  G01J3/1809

    Abstract: A cryogenically cooled imaging spectrometer that includes a spectrometer housing having a first side and a second side opposite the first side. An entrance slit is on the first side of the spectrometer housing and directs light to a cross-disperser grating. An echelle immersions grating and a catadioptric lens are positioned in the housing to receive the light. A cryogenically cooled detector is located in the housing on the second side of the spectrometer housing. Light from the entrance slit is directed to the cross-disperser grating. The light is directed from the cross-disperser grating to the echelle immersions grating. The light is directed from the echelle immersions grating to the cryogenically cooled detector on the second side of the spectrometer housing.

    Abstract translation: 一种低温冷却成像光谱仪，其包括具有第一侧和与第一侧相对的第二侧的光谱仪外壳。 入口狭缝位于光谱仪外壳的第一侧，并将光引导到交叉分散光栅。 折叠式沉没光栅和反射折射透镜位于外壳中以接收光。 低温冷却检测器位于光谱仪外壳第二侧的外壳内。 来自入口狭缝的光被引导到交叉分散光栅。 光从交叉分散器光栅引导到梯子沉浸光栅。 灯从梯子沉浸光栅引导到光谱仪外壳第二侧的低温冷却检测器。

    Spectrometer assembly
    6.
    发明授权
    Spectrometer assembly 有权
    光谱仪组装

    公开(公告)号：US08102527B2

    公开(公告)日：2012-01-24

    申请号：US12665665

    申请日：2008-05-09

    Applicant: Helmut Becker-Ross ,  Michael Okruss ,  Stefan Florek

    Inventor： Helmut Becker-Ross ,  Michael Okruss ,  Stefan Florek

    IPC: G01J3/28

    CPC classification number: G01J3/22 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/08 ,  G01J3/1809 ,  G01J3/2823 ,  G01J3/32

    Abstract: The invention relates to a spectrometer arrangement (10) having a spectrometer for producing a spectrum of radiation from a radiation source on a detector (34), comprising an optical imaging Littrow arrangement (18, 20) for imaging the radiation entering the spectrometer arrangement (16) in an image plane, a first dispersion arrangement (28, 30) for the spectral decomposition of a first wavelength range of the radiation entering the spectrometer arrangement, a second dispersion arrangement (58, 60) for the spectral decomposition of a second wavelength range of the radiation entering the spectrometer arrangement, and a common detector (34) arranged in the image plane of the imagine optics, characterized in that the imaging optical arrangement (18, 20) comprises an element (20) that can be moved between two positions (20, 50), wherein the radiation entering the spectrometer arrangement in the first position is guided via the first dispersion arrangement and in the second position via the second dispersion arrangement.

    Abstract translation: 本发明涉及一种具有用于在检测器（34）上产生来自辐射源的辐射光谱的光谱仪的光谱仪装置（10），该光谱仪包括用于对进入光谱仪装置的辐射进行成像的光学成像Littrow布置（18,20） 16），用于对进入光谱仪装置的辐射的第一波长范围进行光谱分解的第一色散装置（28,30），用于第二波长的光谱分解的第二色散装置（58,60） 进入光谱仪布置的辐射的范围以及布置在想象光学器件的图像平面中的公共检测器（34），其特征在于，成像光学装置（18,20）包括可在两者之间移动的元件（20） 位置（20,50），其中在第一位置进入分光计装置的辐射经由第一分散装置被引导，并且经由 第二分散布置。

    THREE MIRROR ANASTIGMAT SPECTROGRAPH
    7.
    发明申请
    THREE MIRROR ANASTIGMAT SPECTROGRAPH 有权
    三个镜子评估光谱

    公开(公告)号：US20090091753A1

    公开(公告)日：2009-04-09

    申请号：US12246232

    申请日：2008-10-06

    Applicant: BURT JAY BEARDSLEY ,  WENDY LYNN BEARDSLEY

    Inventor： BURT JAY BEARDSLEY ,  WENDY LYNN BEARDSLEY

    IPC: G01J3/18

    CPC classification number: G01J3/1809 ,  G01J3/02 ,  G01J3/0208 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0262 ,  G01J3/027 ,  G01J3/0291 ,  G01J3/443

    Abstract: A spectrograph including a primary mirror, a secondary mirror, and a tertiary mirror forming a TMA having a common vertex axis. The spectrograph also may include a collimating mirror, a diffraction grating, and a dispersive prism. The collimating mirror and an entrance aperture form an interchangeable module. Radiation received through the entrance aperture is reflected in a collimated pattern towards an aperture stop. The diffraction grating, located between the collimating mirror and prism, diffracts radiation passed through the aperture stop into multiple beams directed onto the prism. A flat mirror, located to one side of the vertex axis. receives and reflects the multiple beams exiting the prism onto the primary mirror, where they are reflected onto the secondary mirror. The secondary mirror reflects the beams to the tertiary mirror where they are reflected onto an image plane located on the other side of the vertex axis.

    Abstract translation: 包括主镜，次镜和形成具有共同顶点轴的TMA的第三镜的光谱仪。 光谱仪还可以包括准直镜，衍射光栅和分散棱镜。 准直镜和入口孔形成可互换的模块。 通过入射孔收到的辐射以朝向孔径光阑的准直图案反射。 位于准直镜和棱镜之间的衍射光栅将通过孔径光阑的辐射衍射成多个指向棱镜的光束。 平面镜，位于顶点轴的一侧。 接收和反射离开棱镜的多个光束到主镜上，在那里它们被反射到次镜上。 次级反射镜将光束反射到第三级反射镜，它们被反射到位于顶点轴线另一侧的图像平面上。

    Apparatus for automated real-time material identification
    10.
    发明申请
    Apparatus for automated real-time material identification 审中-公开
    自动实时材料识别装置

    公开(公告)号：US20060262304A1

    公开(公告)日：2006-11-23

    申请号：US11409857

    申请日：2006-04-24

    Applicant: Keith Carron

    Inventor： Keith Carron

    IPC: G01J3/28

    CPC classification number: G01J3/42 ,  G01J3/02 ,  G01J3/021 ,  G01J3/0229 ,  G01J3/0264 ,  G01J3/0294 ,  G01J3/1809 ,  G01J3/44 ,  G01J2001/4242

    Abstract: An apparatus is described for the real-time identification of one or more selected components of a target material. In one embodiment, an infrared spectrometer and a separate Raman spectrometer are coupled to exchange respective spectral information of the target material preferably normalized and presented in a single graph. In an alternative embodiment, both an infrared spectrometer and a Raman spectrometer are included in a single instrument and a common infrared light source is used by both spectrometers. In another embodiment, a vibrational spectrometer and a stoichiometric spectrometer are combined in a single instrument and are coupled to exchange respective spectral information of the target material and to compare the spectral information against a library of spectra to generate a real-time signal if a selected component is present in the target material.

    Abstract translation: 描述了用于实时识别目标材料的一个或多个选定部件的装置。 在一个实施例中，红外光谱仪和单独的拉曼光谱仪被耦合以交换目标材料的各个光谱信息，优选地被归一化并呈现在单个图中。 在替代实施例中，红外光谱仪和拉曼光谱仪均包括在单个仪器中，并且两个光谱仪都使用通用的红外光源。 在另一个实施例中，将振动光谱仪和化学计量光谱仪组合在单个仪器中，并耦合以交换目标材料的相应光谱信息，并将光谱信息与光谱库进行比较以产生实时信号，如果选定 组分存在于目标材料中。

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