AUTO-FOCUS SPECTROMETER
    3.
    发明申请

    公开(公告)号:US20250027812A1

    公开(公告)日:2025-01-23

    申请号:US18754612

    申请日:2024-06-26

    Abstract: The present disclosure provides an auto-focus spectrometer, including: a grating element configured to split light; an imaging element configured to converge a light beam; a controller configured to move the imaging element to realize autofocus, and connected to the imaging element; and a detector; and an incident light is diffracted through the grating to the imaging element, and then converged to the detector through the imaging element to obtain spectrogram information. The present disclosure automatically adjusts the imaging element position according to the configuration and operation state of the spectrometer, so that the spectrometer can be automatically kept at an optimal imaging position and exert the best performance thereof.

    Easily adjustable optical emission spectrometer

    公开(公告)号:US12130178B2

    公开(公告)日:2024-10-29

    申请号:US17774405

    申请日:2020-11-04

    CPC classification number: G01J3/0286 G01J3/0291 G01J3/18 G01J3/36

    Abstract: The invention relates to an optical emission spectrometer (1) being easily adjustable, and to a method (100) to set-up and operate such a spectrometer (1) comprising a plasma stand (2) to establish a light emitting plasma from sample material, and an optical system (3) to measure the spectrum of the light (L) emitted by the plasma being characteristic to the sample material, where the optical system (3) comprises at least one light entrance aperture (31), at least one diffraction grating (32) to split up the light (L) coming from the plasma (A) and one or more detectors (33) to measure the spectrum of the light (L), wherein the plasma stand (2) and the optical system (3) are directly and fixedly mounted on respective a plasma stand flange (2B) and an optical system flange (3B) which are directly and fixedly connected to each other and wherein the optical emission spectrometer (1) further comprises an analyzing unit (34) adapted to analyze the measured spectrum and to compensate for a drift of the spectrum relative to the detector (33) potentially caused by heat transferred from the plasma stand (2) to the optical system (3) considering the thermal expansion of the optical system (3).

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