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公开(公告)号：US12130178B2
公开(公告)日：2024-10-29
申请号：US17774405
申请日：2020-11-04
发明人： André Peters , Rainer Simons
CPC分类号： G01J3/0286 , G01J3/0291 , G01J3/18 , G01J3/36
摘要： The invention relates to an optical emission spectrometer (1) being easily adjustable, and to a method (100) to set-up and operate such a spectrometer (1) comprising a plasma stand (2) to establish a light emitting plasma from sample material, and an optical system (3) to measure the spectrum of the light (L) emitted by the plasma being characteristic to the sample material, where the optical system (3) comprises at least one light entrance aperture (31), at least one diffraction grating (32) to split up the light (L) coming from the plasma (A) and one or more detectors (33) to measure the spectrum of the light (L), wherein the plasma stand (2) and the optical system (3) are directly and fixedly mounted on respective a plasma stand flange (2B) and an optical system flange (3B) which are directly and fixedly connected to each other and wherein the optical emission spectrometer (1) further comprises an analyzing unit (34) adapted to analyze the measured spectrum and to compensate for a drift of the spectrum relative to the detector (33) potentially caused by heat transferred from the plasma stand (2) to the optical system (3) considering the thermal expansion of the optical system (3).
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公开(公告)号：US12085447B2
公开(公告)日：2024-09-10
申请号：US17939334
申请日：2022-09-07
发明人： Jae Hwan Lee , Young Soo Chung , Hyung Bin Son , Se Kyu Shim , Jung Taek Hong
CPC分类号： G01J3/4412 , G01J3/0208 , G01J3/18 , G01N21/65
摘要： A spectroscopy system that includes a light source that generates light having a plurality of wavelengths, a light transmitter that transmits the light to a target analyte, a light receiver that receives Raman-scattered light scattered from the target analyte, and a multi-wavelength spectroscopy assembly that acquires a spectrum by splitting the Raman-scattered light transmitted from the light receiver. The multi-wavelength spectroscopy assembly includes a single diffraction grating configured to diffract the Raman-scattered light and a single concave mirror configured to focus the Raman-scattered light.
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公开(公告)号：US12085445B2
公开(公告)日：2024-09-10
申请号：US17603487
申请日：2020-04-03
IPC分类号： G01J3/18 , G01B9/02091 , G01J3/02 , G01J3/12
CPC分类号： G01J3/18 , G01B9/02091 , G01J3/0208 , G01J2003/1208
摘要： A detector system for Fourier spectroscopy such as a spectral domain optical coherence tomography instrument includes a diffractive optic for diffracting the interfering light into angularly dispersed wavenumbers, a prism for reduces a nonlinear angular dispersion among the wavenumbers, and a focusing optic for converting the angularly dispersed wavenumbers from the prism into spatially distributed wavenumbers along a detector having an array of pixels. A field lens between the focusing optic and the detector has a freeform surface for more evenly distributing the wavenumbers along the array of pixels.
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公开(公告)号：US20240271999A1
公开(公告)日：2024-08-15
申请号：US18586536
申请日：2024-02-25
申请人： Tsubasa SAITO
发明人： Tsubasa SAITO
CPC分类号： G01J3/26 , G01J3/0208 , G01J3/021 , G01J3/0216 , G01J3/0237 , G01J3/0291 , G01J3/1804 , G01J3/2823 , G01J3/4535 , G01J2003/2843
摘要： The present invention includes: a light supply part; an interfering light formation part; and a detection part, in which the interfering light formation part includes a fixed reflection part, a movable reflection part, and a moving part that moves and fixes the movable reflection part along a base plane, the fixed reflection part includes a first reflection surface that reflects supplied light supplied from the light supply part and a second reflection surface provided so as to be plane-symmetrical with the first reflection surface with respect to the base plane and to be orthogonal to the first reflection surface, and the movable reflection part includes a third reflection surface and a fourth reflection surface parallel to a first reflection surface and a second reflection surface of the fixed reflection part, respectively.
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公开(公告)号：US12025561B2
公开(公告)日：2024-07-02
申请号：US17604006
申请日：2020-04-15
发明人： Heather Allen , Juan Velez
CPC分类号： G01N21/65 , G01J3/18 , G01J3/2823 , G01J3/4412 , G01N2201/06113 , G01N2201/1296
摘要： A hand-held sized imaging instrument identifies molecules with high selectivity and in complex mixtures. The instrument uses inelastic scattering and scattering intensities from with machine learning algorithms based on convolutional neural networks (CNN's) to identify the presence of a specified chemical or combination of chemicals. A laser is housed within the instrument to initiate a material response of a sample using laser light of a specified wavelength. The instrument uses an image sensor to capture visible images with inelastic scattering information. The CNN is able to classify the image to determine whether the specified chemical or combination of chemicals is present in the sample. The instrument is inexpensive, portable, easy to use by anyone (nonchemist, nonprofessional), and safe (laser is completely housed). The instrument can be used efficiently and easily for quality control, security, and other applications to reliably detect the presence of specified substances.
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公开(公告)号：US11976971B2
公开(公告)日：2024-05-07
申请号：US17272667
申请日：2019-09-04
发明人： Will Johnson
CPC分类号： G01J3/0221 , G01J3/18 , G01J3/2803 , G01S17/95 , G02B6/0008 , G01J2003/2813
摘要： Spectrographic measurements are often limited by the amount of light that is available. Photons that are not collected or measured reduce the signal to noise and therefore reduce measurement precision. This invention collects the zero order light and sends it through the spectrometer again. In an atmospheric LIDAR, the zero order recycling is estimated to increase the rotational Raman signal by an additional 20%. A grating based spectrometer where the zero order light is collected by a lens or mirror and focused into a fiber optic that sends the light to the input slit where it is directed into the spectrometer again. There can be a plurality of recycle fibers. The detector can be either a single linear array or a two dimensional array such as a CCD or CMOS camera.
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公开(公告)号：US20240133739A1
公开(公告)日：2024-04-25
申请号：US18319615
申请日：2023-05-17
CPC分类号： G01J3/44 , G01J3/0208 , G01J3/1838 , G01J3/2803 , G01N21/03 , G01J2003/1861
摘要： Apparatuses, systems, and methods for Raman spectroscopy are described. In certain implementations, a spectrometer is provided. The spectrometer may include a plurality of optical elements, comprising an entrance aperture, a collimating element, a volume phase holographic grating, a focusing element, and a detector array. The plurality of optical elements are configured to transfer the light beam from the entrance aperture to the detector array with a high transfer efficiency over a preselected spectral band.
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公开(公告)号：US20240102859A1
公开(公告)日：2024-03-28
申请号：US18010430
申请日：2022-09-07
发明人： Ki Hun Jeong , Jung Woo Park , Jae Hun Jeon , Gi Beom Kim
CPC分类号： G01J3/0259 , G01J3/0208 , G01J3/021 , G01J3/04 , G01J3/18 , G01J3/2803
摘要： The disclosure relates to an ultrathin micro-spectrometer and a method of manufacturing the same, and more particularly, relates to an ultrathin micro-spectrometer including: a lens portion including: a convex lens; and a back-reflection grating layer which is formed on a rear surface of the convex lens and on the same surface of which a reflective diffraction grating and a first planar reflector are arranged; a substrate layer which is disposed to be spaced apart from the lens portion and on which a light incidence microslit is formed; a second planar reflector which is formed on the substrate layer; and a complementary metal-oxide-semiconductor (CMOS) sensor on which light reflected by the lens portion is focused, and a method of manufacturing the same.
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公开(公告)号：US11933735B2
公开(公告)日：2024-03-19
申请号：US17440896
申请日：2020-03-25
申请人： OSAKA UNIVERSITY
发明人： Tsuyoshi Konishi
CPC分类号： G01N21/8806 , G01J3/18 , G01J3/42 , G01N21/31 , G01N2021/8845 , G01N2021/8854
摘要： An optical detection device is an optical detection device that detects a desired wavelength component included in input light, and includes: a spectrometer including, for instance, a diffraction grating that receives the input light as an input and outputs an alignment of spectra each of which is a duplication of a spectrum of the input light; a second slit array including an array of three or more slits that pass light beams of wavelengths at three or more locations in the alignment of the spectra that are output from the spectrometer; and an imaging element composed of an array of pixels that receive the light beams, having passed through the second slit array, each of the light beams having three or more wavelength components. At least two pitches between slits are different in the array of the three or more slits included in the second slit array.
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10.发明公开公开(公告)号：US20240068870A1
公开(公告)日：2024-02-29
申请号：US18272256
申请日：2022-01-11
申请人： Konica Minolta, Inc.
发明人： Takashi KAWASAKI
CPC分类号： G01J3/2823 , G01J3/18
摘要： A wavelength of incident light is measured based on signals from a plurality of pixels of a photoelectric conversion element that are arranged in a dispersion direction in which the incident light is dispersed by a spectroscopic section. In correction of a shift in wavelength, a measured amount of shift in wavelength that is a difference between a measured value obtained when an emission line wavelength of incident light from a light source for wavelength shift correction that emits light including an emission line at least one wavelength in a range of wavelengths into which light can be dispersed by the spectroscopic section is measured and an original emission line wavelength is calculated. A reference amount of shift in emission line wavelength is calculated by a polynomial in which a characteristic of a wavelength shift that occurs is represented by a linear or higher polynomial with a variable indicating the wavelength or a parameter relating to the wavelength. Each coefficient of the polynomial is determined based on the calculated measured amount of shift in emission line wavelength and the reference amount of shift in emission line wavelength, and the wavelength of the incident light is corrected based on the determined polynomial.
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