公开(公告)号：US20250027812A1

公开(公告)日：2025-01-23

申请号：US18754612

申请日：2024-06-26

Applicant: ZOLIX INSTRUMENTS Co., Ltd. ,  Zolix Analytical Instruments Co., Ltd.

Inventor： Fei Tong ,  Wenjuan Peng ,  Zemin Lei ,  Suxia Zhang ,  Tianyun Tang

IPC: G01J3/02 ,  G01J3/18 ,  G01J3/28

Abstract: The present disclosure provides an auto-focus spectrometer, including: a grating element configured to split light; an imaging element configured to converge a light beam; a controller configured to move the imaging element to realize autofocus, and connected to the imaging element; and a detector; and an incident light is diffracted through the grating to the imaging element, and then converged to the detector through the imaging element to obtain spectrogram information. The present disclosure automatically adjusts the imaging element position according to the configuration and operation state of the spectrometer, so that the spectrometer can be automatically kept at an optimal imaging position and exert the best performance thereof.

公开(公告)号：US20250085164A1

公开(公告)日：2025-03-13

申请号：US18773672

申请日：2024-07-16

Applicant: ZOLIX INSTRUMENTS Co., Ltd. ,  Zolix Analytical Instruments Co., Ltd.

Inventor： Zemin Lei ,  Fei Tong ,  Suxia Zhang ,  Haixia Chen

IPC: G01J3/02 ,  G01J3/18 ,  G01J3/28

Abstract: A wavelength calibration method for a grating spectrometer is provided, including: moving a plurality of characteristic peaks of a calibration light source to a central position of a detector of the spectrometer respectively, and determining a functional relationship between a grating rotation angle of the rotatable grating and a central wavelength; and determining parameters γ, f, a, b, c in the following physical model, the physical model being used to calculate a corresponding wavelength at each pixel within an imaging range of the detector when the central wavelength is determined, λ ′ = sin ⁢ ( Ψ - γ 2 ) + sin ⁢ ( Ψ + γ 2 + arctan ⁢ ( a ⁡ ( n ⁢ x ) 2 + b ⁡ ( n ⁢ x ) + c f ) ) 1 ⁢ 0 - 6 · m · N wherein Ψ is the grating rotation angle corresponding to the central wavelength as determined via the functional relationship, γ is built-in angle of the spectrometer, f is a focal distance of the spectrometer, m is grating diffraction order, N is the number of grating rulings (unit: line/mm), nx is a distance between a corresponding pixel and a central pixel.