CONCENTRATION MEASUREMENT DEVICE
    2.
    发明公开

    公开(公告)号:US20240337587A1

    公开(公告)日:2024-10-10

    申请号:US18572800

    申请日:2022-02-08

    IPC分类号: G01N21/05 G01N21/03 G01N21/59

    摘要: A concentration measurement device includes: a light source that emits light; a first optical system that is provided on an optical path of the light emitted from the light source and condenses the light emitted from the light source; a light-transmissive tubular body that is disposed at a position on a rear stage side with respect to a focal position of the first optical system on the optical path and collimates the light incident on a side surface in a state where a fluid flows inside; and a detection unit that detects light through the tubular body.

    Test device
    3.
    发明授权

    公开(公告)号:US12111314B2

    公开(公告)日:2024-10-08

    申请号:US17720774

    申请日:2022-04-14

    摘要: A test device includes a specimen having a circular cross section that accommodates a test target, a specimen holding part that holds a plurality of the specimens in a row, light emitting elements in which light is incident on two adjacent specimens among the plurality of specimens, a first light guide path 46 that guides light emitted by the light emitting elements, and a second light guide path that is formed to have a smaller diameter than a diameter of the first light guide path and that guides the light emitted by the light emitting elements from the first light guide path to the specimen.

    Systems and methods of characterizing semiconductor materials

    公开(公告)号:US12085516B2

    公开(公告)日:2024-09-10

    申请号:US17781020

    申请日:2020-12-04

    摘要: Systems and methods for non-contact characterization of semiconductor devices. Systems may include: an infrared radiation source directing radiation towards the semiconductor device; a radiation directing device positioned proximal the infrared radiation source to direct radiation towards an opposing side of the semiconductor device, the semiconductor device receivable between the radiation directing device and the infrared radiation source; and a radiation detector proximal to the infrared radiation source to sense radiation associated with a plurality of infrared wavebands from the semiconductor device for determining a dopant profile property of the semiconductor device. The sensed radiation may include radiation originating from the infrared radiation source reflected from the semiconductor device. The sensed radiation may include radiation originating from the radiation directing device and emerging from the semiconductor device. The dopant profile properties may be based on infrared reflectance or infrared transmittance associated with the plurality of respective infrared wavebands.

    LIGHT SOURCE AND AUTOMATIC ANALYZER
    5.
    发明公开

    公开(公告)号:US20240280485A1

    公开(公告)日:2024-08-22

    申请号:US18571316

    申请日:2022-06-15

    摘要: There is provided a light source and an automatic analyzer, which stabilize an amount of light while covering a wide wavelength band used in the automatic analyzer.
    The light source of the present invention includes a substrate, a first LED provided on the substrate, and a phosphor that converts an excitation light of the first LED into a broadband light, in which the temperature sensor is embedded in the phosphor together with the first LED. Further, the automatic analyzer of the present invention includes an absorbance measuring unit having this light source, and a reaction disk on which a reaction vessel for containing a reaction solution measured by the absorbance measuring unit is mounted.

    DEVICE FOR MEASURING AT LEAST ONE GASEOUS OR SOLID MATERIAL

    公开(公告)号:US20240264087A1

    公开(公告)日:2024-08-08

    申请号:US18572928

    申请日:2022-06-24

    申请人: AVL List GmbH

    摘要: The invention relates to a device for measuring at least one gaseous or solid material in at least one measurement volume at a stationary measurement station, wherein: a light source and at least one detector are provided, and at least one main primary beam can be emitted from the light source to at least one beam splitter unit; the at least one beam splitter unit is disposed at a first distance from a first reflection region of a reflection unit, and the beam splitter unit splits the main primary beam into at least one first partial beam oriented through the measurement volume toward the first reflection region and at least one secondary primary beam oriented in a different direction than the main primary beam; at least one deflecting unit is disposed at a second distance from a second reflection region, and the at least one secondary primary beam can be directed to the deflecting unit by means of the beam splitter unit and the at least one secondary primary beam can be directed, as a second partial beam, through the at least one measurement volume toward the second reflection region by means of the deflecting unit; and each of the at least one measurement volume is disposed between the beam splitter unit and/or the deflecting unit and the associated reflection regions and is at least partly delimited by the beam splitter unit and/or the deflecting unit and the associated reflection regions. According to the invention, the first reflection region directs the first partial beam, as a first return beam, through the at least one measurement volume to the at least one detector, the second reflection region directs the second partial beam, as a second return beam, through the at least one measurement volume to the at least one detector, and the at least one detector measures a light property of each return beam, said light property characterizing the at least one gaseous or solid material.