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公开(公告)号:US20240361348A1
公开(公告)日:2024-10-31
申请号:US18640345
申请日:2024-04-19
发明人: Alexandre VLASSOV , Timothy BARTA , Justin INSLEE , Ethan GENTERT , Robert SMITH , Sara THIELE , Carolyn ADAMS , Kraig KRUGER , Robert Schneider , Wade LUKIANOW , Jay GRECO , Jason JONES , David CERRONE , Sumonto GHOSH , Brian VAJDA , Andrew BASTA , Allan EVANS , Christopher CROWLEY , Robert SETTERQUIST , Anne COX , Mark MAYERNICK
CPC分类号: G01N35/1016 , B01D61/58 , B01D69/02 , G01N1/405 , G01N1/4077 , G01N21/59 , G01N35/00584 , G01N35/1081 , B01D2311/2642 , B01D2313/44 , B01D2313/50 , B01D2313/58 , B01D2319/025 , B01D2325/42 , G01N2001/4088 , G01N2035/1025 , G01N2035/1053
摘要: Purifying target biomolecules, such as nucleic acids or proteins, from a biological source is a time intensive process and is typically performed by a skilled technician or scientist owing to the highly technical nature of the work. Systems, devices, and methods disclosed herein enable the automated bioprocessing and purification of target biomolecules from a biological source. For example, an instrument and disposable cartridge are provided for automatedly isolating and purifying nucleic acids (such as plasmid DNA from a bacterial culture) or for isolating protein from any biological sample. Such an exemplary instrument and cartridge can work in concert to timely release, mix, and move the target biomolecule and various reagents and buffers through a target biomolecule purification process, resulting in a purified target biomolecule with less manual oversight than traditional approaches.
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公开(公告)号:US20240337587A1
公开(公告)日:2024-10-10
申请号:US18572800
申请日:2022-02-08
发明人: HIDEYA CHUBACHI , TETSURO KUWAYAMA , YOSHIAKI KATO
CPC分类号: G01N21/05 , G01N21/0303 , G01N21/59 , G01N2021/052
摘要: A concentration measurement device includes: a light source that emits light; a first optical system that is provided on an optical path of the light emitted from the light source and condenses the light emitted from the light source; a light-transmissive tubular body that is disposed at a position on a rear stage side with respect to a focal position of the first optical system on the optical path and collimates the light incident on a side surface in a state where a fluid flows inside; and a detection unit that detects light through the tubular body.
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公开(公告)号:US12111314B2
公开(公告)日:2024-10-08
申请号:US17720774
申请日:2022-04-14
申请人: FUJIFILM Corporation
发明人: Kaku Irisawa , Yoshihiro Seto , Hitoshi Shimizu , Takahiro Miyato
IPC分类号: G01N33/543 , G01N21/51 , G01N21/59
CPC分类号: G01N33/54373 , G01N21/51 , G01N21/59
摘要: A test device includes a specimen having a circular cross section that accommodates a test target, a specimen holding part that holds a plurality of the specimens in a row, light emitting elements in which light is incident on two adjacent specimens among the plurality of specimens, a first light guide path 46 that guides light emitted by the light emitting elements, and a second light guide path that is formed to have a smaller diameter than a diameter of the first light guide path and that guides the light emitted by the light emitting elements from the first light guide path to the specimen.
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公开(公告)号:US12085516B2
公开(公告)日:2024-09-10
申请号:US17781020
申请日:2020-12-04
IPC分类号: G01N21/95 , G01N21/35 , G01N21/3563 , G01N21/59
CPC分类号: G01N21/9501 , G01N21/3563 , G01N21/59 , G01N2021/3568 , G01N2021/3595
摘要: Systems and methods for non-contact characterization of semiconductor devices. Systems may include: an infrared radiation source directing radiation towards the semiconductor device; a radiation directing device positioned proximal the infrared radiation source to direct radiation towards an opposing side of the semiconductor device, the semiconductor device receivable between the radiation directing device and the infrared radiation source; and a radiation detector proximal to the infrared radiation source to sense radiation associated with a plurality of infrared wavebands from the semiconductor device for determining a dopant profile property of the semiconductor device. The sensed radiation may include radiation originating from the infrared radiation source reflected from the semiconductor device. The sensed radiation may include radiation originating from the radiation directing device and emerging from the semiconductor device. The dopant profile properties may be based on infrared reflectance or infrared transmittance associated with the plurality of respective infrared wavebands.
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公开(公告)号:US20240280485A1
公开(公告)日:2024-08-22
申请号:US18571316
申请日:2022-06-15
发明人: Takahiro Ando , Yasuhiro Keta , Yuya Matsuoka , Shohei Arita
CPC分类号: G01N21/59 , G01N21/01 , H01L25/167 , G01N35/025
摘要: There is provided a light source and an automatic analyzer, which stabilize an amount of light while covering a wide wavelength band used in the automatic analyzer.
The light source of the present invention includes a substrate, a first LED provided on the substrate, and a phosphor that converts an excitation light of the first LED into a broadband light, in which the temperature sensor is embedded in the phosphor together with the first LED. Further, the automatic analyzer of the present invention includes an absorbance measuring unit having this light source, and a reaction disk on which a reaction vessel for containing a reaction solution measured by the absorbance measuring unit is mounted.-
公开(公告)号:US20240264087A1
公开(公告)日:2024-08-08
申请号:US18572928
申请日:2022-06-24
申请人: AVL List GmbH
发明人: Andreas Pein , Gerald Steiner , Mario Schaller
IPC分类号: G01N21/85 , G01N15/075 , G01N21/27 , G01N21/59 , G08B21/12
CPC分类号: G01N21/85 , G01N15/075 , G01N21/27 , G01N21/59 , G01N2021/8578 , G01N2201/0668 , G08B21/12
摘要: The invention relates to a device for measuring at least one gaseous or solid material in at least one measurement volume at a stationary measurement station, wherein: a light source and at least one detector are provided, and at least one main primary beam can be emitted from the light source to at least one beam splitter unit; the at least one beam splitter unit is disposed at a first distance from a first reflection region of a reflection unit, and the beam splitter unit splits the main primary beam into at least one first partial beam oriented through the measurement volume toward the first reflection region and at least one secondary primary beam oriented in a different direction than the main primary beam; at least one deflecting unit is disposed at a second distance from a second reflection region, and the at least one secondary primary beam can be directed to the deflecting unit by means of the beam splitter unit and the at least one secondary primary beam can be directed, as a second partial beam, through the at least one measurement volume toward the second reflection region by means of the deflecting unit; and each of the at least one measurement volume is disposed between the beam splitter unit and/or the deflecting unit and the associated reflection regions and is at least partly delimited by the beam splitter unit and/or the deflecting unit and the associated reflection regions. According to the invention, the first reflection region directs the first partial beam, as a first return beam, through the at least one measurement volume to the at least one detector, the second reflection region directs the second partial beam, as a second return beam, through the at least one measurement volume to the at least one detector, and the at least one detector measures a light property of each return beam, said light property characterizing the at least one gaseous or solid material.
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公开(公告)号:US12016654B2
公开(公告)日:2024-06-25
申请号:US17112150
申请日:2020-12-04
发明人: Sangkyu Kim , Kunsun Eom , Myounghoon Jung
IPC分类号: G01N21/64 , A61B5/00 , G01N21/25 , G01N21/31 , G01N21/55 , G01N21/59 , G01N33/483 , G01N21/359 , G02B26/00 , G02B26/02 , G02B26/08
CPC分类号: A61B5/0075 , A61B5/0071 , G01N21/255 , G01N21/31 , G01N21/55 , G01N21/59 , G01N21/6428 , G01N21/645 , G01N33/483 , G01N21/359 , G01N2021/6471 , G01N2201/0221 , G01N2201/066 , G01N2201/067 , G01N2201/13 , G02B26/005 , G02B26/026 , G02B26/08
摘要: An optical sensor and a method of operating the optical sensor are provided. The optical sensor includes a light source configured to emit a light, and a path adjuster configured to adjust a traveling path of the light to reflect the light at a first time, and allow the light to pass through the path adjuster at a second time. The optical sensor further includes a light receiver configured to receive a reference light among the reflected light, and receive, among the light passing through the path adjuster, a measurement light related to a target material.
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公开(公告)号:US12013400B2
公开(公告)日:2024-06-18
申请号:US17168472
申请日:2021-02-05
发明人: Scot Randy Weinberger , Ronald Carl Orlando , Joshua Shane Sharp , Robert Wallace Egan , Jeffrey Jonathan Persoff
CPC分类号: G01N33/6803 , C23C18/14 , G01N21/59 , G01N21/631 , G01N21/6428 , H01J49/0036 , G01N2021/6439
摘要: Flash Photo-Oxidation Device and Higher Order Structural Analysis is employed for higher order structural analysis of biomolecules. Biomolecular higher order structure (HOS) results from the confounded superimposition of a biomolecule's secondary, tertiary, and quaternary structure and defines the manner in which a biomolecule presents itself and interacts with other biomolecules in living systems. A rapidly growing class of therapeutic drugs, known as biotherapeutics, comprises a variety of proteins, whose therapeutic properties are inherently linked and dependent upon their HOS. As such, HOS analysis of biotherapeutics is an important analytical requirement in the biopharmaceutical industry. The present invention provides new means and methods for the determination of biopharmaceutical HOS and associated conformation using improved devices and methodologies for flash photo-oxidation of proteins to determine their higher order biomolecular structure, and such is responsive to the increased demand for new and improved HOS analytical means in the biopharmaceutical industry.
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公开(公告)号:US20240164668A1
公开(公告)日:2024-05-23
申请号:US18520380
申请日:2023-11-27
发明人: Kevin Pauley , Cristiano Dalvi , Hung Vo , Jesse Chen , Ferdyan Lesmana , Jeroen Poeze , Sean Merritt
IPC分类号: A61B5/1455 , A61B5/00 , A61B5/145 , G01J1/16 , G01N21/31 , G01N21/47 , G01N21/49 , G01N21/59
CPC分类号: A61B5/14552 , A61B5/14532 , A61B5/14535 , A61B5/14539 , A61B5/14542 , A61B5/14546 , A61B5/4875 , G01J1/1626 , G01N21/31 , G01N21/4738 , G01N21/49 , G01N21/59 , A61B2562/0238 , G01J2001/1636 , G01J2001/1652 , G01N2021/3181
摘要: An optical measurement device includes a light source, a first detector, and a second detector. The light source emits light to a measurement site of a patient and one or more detectors detect the light from the light source. At least a portion of a detector is translucent and the light passes through the translucent portion prior to reaching the measurement site. A detector receives the light after attenuation and/or reflection or refraction by the measurement site. A processor determines a light intensity of the light source, a light intensity through a tissue site, or a light intensity of reflected or refracted light based on light detected by the one or more detectors. The processor can estimate a concentration of an analyte at the measurement site or an absorption or reflection at the measurement site.
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公开(公告)号:US11946874B2
公开(公告)日:2024-04-02
申请号:US17055539
申请日:2019-04-08
发明人: Fumimasa Horikiri
IPC分类号: G01N21/59 , G01N21/3563 , G01N21/359 , G01N21/95 , H01L21/02 , H01L21/66 , H01L29/20
CPC分类号: G01N21/9501 , G01N21/3563 , G01N21/359 , G01N21/59 , H01L21/0254 , H01L22/12 , H01L29/2003 , G01N2021/3568
摘要: There is provided a method for producing a nitride semiconductor laminate in which a thin film is homoepitaxially grown on a substrate comprising group III nitride semiconductor crystals, the method including: homoepitaxially growing a thin film on a substrate, using the substrate in which a dislocation density on its main surface is 5×106 pieces/cm2 or less, a concentration of oxygen therein is less than 1×1017 at·cm−3, and a concentration of impurities therein other than n-type impurity is less than 1×1017 at ·cm−3; and inspecting a film quality of the thin film formed on the substrate, wherein in the inspection of the film quality, the film quality of the thin film is inspected by detecting a deviation of an amount of reflected light at a predetermined wavenumber determined in a range of 1,600 cm−1 or more and 1,700 cm−1 or less in a reflection spectrum obtained by irradiating the thin film on the substrate with infrared light, from an amount of reflected light at the predetermined wavenumber determined according to a film thickness of the thin film, a carrier concentration of the substrate, and a carrier concentration of the thin film.
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