公开(公告)号：US09411727B2

公开(公告)日：2016-08-09

申请号：US14963201

申请日：2015-12-08

Applicant: QUALCOMM INCORPORATED

Inventor： Xiangyu Dong ,  Xiaochun Zhu ,  Jungwon Suh

IPC: G06F12/08 ,  G11C7/10 ,  G11C11/16 ,  G06F13/00

CPC classification number: G06F12/0802 ,  G06F12/08 ,  G06F12/0855 ,  G06F12/0864 ,  G06F2212/1016 ,  G06F2212/22 ,  G06F2212/222 ,  G06F2212/60 ,  G11C7/1015 ,  G11C7/1039 ,  G11C7/1084 ,  G11C11/165 ,  G11C11/1653 ,  G11C11/1673 ,  G11C11/1675 ,  G11C11/1693 ,  G11C13/0002 ,  G11C2207/2245 ,  G11C2207/2272 ,  G11C2207/2281 ,  G11C2207/229

Abstract: A method of reading from and writing to a resistive memory cache includes receiving a write command and dividing the write command into multiple write sub-commands. The method also includes receiving a read command and executing the read command before executing a next write sub-command.

Abstract translation: 读取和写入电阻式存储器高速缓存的方法包括接收写入命令并将写入命令分成多个写入子命令。 该方法还包括在执行下一个写入子命令之前接收读取命令并执行读取命令。

公开(公告)号：US09239788B2

公开(公告)日：2016-01-19

申请号：US14062558

申请日：2013-10-24

Applicant: QUALCOMM Incorporated

Inventor： Xiangyu Dong ,  Xiaochun Zhu ,  Jungwon Suh

IPC: G06F12/08 ,  G11C7/10 ,  G11C11/16 ,  G06F13/00

CPC classification number: G06F12/0802 ,  G06F12/08 ,  G06F12/0855 ,  G06F12/0864 ,  G06F2212/1016 ,  G06F2212/22 ,  G06F2212/222 ,  G06F2212/60 ,  G11C7/1015 ,  G11C7/1039 ,  G11C7/1084 ,  G11C11/165 ,  G11C11/1653 ,  G11C11/1673 ,  G11C11/1675 ,  G11C11/1693 ,  G11C13/0002 ,  G11C2207/2245 ,  G11C2207/2272 ,  G11C2207/2281 ,  G11C2207/229

Abstract: A method of reading from and writing to a resistive memory cache includes receiving a write command and dividing the write command into multiple write sub-commands. The method also includes receiving a read command and executing the read command before executing a next write sub-command.

公开(公告)号：US09230630B2

公开(公告)日：2016-01-05

申请号：US14072599

申请日：2013-11-05

Applicant: QUALCOMM Incorporated

Inventor： Xiaochun Zhu ,  Steven M. Millendorf ,  Xu Guo ,  David M. Jacobson ,  Kangho Lee ,  Seung H. Kang ,  Matthew Michael Nowak

IPC: G11C11/16 ,  H04L9/30 ,  H04L9/08 ,  H04L9/32

CPC classification number: G11C11/1673 ,  G09C1/00 ,  G11C11/161 ,  H04L9/0866 ,  H04L9/30 ,  H04L9/3278

Abstract: One feature pertains to a method for implementing a physically unclonable function (PUF). The method includes providing an array of magnetoresistive random access memory (MRAM) cells, where the MRAM cells are each configured to represent one of a first logical state and a second logical state. The array of MRAM cells are un-annealed and free from exposure to an external magnetic field oriented in a direction configured to initialize the MRAM cells to a single logical state of the first and second logical states. Consequently, each MRAM cell has a random initial logical state of the first and second logical states. The method further includes sending a challenge to the MRAM cell array that reads logical states of select MRAM cells of the array, and obtaining a response to the challenge from the MRAM cell array that includes the logical states of the selected MRAM cells of the array.

Abstract translation: 一个特征涉及用于实现物理不可克隆功能（PUF）的方法。 该方法包括提供磁阻随机存取存储器（MRAM）单元阵列，其中MRAM单元被配置为表示第一逻辑状态和第二逻辑状态之一。 MRAM单元的阵列是未退火的，并且没有暴露于被配置为将MRAM单元初始化的方向定向到第一和第二逻辑状态的单个逻辑状态的外部磁场。 因此，每个MRAM单元具有第一和第二逻辑状态的随机初始逻辑状态。 该方法还包括向MRAM单元阵列发送挑战，该MRAM单元阵列读取阵列的选择MRAM单元的逻辑状态，以及从包括阵列的所选MRAM单元的逻辑状态的MRAM单元阵列获得对挑战的响应。

公开(公告)号：US09196334B2

公开(公告)日：2015-11-24

申请号：US13842122

申请日：2013-03-15

Applicant: QUALCOMM Incorporated

Inventor： Seung H. Kang ,  Xiaochun Zhu

IPC: G11C11/16 ,  H01L43/02 ,  G06F12/08

CPC classification number: G11C11/161 ,  G06F12/0811 ,  G06F12/0893 ,  G06F12/0897 ,  G06F2212/2024 ,  G06F2212/222 ,  G11C11/1675 ,  G11C11/1693 ,  H01L43/02

Abstract: A hierarchical memory magnetoresistive random-access memory architecture is disclosed. In a particular embodiment, an apparatus includes a first magnetoresistive random-access memory (MRAM) device corresponding to a first level in a hierarchical memory system. The apparatus includes a second MRAM device corresponding to a second level in the hierarchical memory system. The first MRAM device has a first access latency and includes a first magnetic tunnel junction (MTJ) device having a first physical configuration. The second MRAM device has a second access latency and includes a second MTJ device having a second physical configuration. The first access latency is less than the second access latency.

Abstract translation: 公开了分层存储器磁阻随机存取存储器架构。 在特定实施例中，装置包括对应于分层存储器系统中的第一级的第一磁阻随机存取存储器（MRAM）装置。 该装置包括对应于分级存储器系统中的第二级的第二MRAM设备。 第一MRAM设备具有第一访问延迟并且包括具有第一物理配置的第一磁隧道结（MTJ）设备。 第二MRAM设备具有第二接入延迟并且包括具有第二物理配置的第二MTJ设备。 第一个访问延迟小于第二个访问延迟。

公开(公告)号：US09082962B2

公开(公告)日：2015-07-14

申请号：US14086054

申请日：2013-11-21

Applicant: QUALCOMM Incorporated

Inventor： Seung Hyuk Kang ,  Xia Li ,  Wei-Chuan Chen ,  Kangho Lee ,  Xiaochun Zhu ,  Wah Nam Hsu

IPC: H01L43/12 ,  H01L43/08

CPC classification number: H01L43/12 ,  H01L43/08

Abstract: A magnetic tunnel junction (MTJ) with direct contact is manufactured having lower resistances, improved yield, and simpler fabrication. The lower resistances improve both read and write processes in the MTJ. The MTJ layers are deposited on a bottom electrode aligned with the bottom metal. An etch stop layer may be deposited adjacent to the bottom metal to prevent overetch of an insulator surrounding the bottom metal. The bottom electrode is planarized before deposition of the MTJ layers to provide a substantially flat surface. Additionally, an underlayer may be deposited on the bottom electrode before the MTJ layers to promote desired characteristics of the MTJ.

Abstract translation: 具有直接接触的磁性隧道结（MTJ）被制造成具有较低的电阻，提高的产量和更简单的制造。 较低的电阻提高了MTJ中的读取和写入过程。 MTJ层沉积在与底部金属对准的底部电极上。 蚀刻停止层可以沉积在底部金属附近，以防止围绕底部金属的绝缘体的过蚀刻。 在沉积MTJ层之前将底部电极平坦化以提供基本平坦的表面。 另外，可以在MTJ层之前的底部电极上沉​​积底层以促进MTJ的期望特性。

公开(公告)号：US09070870B2

公开(公告)日：2015-06-30

申请号：US14219026

申请日：2014-03-19

Applicant: QUALCOMM Incorporated

Inventor： Xiaochun Zhu ,  Xia Li ,  Wei-Chuan Chen ,  Seung Hyuk Kang

IPC: H01L21/00 ,  H01L43/12 ,  G11C11/16 ,  H01L43/08 ,  H01L43/10 ,  H01L27/22 ,  H01L41/12 ,  H01F10/32 ,  H01F41/32

CPC classification number: H01L43/12 ,  G11C11/16 ,  G11C11/161 ,  G11C11/1675 ,  H01F10/3254 ,  H01F10/3286 ,  H01F41/325 ,  H01L27/222 ,  H01L41/12 ,  H01L43/08 ,  H01L43/10

Abstract: Partial perpendicular magnetic anisotropy (PPMA) type magnetic random access memory cells are constructed using processes and structural configurations that induce a directed static strain/stress on an MTJ to increase the perpendicular magnetic anisotropy. Consequently, reduced switching current of the MTJ results. The directed static strain/stress on the MTJ is induced in a controlled direction and/or with a controlled magnitude during fabrication. The MTJ is permanently subject to a predetermined directed stress and permanently includes the directed static strain/strain that provides reduced switching current.

Abstract translation: 使用在MTJ上引起定向静态应变/应力以增加垂直磁各向异性的工艺和结构构造来构造部分垂直磁各向异性（PPMA）型磁性随机存取存储器单元。 因此，MTJ的开关电流降低。 在制造过程中，受控方向和/或受控幅度诱发MTJ上的定向静态应变/应力。 MTJ永久地受到预定的定向应力，并且永久地包括提供减小的开关电流的定向静态应变/应变。

公开(公告)号：US20150070979A1

公开(公告)日：2015-03-12

申请号：US14072537

申请日：2013-11-05

Applicant: QUALCOMM Incorporated

Inventor： Xiaochun Zhu ,  Steven M. Millendorf ,  Xu Guo ,  David M. Jacobson ,  Kangho Lee ,  Seung H. Kang ,  Matthew Michael Nowak

IPC: G11C11/16

CPC classification number: G11C11/1695 ,  G09C1/00 ,  G11C11/161 ,  G11C11/1673 ,  G11C11/1675 ,  H04L9/0866 ,  H04L9/3278 ,  H04L2209/12

Abstract: One feature pertains to a method of implementing a physically unclonable function. The method includes initializing an array of magnetoresistive random-access memory (MRAM) cells to a first logical state, where each of the MRAM cells have a random transition voltage that is greater than a first voltage and less than a second voltage. The transition voltage represents a voltage level that causes the MRAM cells to transition from the first logical state to a second logical state. The method further includes applying a programming signal voltage to each of the MRAM cells of the array to cause at least a portion of the MRAM cells of the array to randomly change state from the first logical state to the second logical state, where the programming signal voltage is greater than the first voltage and less than the second voltage.

Abstract translation: 一个特征涉及实现物理上不可克隆功能的方法。 该方法包括将磁阻随机存取存储器（MRAM）单元的阵列初始化为第一逻辑状态，其中每个MRAM单元具有大于第一电压且小于第二电压的随机转变电压。 转换电压表示使MRAM单元从第一逻辑状态转换到第二逻辑状态的电压电平。 该方法还包括将编程信号电压施加到阵列的每个MRAM单元，以使阵列的MRAM单元的至少一部分随机地将状态从第一逻辑状态改变到第二逻辑状态，其中编程信号 电压大于第一电压且小于第二电压。

公开(公告)号：US08889431B2

公开(公告)日：2014-11-18

申请号：US13683783

申请日：2012-11-21

Applicant: QUALCOMM Incorporated

Inventor： Xiaochun Zhu ,  Matthew Nowak ,  Xia Li ,  Seung H. Kang

IPC: H01L43/02 ,  H01F10/32 ,  G11C11/16 ,  H01L27/22 ,  H01L43/12

CPC classification number: H01L43/02 ,  G11C11/16 ,  G11C11/161 ,  G11C11/1659 ,  H01F10/3254 ,  H01F10/3272 ,  H01L27/228 ,  H01L43/08 ,  H01L43/12

Abstract: Magnetic tunnel junctions (MTJs) and methods of forming same are disclosed. A pinned layer is disposed in the MTJ such that a free layer of the MTJ can couple to a drain of an access transistor when provided in a magnetic random access memory (MRAM) bitcell. This structure alters the write current flow direction to align the write current characteristics of the MTJ with write current supply capability of an MRAM bitcell employing the MTJ. As a result, more write current can be provided to switch the MTJ from a parallel (P) to anti-parallel (AP) state. An anti-ferromagnetic material (AFM) layer is provided on the pinned layer to fix pinned layer magnetization. To provide enough area for depositing the AFM layer to secure pinned layer magnetization, a pinned layer having a pinned layer surface area greater than a free layer surface area of the free layer is provided.

Abstract translation: 公开了磁隧道结（MTJ）及其形成方法。 被钉扎层设置在MTJ中，使得当提供在磁性随机存取存储器（MRAM）位单元中时，MTJ的自由层可以耦合到存取晶体管的漏极。 该结构改变写入电流流动方向，以使MTJ的写入电流特性与使用MTJ的MRAM位单元的写入电流供应能力对准。 结果，可以提供更多的写入电流以将MTJ从并行（P）切换到反并行（AP）状态。 在钉扎层上提供反铁磁材料（AFM）层以固定钉扎层的磁化强度。 为了提供足够的用于沉积AFM层以确保钉扎层磁化的区域，提供了具有大于自由层的自由层表面积的钉扎层表面积的钉扎层。

公开(公告)号：US20140210021A1

公开(公告)日：2014-07-31

申请号：US13749731

申请日：2013-01-25

Applicant: QUALCOMM INCORPORATED

Inventor： Xiaochun Zhu ,  Xia Li ,  Seung H. Kang

IPC: H01L43/12 ,  H01L43/02

CPC classification number: H01L43/08 ,  G11C11/15 ,  G11C11/155 ,  G11C11/161 ,  H01L43/02 ,  H01L43/10 ,  H01L43/12

Abstract: An in-process magnetic layer having an in-process area dimension is formed with a chemically damaged region at a periphery. At least a portion of the chemically damaged region is transformed to a chemically modified peripheral portion that is non-ferromagnetic. Optionally, the transforming is by oxidation, nitridation or fluorination, or combinations of the same.

Abstract translation: 具有处理区域尺寸的过程中的磁性层在周边形成化学损伤区域。 化学损伤区域的至少一部分被转化为非铁磁性的化学改性的周边部分。 任选地，转化是通过氧化，氮化或氟化，或其组合。

公开(公告)号：US20130161771A1

公开(公告)日：2013-06-27

申请号：US13772576

申请日：2013-02-21

Applicant: QUALCOMM Incorporated

Inventor： Kangho Lee ,  Seung H. Kang ,  Xiaochun Zhu

IPC: H01L43/02 ,  G06F17/50

CPC classification number: H01L43/08 ,  G06F17/5068 ,  G11C11/16 ,  G11C11/161 ,  G11C11/1675 ,  H01L43/02 ,  H01L43/12

Abstract: An apparatus includes a memory cell including a magnetic tunnel junction (MTJ) structure coupled between a bit line and a source line. The MTJ structure includes a free layer coupled to the bit line and a pinned layer. A magnetic moment of the free layer is substantially parallel to a magnetic moment of the pinned layer in a first state and substantially antiparallel to the magnetic moment of the pinned layer in a second state. A physical dimension of the pinned layer produces an unbalanced offset magnetic field which corresponds to a first switching current of the MTJ structure that enables switching from the first state to the second state when a first voltage is applied to the bit line and corresponds to a second switching current that enables switching from the second state to the first state when the first voltage is applied to the source line.

Abstract translation: 一种装置包括存储单元，其包括耦合在位线和源极线之间的磁性隧道结（MTJ）结构。 MTJ结构包括耦合到位线和固定层的自由层。 自由层的磁矩基本上平行于处于第一状态的被钉扎层的磁矩，并且在第二状态下基本上与销钉层的磁矩反平行。 钉扎层的物理尺寸产生不平衡偏移磁场，其对应于MTJ结构的第一开关电流，当第一电压施加到位线并且对应于第二电压时，能够从第一状态切换到第二状态 当第一电压施加到源极线时，切换电流能够从第二状态切换到第一状态。