摘要:
A connection component for mounting a chip or other microelectronic element is formed from a starting unit including posts projecting from a dielectric element by crushing or otherwise reducing the height of at least some of the posts.
摘要:
In a BGA package having electrically connected active balls and electrically disconnected dummy balls, the active balls are positioned in a radial direction at intervals of 90.degree. around the dummy balls. When a defect occurs in a solder joint, the package can be easily repaired by finding defective active ball; forming a repair hole by using a cutting means at a predetermined portion of the printed circuit board corresponding to a central position between the dummy ball and the defectively soldered active ball; inserting a solder paste injector into the repair hole to inject solder thereinto; and mutually connecting pad extensions of the dummy ball and the defective active ball with the injected solder. Therefore, the overall process can be simplified and its reliability can be improved.
摘要:
A connection component for mounting a chip or other microelectronic element is formed from a starting unit including posts projecting from a dielectric element by crushing or otherwise reducing the height of at least some of the posts.
摘要:
A microelectronic assembly and a fabrication method are provided which includes a microelectronic element such as a chip or element of a package. A plurality of surface-mountable contacts are arranged in an array exposed at a major surface of the microelectronic element. One or more passive elements, e.g., a resistor, inductor, capacitor, or combination of the same are mounted to the microelectronic element, with an inner terminal of the passive element conductively mounted to an exposed surface of one contact and an outer terminal displaced vertically from the major surface of the microelectronic element.
摘要:
A probe for testing semiconductor chips includes a plurality of probe contacts providing z-direction compliancy. The probe contacts include a blind opening surrounded by a lateral sidewall for receiving an aligned chip contact. The chip contacts are manipulated with a downward vertical force and along a horizontal path for engagement with various portions of the probe contact within the blind opening. The alignment may be actively monitored for determining minimum contact resistance during the probing process.
摘要:
A stacked chip assembly includes individual units having chips mounted on dielectric layers and traces on the dielectric layers interconnecting the contacts of the chips with terminals disposed in peripheral regions of the dielectric layers. At least some of the traces are multi-branched traces which connect chip select contacts to chip select terminals. The units are stacked one above the other with corresponding terminals of the different units being connected to one another by solder balls or other conductive elements so as to form vertical buses. Prior to stacking, the multi-branched traces of the individual units are selectively interrupted, as by breaking the individual branches, so as to leave chip select contacts of chips in different units connected to different chip select terminals and thereby connect these chips to different vertical buses. The individual units desirably are thin and directly abut one another so as to provide a low-height assembly with good heat transfer from chips within the stack.
摘要:
A nozzle structure of a repair apparatus for a semiconductor package includes a funnel holder connected to a repair apparatus, a cylinder extended downwardly from the funnel holder, a vacuum tube provided along an axis of the cylinder, a vacuum absorption body housing the vacuum tube therein, and a pair of exhaust guide wall clips. A lower portion of the cylinder is compressed from four sides thereof so as to form a rectangular ending thereof which has first through fourth side walls. The vacuum absorption body is positioned between the first and third side walls. Each of the exhaust side walls is fixed to corresponding side edge lines of the first and third side walls, wherein the first and third side walls are identical in height and facing each other, the second and fourth side walls are identical in height and facing each other, and the first and third side walls are shorter than the second and fourth side walls in height.
摘要:
A connection component for mounting a chip or other microelectronic element is formed from a starting unit including posts projecting from a dielectric element by crushing or otherwise reducing the height of at least some of the posts.
摘要:
A connection component for mounting a chip or other microelectronic element is formed from a starting unit including posts projecting from a dielectric element by crushing or otherwise reducing the height of at least some of the posts.
摘要:
A method of making a stacked microelectronic assembly includes providing a flexible substrate having first and second ends, the flexible substrate having a plurality of attachment sites located between the first and second ends thereof including a first one of the attachment sites located adjacent the first end of the flexible substrate, the flexible substrate including conductive terminals accessible at a surface of the flexible substrate and wiring connected to the terminals, providing a compliant layer over the first attachment site, assembling a plurality of microelectronic elements over the attachment sites, wherein a first one of the microelectronic elements engages the compliant layer and is movable relative to the flexible substrate, electrically interconnecting the microelectronic elements and the wiring, folding the flexible substrate and stacking at least some of the microelectronic elements in generally vertical alignment with one another so that the first one of the microelectronic elements engaging the compliant layer is disposed at a bottom of the stacked assembly, and maintaining the stacked microelectronic elements in the substantially vertical alignment, wherein the conductive terminals are exposed at the bottom end of the stacked assembly.