Abstract:
A crosspoint array has been shown having a plurality of bitlines and wordlines; and a plurality of crossbar elements, with each crossbar element being disposed between a bitline and a wordline and with each crossbar element having at least a solid electrolyte material used as a rectifier in series with a symmetric or substantially symmetric resistive memory node. The crossbar elements are responsive to the following voltages: a first set of voltages to transition the solid electrolyte in the crossbar elements from an OFF state to an ON state, a second set of voltages to read or program the symmetric resistive memory, and a third set of voltages to transition solid electrolyte from an ON state to an OFF state.
Abstract:
A system and method for operating a unipolar memory cell array including a bidirectional access diode. The system includes a column voltage switch electrically coupled to a plurality of column voltages. The column voltage switch includes an output electrically coupled to the bidirectional access diode. The plurality of column voltages includes at least one select column voltage and one deselect column voltage. The system includes a row voltage switch electrically coupled to a plurality of row voltages. The row voltage switch includes an output electrically coupled to the bidirectional access diode. The plurality of row voltages includes at least one select row voltage and one deselect row voltage. The system includes a column and row decoder electrically coupled to a select line of the column and row voltage switches, respectively.
Abstract:
A structure, memory devices using the structure, and methods of fabricating the structure. The structure includes: an array of nano-fins, each nano-fin comprising an elongated block of semiconductor material extending axially along a first direction, the nano-fins arranged in groups of at least two nano-fins each, wherein ends of nano-fins of each adjacent group of nano-fins are staggered with respect to each other on both a first and a second side of the array; wherein nano-fins of each group of nano-fins are electrically connected to a common contact that is specific to each group of nano-fins such that the common contacts comprise a first common contact on the first side of the array and a second common contact on the second side of the array; and wherein each group of nano-fins has at least two gates that electrically control the conductance of nano-fins of the each group of nano-fins.
Abstract:
An electronically scannable multiplexing device is capable of addressing multiple bits within a volatile or non-volatile memory cell. The multiplexing device generates an electronically scannable conducting channel with two oppositely formed depletion regions. The depletion width of each depletion region is controlled by a voltage applied to a respective control gate at each end of the multiplexing device. The present multi-bit addressing technique allows, for example, 10 to 100 bits of data to be accessed or addressed at a single node. The present invention can also be used to build a programmable nanoscale logic array or for randomly accessing a nanoscale sensor array.
Abstract:
A symmetrically resistive memory material (such as a phase change material) is described for use as a rectifying element for driving symmetric or asymmetric resistive memory elements in a crosspoint memory architecture. The crosspoint architecture has a plurality of electrodes and a plurality of crossbar elements, with each crossbar element being disposed between a first and a second electrode. The crossbar element is made of a symmetric resistive memory element used as a rectifier in series with a symmetric or asymmetric resistive memory element.
Abstract:
An electronically scannable multiplexing device is capable of addressing multiple bits within a volatile or non-volatile memory cell. The multiplexing device generates an electronically scannable conducting channel with two oppositely formed depletion regions. The depletion width of each depletion region is controlled by a voltage applied to a respective control gate at each end of the multiplexing device. The present multi-bit addressing technique allows, for example, 10 to 100 bits of data to be accessed or addressed at a single node. The present invention can also be used to build a programmable nanoscale logic array or for randomly accessing a nanoscale sensor array.
Abstract:
Switching operations, such as those used in memory devices, are enhanced using a semiconductor device having a thyristor adapted to switch between conducting and blocking states and operate at low power. According to an example embodiment of the present invention, thyristor characteristics are managed over a broad temperature range using a control circuit for coupling a signal, such as a DC voltage signal, to a portion of a thyristor for controlling temperature-related operation thereof, e.g., for controlling bipolar gains. In one implementation, a control port adaptively adjusts a signal coupled to the thyristor as a function of temperature, such that at relatively low temperatures unwanted increases in holding current (IH) are prevented. In another implementation, the control port couples the signal at relatively high temperature operation for controlling the forward blocking voltage (VFB) in such a manner that a blocking state of the thyristor is held. In still another implementation, a circuit controller is adapted for applying the signal to the thyristor via the control port as a function of temperature by monitoring operation of a reference thyristor. With these approaches, thyristor operation can be maintained in a relatively stable manner over a broad temperature range.
Abstract translation:使用具有适于在导通和阻塞状态之间切换并且以低功率操作的晶闸管的半导体器件来增强诸如存储器件中使用的切换操作。 根据本发明的示例性实施例,使用用于将诸如DC电压信号的信号耦合到用于控制其温度相关操作的晶闸管的一部分的控制电路,在宽温度范围内管理晶闸管特性,例如 ,用于控制双极增益。 在一个实施方案中,控制端口自适应地调节作为温度的函数耦合到晶闸管的信号,使得在相对较低的温度下,防止了保持电流(I H H)的不期望的增加。 在另一实施方案中,控制端口以相对较高的温度操作耦合信号,以便控制可控硅晶闸管的阻塞状态的方式来控制正向阻断电压(V SUB FB)。 在另一个实施方式中,电路控制器适于通过监视参考晶闸管的操作,通过控制端口将信号作为温度的函数施加到晶闸管。 利用这些方法,可以在宽的温度范围内以相对稳定的方式保持晶闸管操作。
Abstract:
A system and method for operating a unipolar memory cell array including a bidirectional access diode. An example embodiment is a method including determining if the operating state of the unipolar memory cell is in a select state or a deselect state and the programming state is a read state or a write state. The method switches a column voltage switch based on the operating state and the programming state of the unipolar memory cell. The method further switches a row voltage switch based on the operating state and the programming state of the unipolar memory cell.
Abstract:
A system and method for operating a bipolar memory cell array including a bidirectional access diode. The system includes a column voltage. The column voltage switch includes column voltages and an output electrically coupled to the bidirectional access diode. The column voltages include at least one write-one column voltage and at least one write-zero column voltage. The system also includes a row voltage switch. The row voltage switch includes row voltages and an output electrically coupled to the bidirectional access diode. The row voltages include at least one write-one row voltage and at least one write-zero row voltage. The system further includes a column decoder and a row decoder electrically coupled to a select line of the column voltage switch and row voltage switch, respectively. The system includes a write driver electrically coupled to the select lines of the row and column switches.
Abstract:
An asymmetrically programmed memory material (such as a solid electrolyte material) is described for use as a rectifying element for driving symmetric or substantially symmetric resistive memory elements in a crosspoint memory architecture. A solid electrolyte element (SE) has very high resistance in the OFF state and very low resistance in the ON state (because it is a metallic filament in the ON state). These attributes make it a near ideal diode. During the passage of current (during program/read/erase) of the memory element, the solid electrolyte material also programs into the low resistance state. The final state of the solid electrolyte material is reverted to a high resistance state while making sure that the final state of the memory material is the one desired.