公开(公告)号：US20240331948A1

公开(公告)日：2024-10-03

申请号：US18735641

申请日：2024-06-06

Applicant: Murata Manufacturing Co., Ltd.

Inventor： Shunsuke AKIBA ,  Tomomichi ICHIKAWA ,  Yumie KAWASAKI ,  Kazuto YAMAZAKI

IPC: H01G4/32 ,  G01N23/22 ,  H01G4/18

CPC classification number: H01G4/32 ,  G01N23/22 ,  H01G4/18

Abstract: A film capacitor that includes: a dielectric resin film having a first surface and a second surface opposite each other; a first metal layer on the first surface; and a second metal layer on the second surface, wherein in a mapping image of nitrogen atoms observed by energy dispersive X-ray spectroscopy in a section of the dielectric resin film along a thickness direction of the dielectric resin film, a ratio of an area of nitrogen atom aggregation regions to an entire observation area is 35% or less.

公开(公告)号：US11867645B2

公开(公告)日：2024-01-09

申请号：US17285167

申请日：2019-10-18

Applicant: Security Matters LTD.

Inventor： Yair Grof ,  Dmitrijs Docenko ,  Mor Kaplinsky ,  Haggai Alon ,  Yifat Bareket ,  Michal Firstenberg ,  Avital Trachtman ,  Nachum Holin ,  Nadav Yoran

IPC: G01N23/2204 ,  G01N23/223 ,  G01N23/2206 ,  G01N23/22

CPC classification number: G01N23/223 ,  G01N23/22 ,  G01N23/2204 ,  G01N23/2206 ,  G01N2223/076 ,  G01N2223/0766 ,  G01N2223/507 ,  G01N2223/652

Abstract: In one embodiment, a system and a method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a movement path, as the substance moves along the movement path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of the overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.

公开(公告)号：US20180136148A1

公开(公告)日：2018-05-17

申请号：US15576121

申请日：2015-06-18

Applicant: Suzhou Institute Of Nano-Tech and Nano-Bionics (SINANO), Chinese Academy Of Sciences

Inventor： Yuegang Zhang ,  Genlan Rong ,  Shuo Ma

IPC: G01N23/2204 ,  B01L3/00 ,  G01N23/2251 ,  H01J37/20 ,  G01N1/28

CPC classification number: G01N23/2204 ,  B01L3/508 ,  B01L2300/0645 ,  B01L2300/0809 ,  G01N1/28 ,  G01N23/22 ,  G01N23/2251 ,  H01J37/20 ,  H01J2237/2007

Abstract: A chip assembly for measuring an electrochemical reaction on a solid-liquid phase interface in situ, comprising a first electrode, a second electrode, a first insulating film, a second insulating film, a third insulating film, a fourth insulating film and an upper chip and a lower chip which are oppositely arranged and of which two sides are correspondingly combined in a sealing manner; a through hole is provided on the upper chip; the first insulating film under the through hole is provided with the first electrode; a groove opposite to the through hole is provided on the lower chip; and the fourth insulating film arranged at one side of the groove is provided with the second electrode. The chip assembly dispenses with a specially-made sample rod, thereby substantially reducing test cost; and meanwhile, a lattice structure of a first electrode is also beneficial for observing topography change of a to-be-tested sample.

公开(公告)号：US09933375B2

公开(公告)日：2018-04-03

申请号：US14865827

申请日：2015-09-25

Applicant: Michael Drummy ,  C. Tricia Liu

Inventor： Michael Drummy ,  C. Tricia Liu

IPC: G01N23/22 ,  G01N23/223

CPC classification number: G01N23/223 ,  G01J3/0272 ,  G01N23/22 ,  G01N2223/076 ,  G01N2223/301

Abstract: Disclosed is a portable non-destructive testing (NDT) instrument system that transmits spectrum data measured from a test material sample to a remotely located computer for computation of the sample's atomic element composition. The atomic element composition is subsequently transmitted back to the portable instrument for display to the operator in real time. The precision and accuracy of the compositional computation is improved by the greater processing power of the high performance remote computer. The operator of the NDT instrument may choose to use the remote computer to perform part or all of the compositional computation.

公开(公告)号：US20180080885A1

公开(公告)日：2018-03-22

申请号：US15564542

申请日：2016-04-08

Applicant: The Regents of the University of California

Inventor： Naomi GINSBERG ,  Connor Gregory BISCHAK ,  Craig L. HETHERINGTON ,  David M. KAZ

IPC: G01N23/225

CPC classification number: G01N23/2254 ,  G01N23/22 ,  G01N2223/612

Abstract: Provided herein are non-invasive methods of nanoscale imaging of a sample using an illumination layer and an electron beam. For example, the electron may activate the illumination layer without activating the sample, and the illumination layer may emit cathodoluminescence to produce a nanoscale image of the sample.

公开(公告)号：US20180025897A1

公开(公告)日：2018-01-25

申请号：US15550014

申请日：2016-02-10

Applicant: REVERA, INCORPORATED

Inventor： David A. REED ,  Bruno W SCHUELER ,  Bruce H NEWCOME ,  Rodney SMEDT ,  Chris BEVIS

IPC: H01J49/14 ,  G01Q10/04 ,  G01N23/22 ,  H01L21/66 ,  H01J49/26

CPC classification number: H01J49/142 ,  G01N23/22 ,  G01Q10/04 ,  H01J49/26 ,  H01L22/12

Abstract: Systems and approaches for semiconductor metrology and surface analysis using Secondary Ion Mass Spectrometry (SIMS) are disclosed. In an example, a secondary ion mass spectrometry (SIMS) system includes a sample stage. A primary ion beam is directed to the sample stage. An extraction lens is directed at the sample stage. The extraction lens is configured to provide a low extraction field for secondary ions emitted from a sample on the sample stage. A magnetic sector spectrograph is coupled to the extraction lens along an optical path of the SIMS system. The magnetic sector spectrograph includes an electrostatic analyzer (ESA) coupled to a magnetic sector analyzer (MSA).

公开(公告)号：US20170011880A1

公开(公告)日：2017-01-12

申请号：US15117872

申请日：2015-02-10

Applicant: LUXBRIGHT AB

Inventor： Qui-Hong Hu

IPC: H01J35/06

CPC classification number: H01J35/065 ,  G01N23/046 ,  G01N23/22 ,  G01V5/00 ,  H01J35/32 ,  H01J2201/30488 ,  H01J2201/30496

Abstract: Example embodiments presented herein are directed towards an x-ray generating device. The device comprises at least one electron emitter(s) (22, 22_1, 22_2, 22_3) which has an electrically conductive substrate (23). The electrically conductive substrate comprises a coating of nanostructures (24). The device further comprises a heating element (21) attachable to each electrically conductive substrate. The device further comprises an electron receiving component (14) configured to receiving electrons emitted from the at least one electron emitter(s). The device also comprises an evacuated enclosure (10) configured to house the at least one electron emitter(s), the heating element and the electron receiving component. The at least one electron emitter(s) is configured for Schottky emission when the heating element is in an on-state and the at least one electron emitter(s) is negatively biased.

Abstract translation: 本文呈现的示例性实施例针对x射线产生装置。 该器件包括至少一个具有导电衬底（23）的电子发射器（22,22_1,22_2,22_3）。 导电基底包括纳米结构的涂层（24）。 该装置还包括可连接到每个导电基底的加热元件（21）。 该装置还包括被配置为接收从至少一个电子发射器发射的电子的电子接收部件（14）。 该装置还包括被构造成容纳至少一个电子发射器，加热元件和电子接收部件的抽真空的外壳（10）。 当加热元件处于导通状态并且所述至少一个电子发射器被负偏压时，所述至少一个电子发射器被配置为用于肖特基发射。

公开(公告)号：US09506881B2

公开(公告)日：2016-11-29

申请号：US14345656

申请日：2012-09-19

Applicant: MAPPER LITHOGRAPHY IP B.V.

Inventor： Marc Smits

IPC: G01N23/22 ,  G03F7/20 ,  H01J37/304 ,  H01J37/317 ,  B82Y10/00 ,  B82Y40/00 ,  G01N33/00

CPC classification number: G01N23/22 ,  B82Y10/00 ,  B82Y40/00 ,  G01N33/0004 ,  G03F7/70608 ,  G03F7/70916 ,  H01J37/304 ,  H01J37/3174 ,  H01J37/3177 ,  H01J2237/022 ,  H01J2237/31796

Abstract: A lithography system (10) comprising a radiation projection system (20) for projecting radiation onto a substrate, a substrate transport system (30) for loading and positioning the substrate to be processed in the path of the projected radiation, a control system (40) for controlling the substrate transport system to move the substrate, and a resist characterization system (50) arranged for determining whether a specific type of resist is suitable to be exposed by radiation within the lithography system. The resist characterization system (50) may be arranged for exposing the resist on a surface of the substrate with one or more radiation beams, measuring a mass distribution of molecular fragments emitted from the resist, predicting a growth rate of deposited molecular fragments on the basis of a growth rate model and the measured mass distribution, and comparing the expected growth rate with a predetermined threshold growth rate.

Abstract translation: 一种光刻系统（10），包括用于将辐射投射到基板上的辐射投影系统（20），用于在投影辐射的路径中加载和定位待处理基板的基板输送系统（30），控制系统 ），用于控制衬底传输系统以移动衬底;以及抗蚀剂表征系统（50），其布置成用于确定特定类型的抗蚀剂是否适于通过光刻系统内的辐射曝光。 抗蚀剂表征系统（50）可以布置成用一个或多个辐射束将抗蚀剂暴露在衬底的表面上，测量从抗蚀剂发射的分子片段的质量分布，从而预测基于沉积的分子片段的生长速率 的增长率模型和测量的质量分布，并将预期增长率与预定的阈值增长率进行比较。

公开(公告)号：US20160274039A1

公开(公告)日：2016-09-22

申请号：US15169691

申请日：2016-05-31

Applicant: KING ABDULAZIZ UNIVERSITY

Inventor： SAMIR ABDUL-MAJID ALZAIDI

IPC: G01N23/00 ,  G01N23/22

CPC classification number: G01N23/22 ,  G01N17/04 ,  G01N23/005 ,  G01N23/204

Abstract: The system for determining and imaging wax deposition and corrosion in pipelines relate to systems for determining wax deposition and corrosion by one or both of two techniques. In both techniques, a source of neutron radiation is directed at the pipeline. In one technique, a neutron detector surrounded by an absorption shield defining a collimation window counts neutrons reflected back to the detector by back diffusion or backscatter radiation. In the other technique, a gamma ray detector measures gamma rays emitted when the emitted neutrons are absorbed in the pipeline. A neutron moderator-reflector is placed around three sides of the pipeline to increase the likelihood of neutron capture. A gamma detector surrounded by a gamma absorption shield defining a collimation window counts neutron capture gamma rays. An energy window can be taken for selection of Fe and H gamma rays for high precision imaging.

Abstract translation: 用于确定和成像管道中蜡沉积和腐蚀的系统涉及通过两种技术中的一种或两种来确定蜡沉积和腐蚀的系统。 在这两种技术中，中子辐射源指向管道。 在一种技术中，由限定准直窗口的吸收屏蔽包围的中子探测器对通过反向扩散或反向散射辐射反射回检测器的中子进行计数。 在另一种技术中，伽马射线检测器测量发射的中子在管道中被吸收时发射的伽马射线。 中子减速器 - 反射器围绕管道的三侧放置，以增加中子俘获的可能性。 由伽马吸收罩围绕的伽马检测器限定准直窗计数中子俘获伽马射线。 可以采用能量窗用于选择Fe和Hγ射线用于高精度成像。

公开(公告)号：US09383197B2

公开(公告)日：2016-07-05

申请号：US14512613

申请日：2014-10-13

Applicant: General Electric Company

Inventor： Peter Joel Meschter ,  Lawrence Bernard Kool ,  James Albert Tallman

IPC: G01B15/02 ,  G01N23/22 ,  G01N23/225 ,  G01N23/20 ,  C23C16/34 ,  C23C16/40 ,  C23C14/24 ,  C23C14/06 ,  C23C14/08

CPC classification number: G01B15/02 ,  C23C14/0641 ,  C23C14/08 ,  C23C14/24 ,  C23C16/34 ,  C23C16/40 ,  C23C28/042 ,  C23C28/048 ,  G01N23/20 ,  G01N23/22 ,  G01N23/2252

Abstract: A system and method for measuring cooling effectiveness of a component is disclosed. The method includes providing a component having a surface provided with a coating including a volatilization-susceptible constituent and a volatilization-resistant constituent. Further, the method includes supplying a first gaseous medium over the surface of the component through a plurality of holes in the component and feeding a second gaseous medium along the surface of the component. The method includes exposing the surface of the component to the first and second gaseous mediums for a predetermined period. The method further includes determining a thickness of the coating exposed to the flow of the first and second gaseous mediums. The method includes analyzing the thickness of the coating to determine whether the coating is removed from the surface of the component upon exposure to the first and second gaseous mediums.

Abstract translation: 公开了一种用于测量部件的冷却效率的系统和方法。 该方法包括提供具有表面的组分，该表面具有包含易挥发成分和挥发性成分的涂层。 此外，该方法包括通过部件中的多个孔将部件表面上的第一气态介质供给到沿部件表面供给第二气态介质。 该方法包括将组分的表面暴露于第一和第二气体介质预定的时间段。 该方法还包括确定暴露于第一和第二气体介质的流动的涂层的厚度。 该方法包括分析涂层的厚度以确定在暴露于第一和第二气体介质时涂层是否从组分的表面移除。