公开(公告)号：US11867645B2

公开(公告)日：2024-01-09

申请号：US17285167

申请日：2019-10-18

Applicant: Security Matters LTD.

Inventor： Yair Grof ,  Dmitrijs Docenko ,  Mor Kaplinsky ,  Haggai Alon ,  Yifat Bareket ,  Michal Firstenberg ,  Avital Trachtman ,  Nachum Holin ,  Nadav Yoran

IPC: G01N23/2204 ,  G01N23/223 ,  G01N23/2206 ,  G01N23/22

CPC classification number: G01N23/223 ,  G01N23/22 ,  G01N23/2204 ,  G01N23/2206 ,  G01N2223/076 ,  G01N2223/0766 ,  G01N2223/507 ,  G01N2223/652

Abstract: In one embodiment, a system and a method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a movement path, as the substance moves along the movement path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of the overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.

公开(公告)号：US20210325323A1

公开(公告)日：2021-10-21

申请号：US17285167

申请日：2019-10-18

Applicant: Security Matters LTD.

Inventor： Yair Grof ,  Dmitrijs Docenko ,  Mor Kaplinsky ,  Haggai Alon ,  Yifat Bareket ,  Michal Firstenberg ,  Avital Trachtman ,  Nachum Holin ,  Nadav Yoran

IPC: G01N23/223

Abstract: In one embodiment, a system and method for inspecting a substance to detect and identify predetermined foreign element(s) in the substance. The foreign element may carry X-ray responding material compositions, emitting X-ray signals in response to primary exciting X-ray or Gamma-ray radiation. The inspection is performed during a relative displacement between the substance and an inspection zone, defined by an overlap region between a solid angle of emission of an X-ray/Gamma-ray source and a solid angle of detection of X-ray radiation, along a predetermined movement path, as the substance moves along said path, the detected X-ray radiation includes X-ray response signals from successive portions of the substance propagating towards, through, and out of said overlap region. Measured data indicative of X-ray response signals is analyzed to identify a signal variation pattern over time indicative of a location of at least one foreign element carrying an X-ray responsive marker.