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公开(公告)号:US11765905B2
公开(公告)日:2023-09-19
申请号:US17185168
申请日:2021-02-25
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungeun Choi , Jong-ho Moon , Han-sik Yoo , Kiseok Lee , Sung-hwan Jang , Seungjae Jung , Euichul Jeong , Taehyun An , Sangyeon Han , Yoosang Hwang
IPC: H10B43/40 , H01L23/522 , H01L23/528 , H10B41/10 , H10B41/20 , H10B41/40 , H10B43/10 , H10B43/20
CPC classification number: H10B43/40 , H01L23/5226 , H01L23/5283 , H10B41/10 , H10B41/20 , H10B41/40 , H10B43/10 , H10B43/20
Abstract: A semiconductor memory device may include a peripheral circuit structure including peripheral circuits integrated on a semiconductor substrate in a first region and a first keypad disposed in a second region; a stack provided on the first region of the peripheral circuit structure, the stack including a plurality of first conductive lines extending in a first direction and are vertically stacked; an upper insulating layer covering the stack; an interconnection layer provided on the upper insulating layer; a penetration plug spaced apart from the stack and is provided to penetrate the upper insulating layer to connect the interconnection layer to the peripheral circuits of the peripheral circuit structure; a molding structure provided on the second region of the peripheral circuit structure and spaced apart from the stack in the first direction; and a penetration structure provided to penetrate the molding structure and vertically overlap with the first keypad.
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公开(公告)号:US20230232618A1
公开(公告)日:2023-07-20
申请号:US18123736
申请日:2023-03-20
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyosub Kim , Keunnam Kim , Dongoh Kim , Bongsoo Kim , Euna Kim , Chansic Yoon , Kiseok Lee , Hyeonok Jung , Sunghee Han , Yoosang Hwang
IPC: H10B12/00
CPC classification number: H10B12/488 , H10B12/34 , H10B12/053 , H10B12/315 , H10B12/482
Abstract: A semiconductor device includes: an active region defined by a device isolation layer formed in a substrate; a word line configured to cross the active region, the word line extending in a first direction and being formed in the substrate; a bit line extending in a second direction perpendicular to the first direction on the word line; a first contact connecting the bit line to the active region; a first mask for forming the active region, the first mask being formed on the active region; and a second mask of which a height of a top surface thereof is greater than a height of a top surface of the active region, the second mask covering the word line, wherein the active region has a bar shape that extends to form an acute angle with respect to the first direction.
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公开(公告)号:US20230232616A1
公开(公告)日:2023-07-20
申请号:US18186593
申请日:2023-03-20
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jiseok HONG , Sangho Lee , Seoryong Park , Jiyoung Ahn , Kiseok Lee , Kiseok Lee , Yoonyoung Choi , Seunguk Han
IPC: H10B12/00
CPC classification number: H10B12/485 , H10B12/315 , H10B12/0335 , H10B12/482
Abstract: An integrated circuit device includes: a substrate including a plurality of active regions; a bit line extending on the substrate in a horizontal direction; a direct contact connected between a first active region selected among the plurality of active regions and the bit line; an inner oxide layer contacting a sidewall of the direct contact; and a carbon-containing oxide layer nonlinearly extending on a sidewall of the bit line in a vertical direction, the carbon-containing oxide layer contacting the sidewall of the bit line.
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公开(公告)号:US11557596B2
公开(公告)日:2023-01-17
申请号:US17192086
申请日:2021-03-04
Applicant: Samsung Electronics Co., Ltd.
Inventor: Seoryong Park , Seunguk Han , Jiyoung Ahn , Kiseok Lee , Yoonyoung Choi , Jiseok Hong
IPC: H01L27/11551 , H01L27/11519 , G11C8/14 , H01L27/11578 , G11C7/18 , H01L27/11565
Abstract: A semiconductor memory device includes a substrate with a cell array region, a first interface region, and a second interface region, the cell array region being provided with active regions, bit lines on the cell array region and the second interface region, dielectric patterns on top surfaces of the bit lines and extending along the top surfaces of the bit lines and further extending onto the first interface region, a device isolation pattern on the substrate, and including a first portion on the cell array region and a second portion on the first interface region, the first portion defining the active regions, the second portion being provided with first recesses, and each first recess being disposed between two adjacent dielectric patterns, and first sacrificial semiconductor patterns disposed on the first interface region and in the first recesses. The first sacrificial semiconductor patterns include polycrystalline silicon.
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公开(公告)号:US11242031B2
公开(公告)日:2022-02-08
申请号:US16487965
申请日:2018-02-01
Applicant: Samsung Electronics Co., Ltd.
Inventor: Kwanghoon Han , Kiseok Lee , Janghee Lee , Sungmin Jo , Ho Yang , Myounghwan Lee
Abstract: A key authentication method of an apparatus is provided. The key authentication method includes receiving a signal from a terminal using a plurality of communication modules, determining whether the terminal is within a predetermined distance from the apparatus, on the basis of each signal received via the plurality of communication modules, and changing a control mode of a vehicle on which the apparatus is mounted, on the basis of whether the terminal is within the predetermined distance from the apparatus.
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公开(公告)号:US11201156B2
公开(公告)日:2021-12-14
申请号:US16934874
申请日:2020-07-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Chan-Sic Yoon , Dongoh Kim , Kiseok Lee , Sunghak Cho , Jemin Park
IPC: H01L27/108 , H01L21/762 , H01L21/311
Abstract: A semiconductor device includes a substrate that includes a cell region and a peripheral circuit region, a cell insulating pattern disposed in the cell region of the substrate that defines a cell active region, and a peripheral insulating pattern disposed in the peripheral circuit region of the substrate that defines a peripheral active region. The peripheral insulating pattern includes a first peripheral insulating pattern having a first width and a second peripheral insulating pattern having a second width greater than the first width. A topmost surface of at least one of the first peripheral insulating pattern and the second peripheral insulating pattern is positioned higher than a topmost surface of the cell insulating pattern.
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公开(公告)号:US20210066305A1
公开(公告)日:2021-03-04
申请号:US16896470
申请日:2020-06-09
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyosub Kim , Keunnam Kim , Dongoh Kim , Bongsoo Kim , Euna Kim , Chansic Yoon , Kiseok Lee , Hyeonok Jung , Sunghee Han , Yoosang Hwang
IPC: H01L27/108 , H01L23/528
Abstract: A semiconductor device includes: an active region defined by a device isolation layer formed in a substrate; a word line configured to cross the active region, the word line extending in a first direction and being formed in the substrate; a bit line extending in a second direction perpendicular to the first direction on the word line; a first contact connecting the bit line to the active region; a first mask for forming the active region, the first mask being formed on the active region; and a second mask of which a height of a top surface thereof is greater than a height of a top surface of the active region, the second mask covering the word line, wherein the active region has a bar shape that extends to form an acute angle with respect to the first direction.
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公开(公告)号:US10861854B2
公开(公告)日:2020-12-08
申请号:US16707019
申请日:2019-12-09
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jiyoung Kim , Kiseok Lee , Bong-Soo Kim , Junsoo Kim , Dongsoo Woo , Kyupil Lee , HyeongSun Hong , Yoosang Hwang
IPC: H01L27/108 , H01L27/06 , H01L49/02
Abstract: Semiconductor memory devices are provided. A semiconductor memory device includes a substrate. The semiconductor memory device includes a plurality of memory cell transistors vertically stacked on the substrate. The semiconductor memory device includes a first conductive line connected to a source region of at least one of the plurality of memory cell transistors. The semiconductor memory device includes a second conductive line connected to a plurality of gate electrodes of the plurality of memory cell transistors. Moreover, the semiconductor memory device includes a data storage element connected to a drain region of the at least one of the plurality of memory cell transistors.
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公开(公告)号:US10790186B2
公开(公告)日:2020-09-29
申请号:US15984524
申请日:2018-05-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Jiseok Hong , Chan-Sic Yoon , Ilyoung Moon , Jemin Park , Kiseok Lee , Jung-Hoon Han
IPC: H01L21/768 , H01L23/532 , H01L23/522
Abstract: A method of fabricating a semiconductor device includes providing a substrate, and forming an interlayered insulating layer on the substrate. The method includes forming a preliminary via hole in the interlayered insulating layer. The method includes forming a passivation spacer on an inner side surface of the preliminary via hole. The method includes forming a via hole using the passivation spacer as an etch mask. The method includes forming a conductive via in the via hole. The passivation spacer includes an insulating material different from an insulating material included in the interlayered insulating layer.
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公开(公告)号:US10535659B2
公开(公告)日:2020-01-14
申请号:US16038052
申请日:2018-07-17
Applicant: Samsung Electronics Co., Ltd.
Inventor: Jiyoung Kim , Kiseok Lee , Bong-Soo Kim , Junsoo Kim , Dongsoo Woo , Kyupil Lee , HyeongSun Hong , Yoosang Hwang
IPC: H01L27/108 , H01L27/06 , H01L49/02
Abstract: Semiconductor memory devices are provided. A semiconductor memory device includes a substrate. The semiconductor memory device includes a plurality of memory cell transistors vertically stacked on the substrate. The semiconductor memory device includes a first conductive line connected to a source region of at least one of the plurality of memory cell transistors. The semiconductor memory device includes a second conductive line connected to a plurality of gate electrodes of the plurality of memory cell transistors. Moreover, the semiconductor memory device includes a data storage element connected to a drain region of the at least one of the plurality of memory cell transistors.
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