OSCILLATOR CIRCUIT WITH OPEN LOOP FREQUENCY MODULATION

    公开(公告)号:US20240283433A1

    公开(公告)日:2024-08-22

    申请号:US18171413

    申请日:2023-02-20

    IPC分类号: H03K3/03 H03K3/014 H03K5/135

    摘要: An oscillator circuit includes a ring oscillator and a ramp generator. The ring oscillator includes a first inverter and a second inverter. The first inverter has and a first inverter input, a first inverter output, and a first power terminal. The second inverter has a second inverter input, a second inverter output, and a second power terminal. The second inverter input is coupled to the first inverter output and the second inverter output is coupled to the first inverter input. The ramp generator circuit has a ramp output coupled to the first power terminal and the second power terminal.

    Silicon test structures for separate measurement of NMOS and PMOS transistor delays

    公开(公告)号:US12044732B2

    公开(公告)日:2024-07-23

    申请号:US17494614

    申请日:2021-10-05

    摘要: Silicon test structures are described that enable separate measurement of n-channel metal-oxide semiconductor (NMOS) and p-channel metal-oxide semiconductor (PMOS) transistor delays. NMOS and PMOS specific non-inverting stages may be used to construct a multi-stage ring oscillator. Each of the non-inverting stages generates either a rising or falling primary transition that is determined by either NMOS or PMOS transistors, respectively. The opposing transition for a particular non-inverting stage is triggered by propagation of the primary transition to a subsequent non-inverting stage (producing a “reset” pulse). A frequency of the ring oscillator is determined by the primary transition and one transistor type (NMOS or PMOS). Specifically, the frequency is determined by the propagation delay of the primary transition through the entire ring oscillator.

    SYSTEM WITH A LOW-DRIFT ON-CHIP OSCILLATOR WITH LOWERED SENSITIVITY TO RANDOM TELEGRAPH NOISE

    公开(公告)号:US20240204758A1

    公开(公告)日:2024-06-20

    申请号:US18503241

    申请日:2023-11-07

    IPC分类号: H03K3/03 H03K3/01

    CPC分类号: H03K3/0315 H03K3/01

    摘要: A system with a low-drift on-chip (LD-RC) oscillator with lowered sensitivity to Random Telegraph Noise when generating a current (Id) for the LD-RC oscillator. A control resistor (R) is connected through an intermediary arrangement to one of a first MOS transistor (M1) or of a second MOS transistor (M2) between two terminals of a supply voltage source (Vdd). The gate of the first MOS transistor (M1) is connected to the gate of the second MOS transistor (M2), whereas the source of the first MOS transistor (M1) and the source of the second MOS transistor (M2) are connected to one terminal of the supply voltage source (Vdd), the control resistor (R) being connected to the other opposite terminal of the supply voltage source.

    SENSING CIRCUIT AND SENSING METHOD THEREOF
    4.
    发明公开

    公开(公告)号:US20240171160A1

    公开(公告)日:2024-05-23

    申请号:US18165350

    申请日:2023-02-07

    IPC分类号: H03K3/354 H03K3/03

    CPC分类号: H03K3/354 H03K3/0315

    摘要: A sensing circuit coupled to a sensor includes a first transistor, a second transistor, a third transistor, a fourth transistor, and an oscillator. The first transistor, coupled to a first current source and the sensor, receives a sensing current from the sensor. A gate terminal of the first transistor is connected to a source terminal of the first transistor. The second transistor, coupled to the first transistor and a second current source, generates a first current according to the sensing current. The first current is greater than the sensing current. The third transistor, coupled to the second transistor and the second current source, generates a second current according to the first current. The fourth transistor, coupled to the third transistor, generates a third current. The oscillator is coupled to the fourth transistor. The oscillator generates a signal having an oscillation frequency according to the third current.

    Circuit structures to measure flip-flop timing characteristics

    公开(公告)号:US11923853B2

    公开(公告)日:2024-03-05

    申请号:US17680763

    申请日:2022-02-25

    申请人: NVIDIA Corp.

    摘要: A ring oscillator circuit with a frequency that is sensitive to the timing of a clock-to-Q (clk2Q) propagation delay of one or more flip-flops utilized in the ring oscillator. The clock2Q is the delay between the clock signal arriving at the clock pin on the flop and the Q output reflecting the state of the input data signal to the flop. Clk2q delay measurements are made based on measurement of the ring oscillator frequency, leading to more accurate estimates of clk2Q for different types of flip-flops and flip-flop combinations, which may in turn enable improvements in circuit layouts, performance, and area.

    CLOCK GENERATOR CIRCUIT FOR NEAR FIELD COMMUNICATION DEVICE

    公开(公告)号:US20240014809A1

    公开(公告)日:2024-01-11

    申请号:US18345726

    申请日:2023-06-30

    IPC分类号: H03K3/03 H03K5/1252

    CPC分类号: H03K3/0315 H03K5/1252

    摘要: A clock generator circuit includes an oscillator circuit coupled to a bias circuit. The bias circuit includes a current mirror, third and fourth transistors, and a cascode transistor. The current mirror includes a reference transistor and a set of copy transistors that are programmable. The third transistor has a source connected to a cold spot, a drain and a gate connected to this drain. The fourth transistor has a source connected to the drain of the third transistor, a drain, and a gate connected to that drain. The cascode transistor has a source connected to a drain of at least one of the copy transistors, a drain, and a gate connected to the gate of the fourth transistor. The gates of the fourth transistor and the cascode transistor are thicker than the gates of the reference transistor, each copy transistor, and the third transistor.