Applications of adaptive microelectronic circuits that are designed for testability

    公开(公告)号:US12085611B2

    公开(公告)日:2024-09-10

    申请号:US17285614

    申请日:2018-10-16

    摘要: The performance of a microelectronic circuit can be configured by making an operating parameter assume an operating parameter value. An operating method comprises selectively setting the microelectronic circuit into a test mode that differs from a normal operating mode of the microelectronic circuit, and utilizing said test mode to input test input signals consisting of test input values into one or more adaptive processing paths within the microelectronic circuit. An adaptive processing path comprises processing logic and register circuits configured to produce output values from input values input to them. The performance of such an adaptive processing path can be configured by making an operating parameter assume an operating parameter value. The method comprises making said one or more adaptive processing paths form test output values on the basis of the respective test input values input to them, and forming a set of test output signals by collecting said test output values given by said one or more adaptive processing paths. The method comprises examining said set of test output signals, and forming a test result on the basis of said examining, and using said test result to select and set an operating parameter value for said operating parameter.

    ACCURATE CLOCK EDGE CALIBRATION OVER PVT CORNERS

    公开(公告)号:US20240288831A1

    公开(公告)日:2024-08-29

    申请号:US18173560

    申请日:2023-02-23

    IPC分类号: G01R31/317

    摘要: A method implemented by a multi-chip package (MCP) electronic device including a die-to-die (D2D) interface is provided. The method includes receiving, by a receiver portion of a first die of the D2D interface, and from a transmitter portion of a second die of the D2D interface, a first timing signal and a second timing signal. The method includes performing a calibration of the second timing signal by generating a timing calibration signal based on a timing value corresponding to a midpoint of an estimated margin between overlaying segments of the first timing signal and a timing value corresponding to a delay of a unit delay of an oscillator associated with the receiver portion and outputting the timing calibration signal. The timing calibration signal is configured to cause a rising edge of the second timing signal to correspond to a midpoint of a pulse width of the first timing signal.

    ACCURATE CLOCK CALIBRATION FOR DIE-TO-DIE (D2D) INTERFACES

    公开(公告)号:US20240288494A1

    公开(公告)日:2024-08-29

    申请号:US18173548

    申请日:2023-02-23

    IPC分类号: G01R31/317

    CPC分类号: G01R31/31725 G01R31/31727

    摘要: A method implemented by a multi-chip package (MCP) electronic device including a die-to-die (D2D) interface is provided. The method includes receiving, by a receiver portion of a first die of the D2D interface, and from a transmitter portion of a second die of the D2D interface, a first timing signal and a second timing signal. The method includes performing a first calibration of one or more of the first timing signal or the second timing signal. The first calibration is configured to align a first rising edge of the first timing signal with a second rising edge of the second timing signal. The method includes performing a second calibration of the second timing signal. The second calibration is configured to offset the second rising edge of the second timing signal with respect to the first rising edge of the first timing signal by a predetermined time period.

    Clock Insertion Delay Systems and Methods
    4.
    发明公开

    公开(公告)号:US20240183902A1

    公开(公告)日:2024-06-06

    申请号:US18526943

    申请日:2023-12-01

    IPC分类号: G01R31/317 G01R31/3185

    摘要: Various techniques are provided to efficiently synchronize clock and data signals in programmable logic devices (PLDs). In one example, a method comprises configuring an intellectual property (IP) block of the PLD to receive a first clock signal and a first data signal at a first component of the IP block, determining a delay associated with the first clock signal between a first input and the first component, configuring a programmable logic cell (PLC) to receive a second clock signal and output the first data signal to the IP block, determining a delay period to synchronize the first clock signal and the first data signal at the first component of the IP block, and configuring an adjustable delay element to apply the delay period to the second clock signal to synchronize the first clock signal and the first data signal at the first component of the IP block.

    ELECTRONIC DEVICE AND METHOD FOR PERFORMING CLOCK GATING IN ELECTRONIC DEVICE

    公开(公告)号:US20240110976A1

    公开(公告)日:2024-04-04

    申请号:US18376001

    申请日:2023-10-03

    IPC分类号: G01R31/317

    摘要: An electronic device and a method for performing clock gating in the electronic device are provided. The electronic device includes at least one function circuit, a device under test (DUT) circuit and at least one gating circuit. The function circuit is configured to operate according to at least one primary clock, and the DUT circuit is configured to operate according to at least one secondary clock. In addition, the clock gating circuit is configured to control whether to enable the primary clock according to at least one primary enable signal, and control whether to enable the secondary clock according to the primary enable signal and a secondary enable signal.

    Register circuit with detection of data events, and method for detecting data events in a register circuit

    公开(公告)号:US11894848B2

    公开(公告)日:2024-02-06

    申请号:US17311186

    申请日:2018-12-05

    摘要: A monitor circuit (301) for monitoring changes in an input digital value of a register circuit comprises a data input (302) configured to receive a copy of the input digital value of said register circuit, and one or more triggering signal inputs (303) configured to receive one or more triggering signals. One or more triggering edges thereof define an allowable time limit before which a digital value must appear at a data input of said register circuit to become properly stored in said register circuit. The monitor circuit comprises a data event (DE) output (305), so that said monitor circuit is configured to produce a DE signal at said DE output (305) in response to a digital value at said data input (302) changing within a time window defined by said one or more triggering signals.

    DIE-TO-DIE CONNECTIVITY MONITORING USING A CLOCKED RECEIVER

    公开(公告)号:US20230393196A1

    公开(公告)日:2023-12-07

    申请号:US18089541

    申请日:2022-12-27

    申请人: PROTEANTECS LTD.

    IPC分类号: G01R31/317 G01R31/28

    CPC分类号: G01R31/31725 G01R31/2882

    摘要: An I/O sensor including: a programmable delay line; a delayed clocked receiver having the following inputs: (a) a data signal and a reference voltage that also serve as inputs to a reference clocked receiver that is configured to sample the data signal received from an interconnect lane between two integrated circuits (ICs) of a multi-IC module, and (b) a delayed clock signal received from the programmable delay line, wherein the delayed clock signal is a delayed version of a clock signal that clocks the reference clocked receiver; a comparison circuits configured to compare a data signal output of the delayed clocked receiver and a data signal output of the reference clocked receiver; and a controller configured, based on a comparison result of the comparison circuit and on the amount of delay that caused it, to estimate a quality of connectivity between the two ICs over the interconnect lane.