Abstract:
A test decompressor and a test method thereof for converting original input data of one single test input into test vectors for testing a circuit under test (CUT) containing scan chains are revealed. The test decompressor includes a test data spreader, a test configuration switch, and a test controller. The test data spreader converts the original input data into a plurality of test data. The test configuration switch receives the original input data and the plurality of test data and transfers these data to scan chains of the CUT. The test controller receives the original input data and outputs a select signal to the test configuration switch for switching current test configuration to another test configuration. The scan chains in the CUT are divided into several scan groups and the scan chains in each scan group share the same test data. Thus the test data volume can be significantly reduced.
Abstract:
Embodiments relate to pre-silicon device testing using a persistent command table. An aspect includes receiving a value for a persistent command parameter from a user. Another aspect includes determining whether the value of the persistent command parameter is greater than zero. Another aspect includes based on determining whether the value of the persistent command parameter is greater than zero, selecting a number of commands equal to the value of the persistent command parameter from a regular command table of a driver of a device under test. Another aspect includes adding the selected commands to the persistent command table of the driver. Another aspect includes performing testing of the device under test via the driver using only commands that are in the persistent command table of the driver.
Abstract:
A condition monitoring device for an extracted-gas compression system including a compressor which increases pressure of extracted gas includes: a sensor for detecting a state quantity of the extracted gas flowing into the compressor; an erosion progression level calculation unit for calculating an erosion progression level of the compressor on the basis of the state quantity of the extracted gas; and a service life evaluation unit for evaluating a service life of the compressor on the basis of the erosion progression level of the compressor.
Abstract:
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for remote testing. In one aspect, a method includes receiving a first message from a first user device indicating initialization of a client application. The method includes determining that the first user device is a member of a first testing group. The method includes identifying a first testing component associated with the first testing group and capable of altering the client application. The method includes sending the first testing component to the first user device.
Abstract:
Novel instructions, logic, methods and apparatus are disclosed to test transactional execution status. Embodiments include decoding a first instruction to start a transactional region. Responsive to the first instruction, a checkpoint for a set of architecture state registers is generated and memory accesses from a processing element in the transactional region associated with the first instruction are tracked. A second instruction to detect transactional execution of the transactional region is then decoded. An operation is executed, responsive to decoding the second instruction, to determine if an execution context of the second instruction is within the transactional region. Then responsive to the second instruction, a first flag is updated. In some embodiments, a register may optionally be updated and/or a second flag may optionally be updated responsive to the second instruction.
Abstract:
An asynchronous integrated circuit is designed from a library of cells comprising at least one cell having parameters of signal propagation between a first terminal and a second terminal and between the second terminal and a third terminal depending on the parameter of signal propagation between the first and the third terminal. A synchronous integrated circuit corresponding to the asynchronous integrated circuit is synthesized using said cell to represent a portion of the asynchronous circuit, said cell being rated by a dummy clock signal. The synthesized integrated circuit is verified using the parameter of signal propagation between the first terminal and the third terminal to simulate the operation of said portion of the asynchronous circuit.
Abstract:
A chassis platform, such as processor or a system-on-chip (SoC), includes logic to implement a debug chassis security system including a policy generator to control access from a test access port. The policy generator may distribute a debug policy to at least one logic block that locally enforces the debug policy. The debug policy may include a delayed authentication policy in which debug assets are distributed and the chassis platform is initially locked to prevent debug access via the test access port. An authenticated debug user may unlock the chassis platform at a later time to enable debugging operations. The debug policy may also include a live execution policy and an immediate debug policy.
Abstract:
Novel instructions, logic, methods and apparatus are disclosed to test transactional execution status. Embodiments include decoding a first instruction to start a transactional region. Responsive to the first instruction, a checkpoint for a set of architecture state registers is generated and memory accesses from a processing element in the transactional region associated with the first instruction are tracked. A second instruction to detect transactional execution of the transactional region is then decoded. An operation is executed, responsive to decoding the second instruction, to determine if an execution context of the second instruction is within the transactional region. Then responsive to the second instruction, a first flag is updated. In some embodiments, a register may optionally be updated and/or a second flag may optionally be updated responsive to the second instruction.
Abstract:
Error data is read from error registers and written into a buffer. A computing node uses a BIOS to read the error data, rearm the error register and write the data into a memory mapped buffer. A hub chip supports creation of a shared memory system of computing nodes. A management controller in the computing node extracts error data from the buffer. The error data preferably consists essentially of the error register identifiers and the contents of the error registers. A system management node receives the error data from the management controllers in the computing nodes. The system management node may be coupled to but separate from the computing nodes.
Abstract:
A method for testing a system-on-a-chip (SoC) is described. The method includes parsing a file to determine functions to be performed components of the SoC. The method further includes receiving a desired output of the SoC and generating a test scenario model based on the desired output of the SoC. The test scenario model includes a plurality of module representations of the functions and includes one or more connections between two of the module representations. The desired output acts as a performance constraint for the test scenario model. The test scenario model further includes an input of the SoC that is generated based on the desired output, the module representations, and the one or more connections. The test scenario model includes a path from the input via the module representations and the connections to the desired output.