FLAT PANEL DISPLAY APPARATUS AND METHOD FOR MANUFACTURING THE FLAT PANEL DISPLAY APPARATUS
    4.
    发明申请
    FLAT PANEL DISPLAY APPARATUS AND METHOD FOR MANUFACTURING THE FLAT PANEL DISPLAY APPARATUS 有权
    平板显示装置和制造平板显示装置的方法

    公开(公告)号:US20140353669A1

    公开(公告)日:2014-12-04

    申请号:US14061359

    申请日:2013-10-23

    CPC classification number: H01L27/124 H01L27/1259

    Abstract: A display apparatus includes an active layer that overlaps a substrate and comprises a channel region. The display apparatus further includes an insulating layer disposed on the substrate and the active layer. The display apparatus further includes a gate electrode disposed on the insulating layer, overlapping the channel region, and comprising a first gate electrode layer and a second gate electrode layer, wherein the first gate electrode layer is formed of a first material and is disposed between the insulating layer and the second electrode layer, and wherein the second gate electrode layer is formed of a second material that is different from the first material. The display apparatus further includes a contact portion disposed on the insulating layer and comprising a first contact layer that is formed of the first material. The display apparatus further includes a pixel electrode that contacts the first contact layer.

    Abstract translation: 显示装置包括与衬底重叠并包括沟道区的有源层。 显示装置还包括设置在基板和有源层上的绝缘层。 显示装置还包括设置在绝缘层上的栅电极,与沟道区重叠,并且包括第一栅电极层和第二栅极电极层,其中第一栅极电极层由第一材料形成, 绝缘层和第二电极层,并且其中第二栅电极层由与第一材料不同的第二材料形成。 显示装置还包括设置在绝缘层上并包括由第一材料形成的第一接触层的接触部分。 显示装置还包括与第一接触层接触的像素电极。

    METHOD AND SYSTEM FOR MONITORING CRYSTALLIZATION OF AMORPHOUS SILICON THIN FILM, AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR BY USING THE METHOD AND SYSTEM
    5.
    发明申请
    METHOD AND SYSTEM FOR MONITORING CRYSTALLIZATION OF AMORPHOUS SILICON THIN FILM, AND METHOD OF MANUFACTURING THIN FILM TRANSISTOR BY USING THE METHOD AND SYSTEM 有权
    用于监测非晶硅薄膜的结晶的方法和系统,以及使用方法和系统制造薄膜晶体管的方法

    公开(公告)号:US20140329343A1

    公开(公告)日:2014-11-06

    申请号:US14022126

    申请日:2013-09-09

    CPC classification number: H01L21/268 H01L21/02532 H01L21/02667 H01L22/12

    Abstract: A method and system for monitoring crystallization of an amorphous silicon (a-Si) thin film, and a method of manufacturing a thin film transistor (TFT) by using the method and system are disclosed. The method of monitoring the crystallization of the a-Si thin film includes: irradiating light from a light source onto a monitoring a-Si thin film to anneal the monitoring a-Si thin film; annealing the monitoring a-Si thin film and concurrently measuring a Raman scattering spectrum of light scattered by the monitoring a-Si thin film at set time intervals; and calculating a crystallization characteristic value of the monitoring a-Si thin film based on the Raman scattering spectrum.

    Abstract translation: 公开了一种用于监测非晶硅(a-Si)薄膜的结晶的方法和系统,以及通过使用该方法和系统制造薄膜晶体管(TFT)的方法。 监测a-Si薄膜结晶的方法包括:将来自光源的光照射到监测a-Si薄膜上,使监测a-Si薄膜退火; 对监测的a-Si薄膜进行退火,同时测量由监测a-Si薄膜以设定的时间间隔散射的光的拉曼散射光谱; 并基于拉曼散射光谱计算监测a-Si薄膜的结晶特征值。

    Method and system for monitoring crystallization of amorphous silicon thin film, and method of manufacturing thin film transistor by using the method and system
    6.
    发明授权
    Method and system for monitoring crystallization of amorphous silicon thin film, and method of manufacturing thin film transistor by using the method and system 有权
    用于监测非晶硅薄膜结晶的方法和系统,以及使用该方法和系统制造薄膜晶体管的方法

    公开(公告)号:US09257288B2

    公开(公告)日:2016-02-09

    申请号:US14022126

    申请日:2013-09-09

    CPC classification number: H01L21/268 H01L21/02532 H01L21/02667 H01L22/12

    Abstract: A method and system for monitoring crystallization of an amorphous silicon (a-Si) thin film, and a method of manufacturing a thin film transistor (TFT) by using the method and system are disclosed. The method of monitoring the crystallization of the a-Si thin film includes: irradiating light from a light source onto a monitoring a-Si thin film to anneal the monitoring a-Si thin film; annealing the monitoring a-Si thin film and concurrently measuring a Raman scattering spectrum of light scattered by the monitoring a-Si thin film at set time intervals; and calculating a crystallization characteristic value of the monitoring a-Si thin film based on the Raman scattering spectrum.

    Abstract translation: 公开了一种用于监测非晶硅(a-Si)薄膜的结晶的方法和系统,以及通过使用该方法和系统制造薄膜晶体管(TFT)的方法。 监测a-Si薄膜结晶的方法包括:将来自光源的光照射到监测a-Si薄膜上,使监测a-Si薄膜退火; 对监测的a-Si薄膜进行退火,同时测量由监测a-Si薄膜以设定的时间间隔散射的光的拉曼散射光谱; 并基于拉曼散射光谱计算监测a-Si薄膜的结晶特征值。

    Organic light emitting diode display device and method of manufacturing the same
    7.
    发明授权
    Organic light emitting diode display device and method of manufacturing the same 有权
    有机发光二极管显示装置及其制造方法

    公开(公告)号:US09202856B2

    公开(公告)日:2015-12-01

    申请号:US14065085

    申请日:2013-10-28

    CPC classification number: H01L27/3279 H01L27/124 H01L27/3248

    Abstract: An organic light emitting diode display device is disclosed. The device includes, for example, a thin film transistor with an active layer on a substrate, a gate electrode, a source electrode, and a drain electrode, a pixel electrode formed on the same layer as the gate electrode, an electrode pattern partially exposing the pixel electrode and formed on the pixel electrode, a pixel electrode contact formed between the electrode pattern and the drain electrode and electrically connected to the drain electrode, a pixel defining film exposing the pixel electrode and formed to cover the drain electrode and the source electrode, an intermediate layer formed on the exposed pixel electrode and including an emissive layer, and an opposite electrode formed opposite the pixel electrode to at least partially cover the intermediate layer. A method of manufacturing the device is also disclosed.

    Abstract translation: 公开了一种有机发光二极管显示装置。 该器件例如包括在衬底上具有有源层的薄膜晶体管,栅电极,源电极和漏电极,形成在与栅电极相同的层上的像素电极,电极图案部分曝光 所述像素电极形成在所述像素电极上,形成在所述电极图案和所述漏电极之间并与所述漏电极电连接的像素电极接触件,所述像素限定膜暴露所述像素电极并形成为覆盖所述漏电极和所述源电极 形成在曝光的像素电极上并包括发光层的中间层,以及与像素电极相对形成的至少部分覆盖中间层的相对电极。 还公开了一种制造该器件的方法。

    Flat panel display apparatus and method for manufacturing the flat panel display apparatus
    8.
    发明授权
    Flat panel display apparatus and method for manufacturing the flat panel display apparatus 有权
    平板显示装置及其制造方法

    公开(公告)号:US09171865B2

    公开(公告)日:2015-10-27

    申请号:US14061359

    申请日:2013-10-23

    CPC classification number: H01L27/124 H01L27/1259

    Abstract: A display apparatus includes an active layer that overlaps a substrate and comprises a channel region. The display apparatus further includes an insulating layer disposed on the substrate and the active layer. The display apparatus further includes a gate electrode disposed on the insulating layer, overlapping the channel region, and comprising a first gate electrode layer and a second gate electrode layer, wherein the first gate electrode layer is formed of a first material and is disposed between the insulating layer and the second electrode layer, and wherein the second gate electrode layer is formed of a second material that is different from the first material. The display apparatus further includes a contact portion disposed on the insulating layer and comprising a first contact layer that is formed of the first material. The display apparatus further includes a pixel electrode that contacts the first contact layer.

    Abstract translation: 显示装置包括与衬底重叠并包括沟道区的有源层。 显示装置还包括设置在基板和有源层上的绝缘层。 显示装置还包括设置在绝缘层上的栅电极,与沟道区重叠,并且包括第一栅电极层和第二栅极电极层,其中第一栅极电极层由第一材料形成, 绝缘层和第二电极层,并且其中第二栅电极层由与第一材料不同的第二材料形成。 显示装置还包括设置在绝缘层上并包括由第一材料形成的第一接触层的接触部分。 显示装置还包括与第一接触层接触的像素电极。

Patent Agency Ranking