摘要:
A method of repairing a defect in an integrated electronic circuit caused by an incorrect lithographic mask includes the formation of an electrical isolation between two conducting parts of the circuit. The electrical isolation is obtained by at least partly filling, with an electrically insulating material, a volume hollowed out beforehand which would otherwise, and incorrectly, form an electrical connection between the two conducting parts. To do this, a mask having an aperture revealing the hollowed out volume is formed on the circuit, and the mask used to direct the filling of the electrically insulating material and correction of the lithography defined defect.
摘要:
A one-time programmable, dual-bit memory device comprises one MOS storage transistor having a semiconductor substrate, first and second active regions formed under the surface of the substrate being separated by a part of the substrate forming a channel region, a gate formed on the surface of the said substrate in line with the channel region and whose respective distal ends are aligned with a part of the first active region and with a part of the second active region, respectively, which gate is permanently held at ground potential, and a gate oxide layer running between the gate and the surface of the substrate. The intact or broken down state between the gate and the first active region determines a stored value of a first bit, and the intact or broken down state between the gate and the second active region determines a stored value of a second bit.
摘要:
An integrated circuit comprising a semiconductor substrate in which active areas surround or are surrounded by hollowings filled with an insulator, and in which a conductive region is embedded in the insulator of at least one hollowing, the conductive region being connected to a reference voltage and being connected at least one neighboring element of the circuit.
摘要:
A circuit, indicating the first or last signal activated among n signals, includes flip-flops respectively associated with pairs of signals, a first signal of each pair being applied to a reset input of a flip-flop and a second signal of each pair being applied to a set input. Logic gates are respectively associated with each considered signal and are connected to indicate whether the considered signal is the first or the last activated signal when the flip-flops associated with all the pairs of signals including the considered signal are at respective suitable states once the first or last signal is activated.
摘要:
An integrated circuit including an assembly of functional blocks and an interconnection network formed of at least N levels of conductive tracks separated by conductive via levels, the interconnection network including a power supply network comprising a first assembly of substantially parallel rails placed at the N-th track level, and a second assembly of substantially parallel rails placed at the (N−1)-th track level under the first rail assembly, the rails of the first assembly being non-parallel to those of the second assembly, the power supply network further including, for each functional block, a third assembly of power supply rails placed at the (N−2)-th track level above the elements of the considered block, and in which the rails of the second assembly form an acute angle smaller than 80° with the rails of each third rail assembly.
摘要:
A random access memory cell includes a pair of complementary bit lines, a bistable circuit including first and second complementary read/write terminals, and two storage nodes. The first storage node is provided by a first nMos transistor and a first pMos transistor, and the second storage node is provided by a second nMos transistor and a second pMos transistor. A first switch transistor is connected between the first terminal and one of the lines of the bit line pair, and a second switch transistor is connected between the second terminal and the other line (BL) of the bit line pair. The two nMos transistors of the bistable circuit have different threshold voltages.
摘要:
A static memory device includes at least one memory cell with two cross-coupled CMOS inverters to be connected to first and second voltages. The substrate of the NMOS transistor of a first CMOS inverter is electrically insulated from the substrate of the NMOS transistor of the second CMOS inverter. The two substrates can be biased with the first voltage. A clear flash controller flash clears the cells for temporarily bring the bias of the substrate of the NMOS transistor of the first CMOS inverter to the second voltage.
摘要:
A storage circuit using a dual-access memory, comprising means for alternately activating one access, then the other, with a maximum frequency equal to twice the maximum possible frequency of activation of a given access, at least two successive activations of said means controlling operations of the same type, reading or writing.
摘要:
An OTP memory cell in CMOS technology, including a capacitor associated in series with an unbalanced programming transistor, the drain of which is made of a region deeper and less doped than the source.
摘要:
A device checks the skew between two clock signals among a plurality of clock signals having the same frequency. The two clock signals of each possible pair of clock signals respectively enable two successive flip-flops that are initially set at distinct states. The whole set of the flip-flops is connected in a looped shift register configuration. An alarm signal is provided by an Exclusive-OR gate receiving the outputs of two successive flip-flops of the shift register.