摘要:
A power source voltage controller which can set the optimal margin for a replica circuit and shorten the time for the power source voltage to converge to the optimal value, having a replica circuit for monitoring a delay time of a critical path by propagating a reference signal having a power source voltage-delay characteristic approximately equivalent to a critical path in a semiconductor circuit, a phase difference detection circuit and an encoder receiving a delay signal by the replica circuit and the reference signal and detecting the phase difference of the delay signal from the reference signal and outputting the detection result as phase difference information, voltage control circuits for generating a power source voltage of a value based on a phase difference information signal and supplying it to the semiconductor circuit and the replica circuit, and a delay error correction circuit arranged at the input side of the reference signal of the replica circuit and correcting the delay difference with the critical path.
摘要:
In a single chip semiconductor memory, having independent memory areas for normal memory cells and redundant memory cells, the redundant cells are tested in a parallel or multi-bit test mode simultaneously with the normal cells they replace, by enabling the redundant memory area in response to simultaneous detection of the state of the multi-bit test mode, the presence of a programmed redundant bit for a memory cell under test, and the operative selection of the normal memory matrix.
摘要:
A current sensing, cascadable differential amplifier has a special bias circuit that provides a low impedance input and a high impedance output, whereby plural stages may be connected in cascade. Optionally, active current sources are used as pull-ups for the data lines, to increase the output impedance and improve the data line common mode level. The amplifier performs as a current sensing sense amplifier in a large scale, fast access semiconductor means and in this application, the memory does not need equalizing clock signals, nor is the access time slowed materially in the plural cascade stages.
摘要:
A semiconductor memory device including a plurality of memory cells arranged in a matrix; a plurality of bit lines; and a plurality of word lines controlled by column addresses for the same row addresses of the memory cells, wherein memory cells belonging to the same row are operatively connected to the bit lines by the plurality of word lines having the same row address and different column addresses.
摘要:
Clock signals of the same phase are formed even when signal delays occur in clock signals transmitted on a clock line. In a clock synchronizing circuit which synchronizes circuit elements using clock signals taken from a common clock line, the clock line is bent midway into a pair of clock lines, and a center phase signal generating means generates a clock signal having a phase which is in the center of two clock signals of differing phase obtained from arbitrary points on the pair of clock lines which are at equal distances from the point at which the clock line is bent over. By using pairs of clock signals of differing phases taken at equal distances from the bend over point, three clock signals all having equal phase are obtained.
摘要:
A current sensing, cascadable differential amplifier has a special bias circuit that provides a low impedance input and a high impedance output, whereby plural stages may be connected in cascade. Optionally, active current sources are used as pull-ups for the data lines, to increase the output impedance and improve the data line common mode level. The amplifier performs as a current sensing sense amplifier in a large scale, fast access semiconductor memory and in this application, the memory does not need equalizing clock signals, nor is the access time slowed materially in the plural cascade stages.
摘要:
A semiconductor device provided with a replica circuit functioning as an equivalent circuit to that of a path configuration selected as a critical path in the semiconductor circuit and an adjustable delay device for example between an output side of the replica circuit and a phase comparator, the delay value of the delay device being adjustable after production of the chip to a value enabling the replica system including the replica circuit to reliably operate with a margin from the critical path delay of the semiconductor circuit, whereby it becomes possible to prevent setting of an excessive margin and becomes possible to increase the margin when the margin ends up smaller than expected and therefore it becomes possible to flexibly and efficiently configure the replica circuit, and a method of constitution of the same.
摘要:
A precharge halt access mode system reduces the power consumed during sequential accesses of the memory cells within a memory block. During sequential accesses to the memory cells within a row of the memory block in a synchronous system, the bitlines within the memory are only precharged after the memory access to the last memory cell within the row is complete. After accesses to the other memory cells within the row, the precharging operation of the bitlines within the memory block is halted by a halt precharge logic circuit. Once the memory access to the last column within the memory block is detected the precharging of the bitlines is performed. During sequential accesses to the memory cells within a row in an asynchronous system, the bitlines within the memory block are only precharged during an access to the first memory cell within a row. A wordline disabling circuit will disable a wordline signal after an access to the first memory cell is complete. Each column includes a column gate which controls the accesses to each column and the activated memory cell. During a read operation, when a column gate is closed, the data on the bitlines of that column is coupled to inputs of a sense amplifier circuit. The sense amplifier circuit detects the sense of the data and generates an appropriate output. After each memory access operation to the memory block, the inputs to the sense amplifier are precharged. If a precharge halt access mode control signal is disabled the bitlines within a memory block are precharged after each memory access to the memory block.
摘要:
A power supply voltage control apparatus including an input signal generation circuit of wide uses or a small-sized monitor circuit of a novel configuration, and a semiconductor circuit and a method for driving the same, having a semiconductor circuit 11, an input signal generation circuit 12 able to change the phase difference i of a reference signal outφi and an input signal outφ0 in accordance with a control signal Si when generating the two signals from a clock, a monitor circuit 13 having a characteristic between a power supply voltage and delay the same as that of a critical path of the semiconductor circuit 11, propagating the input signal outφ0, and outputting a delayed signal outφ0′ to be delayed exactly by a time equivalent to a delay of the critical path (or smaller by a constant ratio), a delay detection circuit 14 for detecting a delay of the delayed signal outφ0′ relative to the reference signal outφi, and a power supply voltage control circuit 15 for controlling a power supply voltage VDD supplied to the semiconductor device 11 and the monitor circuit 13 based on the detection result.
摘要:
A semiconductor circuit capable of keeping the leakage current to a minimum while drawing out the effect of improvement of speed due to the lowering of the threshold voltage to a maximum, wherein delay paths to which low threshold voltage gate elements are applied are restricted to delay paths in a range from a maximum delay value before a lowering of a threshold voltage (at a higher speed than this) to a new maximum delay value in a case where low threshold voltage gate elements are applied to this (at a lower speed than this), whereby a leakage current due to low threshold voltage transistors can be kept to the minimum while drawing out the effect of improvement of speed due to the lowering of the threshold voltage to the maximum, thereby solving the problem of an unrequired leakage current applied to a chip over a wide range.