Abstract:
A monochromator has at least one optical grating which is rotatable in relation to incident light of a source of light, a drive unit to rotate the optical grating by a connected drive rod around a longitudinal axis, and a control unit to control the drive unit and thereby the rotation of the optical grating. The drive unit further has a first damping element with at least one electrical conductive surface, and a second damping element which provides at least one magnetic field having a magnetic axis which penetrates the electrical conductive surface. One of the first and second damping elements is fixed to the drive rod and is rotatable along with the drive rod around the longitudinal axis thereof in relation to the other one of the second or first damping element.
Abstract:
A spectrometer (1) comprises a light source (2), a monochromator (3) with at least one diffraction grating (4), a monochromator housing (5), an order sorting filter (7), a microplate receptacle (12) and a controller (6). The order sorting filter (7) of the spectrometer (1) comprises a substrate (23), a first optical thin film (24) and a second optical thin film (25), wherein, in a spatially partly overlapping and interference-free manner, the first optical thin film (24) is arranged on a first surface (26) and the second optical thin film (25) is arranged on a second surface (27) of the substrate (23). A spectrometer (1) equipped with a respective order sorting filter is used in a scanning method for detecting the absorption spectrum of samples examined in wells (14) of microplates (13).
Abstract:
The present invention relates to a multimode local probe microscope having a resonator (1), a first electrode (9), and a second electrode (8), an excitation source adapted to generate mechanical resonance in the resonator, a metal tip (4) fastened to the resonator, movement means for imparting relative movement between the local probe and a sample and adapted to bring the end of the tip to within a distance Z lying in the range 0 to 100 nm, and detector means for detecting at least one electrical signal representative of friction forces at the terminals of said electrodes (8, 9). According to the invention, said metal tip (4) is electrically connected to said output second electrode (9) and the microscopy apparatus includes amplifier and filter means for amplifying and filtering signals relating to the friction forces and to the tunnelling current in a single electronic circuit, and means for regulating the distance Z between the end of the tip and the surface of the sample.
Abstract:
A system and method for determining bias in a spectrometer is described. One embodiment includes a method for determining bias in a spectrometer system, the method comprising over-scanning a grating in a near-zero-response wavelength range; and determining a bias based on the over-scanning. This methodology allows for over-scanning a grating in a near-zero-response wavelength range as a substitute for using shutters or other mechanisms to block light from entering a detector in the system.
Abstract:
The present invention relates to a method and system for fiber positioning in wide-field astronomy. In one form the method and system of the present invention relate to anchoring fiber end points adjacent or against the field plate of a telescope. In one embodiment the positioning system for anchoring a fiber end point at a location on a telescope field plate collocated with a telescope focal plane, the positioning system comprising a piezoelectric positioning device for positioning the fiber end point, the positioning device comprising a chamber having an opening, the opening lying against the field plate in use defining a substantially enclosed volume inside the chamber, a pump for reducing pressure inside the enclosed volume; and a path connecting the pump and the enclosed volume so that, in use, the pump effects a reduction in pressure in the chamber thereby anchoring the fiber end point on the field plate.
Abstract:
Exemplary systems and methods for filtering an electromagnetic radiation can be provided. For example, at least one first arrangement can be provided which is capable of receiving at least one first electro-magnetic radiation and forwarding at least one second electro-magnetic radiation at different angles with respect to a direction of incidence of the first electro-magnetic radiation. At least one second wavelength dispersion arrangement can be provided which is configured to receive the second electro-magnetic radiation, forward at least one third electro-magnetic radiation to the first arrangement and further receive at least one fourth electro-magnetic radiation. The third electro-magnetic radiation can be based on the second electro-magnetic radiation, and the fourth electro-magnetic radiation can be based on the third electro-magnetic radiation. For example, the second arrangement can be configured to forward the second electro-magnetic radiation at different angles with respect to a direction of incidence of the at least one particular electro-magnetic radiation. Exemplary embodiments of methods can be provided to implement such exemplary techniques.
Abstract:
A spectrometer is provided. In one implementation, for example, a spectrometer comprises an excitation source, a focusing lens, a movable mirror, and an actuator assembly. The focusing lens is adapted to focus an incident beam from the excitation source. The actuator assembly is adapted to control the movable mirror to move a focused incident beam across a surface of the sample.
Abstract:
A system and method of high-speed microscopy using a two-photon microscope with spectral resolution. The microscope is operable to provide two- to five-dimensional fluorescence images of samples, including two or three spatial dimensions, a spectral dimension (for fluorescence emission), and a temporal dimension (on a scale of less than approximately one second). Two-dimensional (spatial) images with a complete wavelength spectrum are generated from a single scan of a sample. The microscope may include one of a multi-beam point scanning microscope, a single beam line scanning microscope, and a multi-beam line scanning microscope. The line scans may be formed using one or more of curved mirrors and lenses. The multiple beams may be formed using one of a grating, an array of lenses, and a beam splitter.
Abstract:
A drug inspection device and method for distinguishing tablets that have different amounts of active pharmaceutical ingredients and are indistinguishable in appearance. The device focuses on a tablet packaging process for tablets containing different amounts of active pharmaceutical ingredients, every row or every pocket, having housed therein a plurality of tablets, is used for conveyance. A beam having near-infrared light irradiates the tablets, a spectroscope receives reflected light, a near-infrared imaging unit captures a spectrum obtained through dispersion of the reflected light by the spectroscope and generates image data, and a control unit processes the image data and performs an operation for distinguishing the types of tablets. The control unit controls the near-infrared imaging unit to perform image capture at least once on the tablets included in the one row, to compute average spectrum data per tablet, and to distinguish the type of tablet based on the average spectrum data.
Abstract:
An optical spectrum analyzer includes an optical section 130 for executing light dispersion into a spectrum and wavelength sweep for input measured light, converting the measured light into an electric signal, and outputting the electric signal, a control section 101 for controlling the wavelength sweep of the optical section and outputting a sampling clock of a period shifting from a cycle period of the measured light for each wavelength of the wavelength sweep, and a measurement section 140 for executing sequential sampling of the electric signal from the optical section for each sampling clock.