Multi/parallel scanner
    2.
    发明授权

    公开(公告)号:US12061207B2

    公开(公告)日:2024-08-13

    申请号:US18063500

    申请日:2022-12-08

    Abstract: A microscope system may comprise a plurality of microscope modules, a cassette for holding a plurality of slides, a slide loader configured to move the plurality of slides between the cassette and the plurality of microscope modules, and a processor coupled to the slide loader. The processor may be configured with instructions which, when executed, cause the slide loader to move a slide into or from a selected microscope module among the plurality of microscope modules. Various other methods, systems, and computer-readable media are also disclosed.

    METHOD AND ARRANGEMENT FOR IDENTIFYING OPTICAL ABERRATIONS

    公开(公告)号:US20190204574A1

    公开(公告)日:2019-07-04

    申请号:US16093542

    申请日:2017-04-12

    Abstract: It is provided a method for identifying optical aberrations. The method comprising the steps of providing at least one first optical beam and a second optical beam ; creating a combined beam by at least partially superimposing the first and the second optical beam; focusing the combined beam into or through a medium and detecting radiation excited in the medium by the combined beam due to nonlinear optical effects; detecting the radiation excited in the medium by the combined beam for each one of the phase positions, the spatial positions and/or the time positions of the first beam; and identifying aberrations using signals generated by a detection device for the plurality of the phase positions, the spatial positions and/or the time positions of the first beam relative to the second beam upon the detection of the radiation excited in the medium.

    FLEXIBLE MODE SCANNING OPTICAL MICROSCOPY AND INSPECTION SYSTEM

    公开(公告)号:US20180329189A1

    公开(公告)日:2018-11-15

    申请号:US15615679

    申请日:2017-06-06

    CPC classification number: G02B21/0032 G02B21/002 G02B21/0092 G02B21/125

    Abstract: A method for flexible inspection of a sample includes forming an input beam using a beam source, blocking a portion of the input beam using an input mask, and forming a shaped beam from a portion of the input beam. The shaped beam is received at a first portion of an objective lens and focused onto a sample. A reflected beam is collected at a second portion of the objective lens. Scattered light is collected at the first and second portions of the objective lens and at a third portion of the objective lens. The scattered light is received at a dark-field detector module and a portion of the scattered light is directed to a dark-field detector. The dark-field detector module includes an output mask having one or more output apertures that allow at least part of the scattered light that passes through the third portion of the object lens to pass as the portion of the scattered light that is directed to the dark-field detector.

Patent Agency Ranking