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    IMAGING SENSOR COUPLED WITH LAYERED FILTERS
    1.
    发明申请
    IMAGING SENSOR COUPLED WITH LAYERED FILTERS 审中-公开
    成像传感器与层状滤波器耦合

    公开(公告)号：US20170041574A1

    公开(公告)日：2017-02-09

    申请号：US14817087

    申请日：2015-08-03

    Applicant: SONY CORPORATION ,  SONY PICTURES ENTERTAINMENT INC.

    Inventor： Kazunori Tanaka

    IPC: H04N9/04 ,  G02B5/20 ,  G02B5/30 ,  H04N9/07

    CPC classification number: H04N9/045 ,  G01N2021/3174 ,  G01N2021/6471 ,  H04N1/482 ,  H04N9/07 ,  H04N2209/043

    Abstract: A digital imaging device includes: a monochromatic sensor including a plurality of photosensitive elements distributed in an array, the plurality of photosensitive elements configured to convert light falling on the monochromatic sensor into electronic signals; and a plurality of filters, each filter configured to be moved into a position in front of the monochromatic sensor, wherein each filter, when moved into the position in front of the monochromatic sensor, covers substantial portion of the monochromatic sensor. Key words include imaging sensor and layered filter.

    Abstract translation: 数字成像装置包括：单色传感器，包括以阵列分布的多个感光元件，所述多个感光元件被配置为将落在单色传感器上的光转换为电子信号; 每个过滤器被配置为移动到单色传感器前面的位置，其中当移动到单色传感器前面的位置时，每个过滤器覆盖单色传感器的大部分。 关键词包括成像传感器和分层滤波器。

    Material property measuring apparatus
    2.
    发明授权
    Material property measuring apparatus 有权
    材料性能测量仪器

    公开(公告)号：US09170194B2

    公开(公告)日：2015-10-27

    申请号：US14388298

    申请日：2013-03-28

    Applicant: YOKOGAWA ELECTRIC CORPORATION

    Inventor： Yasushi Ichizawa ,  Kumiko Horikoshi ,  Kazuki Setsuda ,  Naomichi Chida

    IPC: G01N21/3559 ,  G01N21/59 ,  G01N21/86 ,  G01J5/02 ,  G01N21/31

    CPC classification number: G01N21/3559 ,  G01N21/59 ,  G01N21/86 ,  G01N2021/3148 ,  G01N2021/3174 ,  G01N2021/3181 ,  G01N2021/8663 ,  G01N2201/0627

    Abstract: A material property measuring apparatus includes a radiation source irradiator configured to irradiate a measurement target material with radiation beams having n different wavelengths, a detector configured to detect intensities of radiation beams having the respective wavelengths after the irradiation of the measurement target material, and a processing unit configured to correct the detected intensity of the radiation beam having at least a part of the respective wavelengths using a correction coefficient in which rows and columns are respectively represented by a matrix of an order of n or less, and to calculate an index value indicating a property of the measurement target material on the basis of relative intensities of the radiation beams having the respective wavelengths after the correction.

    Abstract translation: 材料性质测量装置包括：辐射源照射器，被配置为用测量目标材料照射具有n个不同波长的辐射束;检测器，被配置为检测在测量目标材料照射后具有各个波长的辐射束的强度;以及处理 单元，被配置为使用校正系数校正具有至少一部分各个波长的辐射束的检测强度，其中行和列分别由n或更小的阶数的矩阵表示，并且计算指示 基于校正后具有各波长的辐射束的相对强度，测量目标材料的特性。

    Methods and devices for optically determining a characteristic of a substance
    3.
    发明授权
    Methods and devices for optically determining a characteristic of a substance 有权
    用于光学确定物质特征的方法和装置

    公开(公告)号：US09103767B2

    公开(公告)日：2015-08-11

    申请号：US14293654

    申请日：2014-06-02

    Applicant: Halliburton Energy Services, Inc.

    Inventor： Robert Freese ,  Christopher Michael Jones ,  David Perkins ,  Michael Simcock ,  William Soltmann

    IPC: G01N21/00 ,  G01N21/17 ,  G01J3/02 ,  G01J3/28 ,  G01N21/27 ,  G01N21/31 ,  G06E3/00 ,  G01J3/12

    CPC classification number: G01N21/17 ,  G01J3/0294 ,  G01J3/28 ,  G01J2003/1226 ,  G01N21/274 ,  G01N21/31 ,  G01N2021/3137 ,  G01N2021/3174 ,  G06E3/001

    Abstract: Using an optical computing device includes optically interacting electromagnetic radiation with a sample and a first integrated computational element arranged within a primary channel, optically interacting the electromagnetic radiation with the sample and a second integrated computational element arranged within a reference channel, producing first and second modified electromagnetic radiations from the first and second integrated computational elements, respectively, receiving the first modified electromagnetic radiation with a first detector, and receiving the second modified electromagnetic radiation with a second detector, generating a first output signal with the first detector and a second output signal with the second detector, and computationally combining the first and second output signals with a signal processor to determine the characteristic of interest of the sample.

    Abstract translation: 使用光学计算设备包括光学相互作用的电磁辐射与样品和布置在主通道内的第一集成计算元件，将电磁辐射与样品光学相互作用，以及布置在参考通道内的第二集成计算元件，产生第一和第二修改 分别从第一和第二集成计算元件接收第一修改的电磁辐射与第一检测器的电磁辐射，以及用第二检测器接收第二修改的电磁辐射，用第一检测器产生第一输出信号和第二输出信号 并且将第一和第二输出信号与信号处理器进行计算结合，以确定样本的感兴趣的特性。

    Multi-spectral scanning system
    4.
    发明授权
    Multi-spectral scanning system 有权
    多光谱扫描系统

    公开(公告)号：US09080950B2

    公开(公告)日：2015-07-14

    申请号：US13581317

    申请日：2011-03-08

    Applicant: Alexander Kovalchuk

    Inventor： Alexander Kovalchuk

    IPC: H04N1/60 ,  H04N1/46 ,  G01N21/25 ,  G01J3/28 ,  H04N1/028 ,  H04N1/10 ,  G01N21/31

    CPC classification number: G01N21/255 ,  G01J3/2823 ,  G01N2021/3174 ,  G01N2201/1293 ,  H04N1/02865 ,  H04N1/1013

    Abstract: A method of capturing and processing a multi-spectral image of an object comprises placing the object on a flat-bed scanner (1), using the flat-bed scanner (1) to illuminate the object successively with monochromatic light at a series of wave-lengths to produce a plurality of images together forming a composite multi-spectral image, determining a spectral profile of at least a portion of the multi-spectral image and comparing the spectral profile to a stored spectral profile (22, 24).

    Abstract translation: 一种捕获和处理物体的多光谱图像的方法包括将物体放置在平板扫描器（1）上，使用平板扫描器（1）以一系列波浪的单色光连续照射物体 长度以一起形成多个图像，形成复合多光谱图像，确定多光谱图像的至少一部分的光谱分布，并将光谱分布与存储的光谱分布（22,24）进行比较。

    MULTIPLEX TUNABLE FILTER SPECTROMETER
    5.
    发明申请
    MULTIPLEX TUNABLE FILTER SPECTROMETER 有权
    MULTIPLEX TUNABLE滤光片

    公开(公告)号：US20150103354A1

    公开(公告)日：2015-04-16

    申请号：US14518974

    申请日：2014-10-20

    Applicant: Precisive, LLC

    Inventor： Vidi A. Saptari

    IPC: G01J3/02 ,  G01J3/28 ,  G01N21/27

    CPC classification number: G01J3/06 ,  G01J3/32 ,  G01J2003/1247 ,  G01N21/255 ,  G01N21/314 ,  G01N21/33 ,  G01N21/3504 ,  G01N2021/3174 ,  G01N2201/129

    Abstract: The invention provides spectroscopic systems and spectrometers employing an optical interference filter module having a plurality of bandpass regions. In certain embodiments, the systems include a mechanism for wavelength tuning/scanning and wavelength band decoding based on an angular motion of one or more filters. A spectral processing algorithm separates the multiplexed wavelength-scanned bandpass regions and quantifies the concentrations of the analyzed chemical and/or biological species. The spectroscopic system allows for compact, multi-compound analysis, employing a single-element detector for maximum performance-to-cost ratio. The spectroscopic system also allows for high-sensitivity measurement and robust interference compensation.

    Abstract translation: 本发明提供了使用具有多个带通区域的光学干涉滤光器模块的光谱系统和光谱仪。 在某些实施例中，系统包括用于波长调谐/扫描和基于一个或多个滤波器的角运动的波段解码的机构。 光谱处理算法分离复用的波长扫描带通区域并量化分析的化学和/或生物物种的浓度。 光谱系统允许使用单元素检测器进行紧凑，多重复合分析，以获得最大的性能与成本比。 光谱系统还允许高灵敏度测量和鲁棒干扰补偿。

    Sample analyzer
    10.
    发明授权
    Sample analyzer 有权
    样品分析仪

    公开(公告)号：US07760340B2

    公开(公告)日：2010-07-20

    申请号：US11724934

    申请日：2007-03-16

    Applicant: Susumu Hoshiko ,  Naohiko Matsuo ,  Katsushi Kobayashi ,  Norimasa Yamamoto

    Inventor： Susumu Hoshiko ,  Naohiko Matsuo ,  Katsushi Kobayashi ,  Norimasa Yamamoto

    IPC: G01N33/48

    CPC classification number: G01N21/314 ,  G01J2003/123 ,  G01N21/0332 ,  G01N21/253 ,  G01N21/272 ,  G01N21/274 ,  G01N21/82 ,  G01N33/49 ,  G01N35/00603 ,  G01N2021/3148 ,  G01N2021/3155 ,  G01N2021/3174 ,  G01N2021/825 ,  G01N2035/00356 ,  G01N2035/0455 ,  G01N2201/0618 ,  G01N2201/0826

    Abstract: A sample analyzer includes (a) a measuring part for measuring optical information of a sample at first wavelength, second wavelength, and third wavelength, first light of the first wavelength and second light of the second wavelength being absorbed by a second substance but substantially not absorbed by a first substance, and third light of the third wavelength being absorbed by the first substance; and (b) an obtaining part for obtaining content of the first substance in the sample, and content of the second substance in the sample, influence by the second substance being excluded from the content of the first substance, based on the optical information at the first wavelength, second wavelength, and third wavelength measured by the measuring part.

    Abstract translation: 样品分析仪包括：（a）测量部件，用于测量第一波长，第二波长和第三波长处的样品的光学信息，第一波长的第一光和第二波长的第二光被第二物质吸收，但基本上不 被第一物质吸收，第三波长的第三光被第一物质吸收; 和（b）获取部分，用于获得样品中第一物质的含量和样品中第二物质的含量，第二物质的含量根据第一物质的含量而被排除在第一物质的含量之外 第一波长，第二波长和第三波长由测量部件测量。

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