公开(公告)号：US20190049708A1

公开(公告)日：2019-02-14

申请号：US16041922

申请日：2018-07-23

Applicant: TECAN TRADING AG

Inventor： Andreas ERLBACHER ,  Markus SCHÜRF ,  Josef GRASSL ,  Alexander KASER

IPC: G02B21/00 ,  G02B21/24 ,  G02B21/06 ,  G02B21/36

Abstract: A system 100 and method are provided for imaging a sample in a sample holder. For providing autofocus, a 2D pattern is projected onto the sample holder 050 via an astigmatic optical element 120. Image data 172 of the sample is acquired by an image sensor 140 via magnification optics 150. A difference in sharpness of the two-dimensional pattern in the image data is measured along a first axis and a second axis. Based on the difference, a magnitude and direction of defocus of the camera subsystem is determined with respect to the sample holder. This enables the sample holder, and thereby the sample, to be brought into focus in a fast and reliable manner.

公开(公告)号：US20160011048A1

公开(公告)日：2016-01-14

申请号：US14794316

申请日：2015-07-08

Applicant: TECAN Trading AG

Inventor： Lutz NIGGL ,  Andreas ERLBACHER ,  Frank MÜNCHOW

IPC: G01J3/18 ,  G01J3/42 ,  G01J3/06

CPC classification number: G01J3/18 ,  G01J3/06 ,  G01J3/42 ,  G01J2003/1204 ,  G01J2003/1213 ,  G01J2003/1217 ,  G01N21/253 ,  G01N21/31 ,  G01N35/028 ,  G01N2021/3174 ,  G01N2201/084

Abstract: A spectrometer (1) comprises a light source (2), a monochromator (3) with at least one diffraction grating (4), a monochromator housing (5), an order sorting filter (7), a microplate receptacle (12) and a controller (6). The order sorting filter (7) of the spectrometer (1) comprises a substrate (23), a first optical thin film (24) and a second optical thin film (25), wherein, in a spatially partly overlapping and interference-free manner, the first optical thin film (24) is arranged on a first surface (26) and the second optical thin film (25) is arranged on a second surface (27) of the substrate (23). A spectrometer (1) equipped with a respective order sorting filter is used in a scanning method for detecting the absorption spectrum of samples examined in wells (14) of microplates (13).

Abstract translation: 光谱仪（1）包括光源（2），具有至少一个衍射光栅（4）的单色仪（3），单色仪外壳（5），订单分类过滤器（7），微板容器（12）和 控制器（6）。 光谱仪（1）的顺序分选滤光器（7）包括基板（23），第一光学薄膜（24）和第二光学薄膜（25），其中在空间上部分重叠和无干扰的方式 第一光学薄膜（24）布置在第一表面（26）上，第二光学薄膜（25）被布置在基板（23）的第二表面（27）上。 在用于检测在微孔板（13）的孔（14）中检测的样品的吸收光谱的扫描方法中，使用装备有相应的顺序分选过滤器的光谱仪（1）。