SYSTEM AND METHOD FOR DEFORMING AND ANALYZING PARTICLES
    21.
    发明申请
    SYSTEM AND METHOD FOR DEFORMING AND ANALYZING PARTICLES 有权
    用于变形和分析颗粒的系统和方法

    公开(公告)号:US20140113324A1

    公开(公告)日:2014-04-24

    申请号:US14057942

    申请日:2013-10-18

    Abstract: A system for deforming and analyzing particles includes a substrate defining an inlet, and an outlet; a fluidic pathway fluidly coupled to the inlet and the outlet and defining a delivery region upstream of a deformation region configured to deform particles, wherein the fluidic pathway comprises a first branch configured to generate a first flow, and a second branch configured to generate a second flow that opposes the first flow, wherein an intersection of the first flow and the second flow defines the deformation region; a detection module including a sensor configured to generate a morphology dataset characterizing deformation of the particles, and a photodetector configured to generate a fluorescence dataset characterizing fluorescence of the particles; and a processor configured to output an analysis of the plurality of particles based at least in part on the deformation dataset and the fluorescent dataset for the plurality of particles.

    Abstract translation: 用于变形和分析颗粒的系统包括限定入口的基板和出口; 流体路径,流体地联接到入口和出口,并且限定被配置为变形颗粒的变形区域上游的输送区域,其中流体路径包括被配置为产生第一流量的第一分支和被配置为产生第二流量的第二分支 所述第一流与所述第一流相对,其中所述第一流和所述第二流的交点限定所述变形区; 检测模块,其包括被配置为生成表征所述粒子的变形的形态学数据集的传感器,以及被配置为产生表征所述粒子的荧光的荧光数据集的光电检测器; 以及处理器,被配置为至少部分地基于所述多个粒子的所述变形数据集和所述荧光数据集来输出所述多个粒子的分析。

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