SILICON ON INSULATOR (SOI) TRANSCAP INTEGRATION PROVIDING FRONT AND BACK GATE CAPACITANCE TUNING

    公开(公告)号:US20190035945A1

    公开(公告)日:2019-01-31

    申请号:US15659718

    申请日:2017-07-26

    Abstract: Certain aspects of the present disclosure generally relate to a semiconductor variable capacitor offering at least two types of capacitance tuning, as well as techniques for fabricating the same. For example, a CMOS-compatible silicon on insulator (SOI) process with a buried oxide (BOX) layer may provide a transcap with a front gate (above the BOX layer) and a back gate (beneath the BOX layer). The front gate may offer lower voltage, coarse capacitance tuning, whereas the back gate may offer higher voltage, fine capacitance tuning. By offering both types of capacitance tuning, such transcaps may provide greater capacitance resolution. Several variations of transcaps with front gate and back gate tuning are illustrated and described herein.

    HETEROJUNCTION BIPOLAR TRANSISTORS WITH FIELD PLATES

    公开(公告)号:US20200259004A1

    公开(公告)日:2020-08-13

    申请号:US16274094

    申请日:2019-02-12

    Abstract: Power amplifiers in radio frequency circuits are typically implemented as heterojunction bipolar transistors. In applications such as in 5G systems, the circuits are expected to operate at very high speeds, e.g., up to 100 GHz. Also, a certain amount of output power should be maintained for stable operation. To achieve both high power and high speed, it is proposed to incorporate field plates in the heterojunction bipolar transistors to reduce electric field in the collector. This allows the breakdown voltage of the transistor to be high, which aids in power output. At the same time, the collector can be relatively thin, which aids in operation speed.

    HIGH POWER PERFORMANCE GALLIUM NITRIDE HIGH ELECTRON MOBILITY TRANSISTOR WITH LEDGES AND FIELD PLATES

    公开(公告)号:US20200052103A1

    公开(公告)日:2020-02-13

    申请号:US16058388

    申请日:2018-08-08

    Abstract: Certain aspects of the present disclosure provide a high electron mobility transistor (HEMT). The HEMT generally includes a gallium nitride (GaN) layer and an aluminum gallium nitride (AlGaN) layer disposed above the GaN layer. The HEMT also includes a source electrode, a gate electrode, and a drain electrode disposed above the AlGaN layer. The HEMT further includes n-doped protuberance(s) disposed above the AlGaN layer and disposed between at least one of: the gate electrode and the drain electrode; or the source electrode and the gate electrode. Each of the n-doped protuberances is separated from the gate electrode, the drain electrode, and the source electrode.

    ROTATED METAL-OXIDE-METAL (RTMOM) CAPACITOR
    27.
    发明申请

    公开(公告)号:US20190385947A1

    公开(公告)日:2019-12-19

    申请号:US16007921

    申请日:2018-06-13

    Abstract: A capacitor includes a first set of conductive fingers having a first conductive pitch at a first interconnect layer and arranged in a first unidirectional routing. The capacitor further includes a second set of conductive fingers having a second conductive pitch at a second interconnect layer and arranged in a second unidirectional routing that is orthogonal to the first unidirectional routing. The first conductive pitch is different from the second conductive pitch. A first set of through finger vias electrically couples the first set of conductive fingers of the first interconnect layer to the second set of conductive fingers of the second interconnect layer. A third set of conductive fingers at a third conductive layer are parallel to, but offset from, the first set of conductive fingers. A second set of through finger vias electrically couples the third set of conductive fingers to the second set of conductive fingers.

    VARIABLE THICKNESS GATE OXIDE TRANSCAP
    28.
    发明申请

    公开(公告)号:US20190312153A1

    公开(公告)日:2019-10-10

    申请号:US15947667

    申请日:2018-04-06

    Abstract: Aspects of the present disclosure provide semiconductor variable capacitor devices. In one embodiment, a semiconductor variable capacitor includes a gate oxide layer comprising a first layer portion with a first thickness and a second layer portion with a second thickness; a first non-insulative region disposed above the gate oxide layer; a first semiconductor region disposed beneath the gate oxide layer; a second semiconductor region disposed beneath the gate oxide layer and adjacent to the first semiconductor region, wherein the second semiconductor region comprises a different doping type than the first semiconductor region a second non-insulative region coupled to the first semiconductor region; and a control terminal coupled to a control region coupled to the second semiconductor region such that a first capacitance between the first non-insulative region and the second non-insulative region is configured to be adjusted by varying a control voltage applied to the control region.

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