CRYSTAL GROWTH METHOD, AND CRYSTAL GROWTH DEVICE

    公开(公告)号:US20250043458A1

    公开(公告)日:2025-02-06

    申请号:US18716232

    申请日:2022-12-07

    Abstract: A crystal growth method comprises: in a process of growing a crystal by using a pulling method, controlling an induction coil to move downwards with respect a crucible, wherein the induction coil moves with an acceleration after the crystal enters an equal-diameter stage, and the moving speed of the induction coil tends to continuously increase during the entire moving process of the induction coil. According to the crystal growth method, a change in a temperature gradient of a crystal growth interface caused by the internal temperature distribution of the crucible can be compensated, a continuous and stable temperature field environment is provided for crystal growth, and defects generated during a crystal growth process are reduced.

    METHOD FOR PREPARING DIRECTIONALLY SOLIDIFIED TiAl ALLOY

    公开(公告)号:US20240401237A1

    公开(公告)日:2024-12-05

    申请号:US18609883

    申请日:2024-03-19

    Abstract: Disclosed is a method for preparing a directionally solidified TiAl alloy, including: (1) melting and casting a master alloy to obtain a TiAl alloy ingot; (2) processing the TiAl alloy ingot into a sample rod, and placing the sample rod into a refractory metal crucible and then assembling the refractory metal crucible to a directional solidification furnace; (3) vacuumizing the directional solidification furnace, and heating the directional solidification furnace to gradually raise a temperature to exceed a melting point of the sample rod, and conducting heat preservation to melt the sample rod uniformly to obtain a molten TiAl alloy; and (4) directionally pulling the molten TiAl alloy after the heat preservation to allow directional growth to a growth length, stopping the directionally pulling, and taking out an obtained sample to obtain a test rod of the directionally solidified TiAl.

    Asymmetric thermal fields for excluding impurities in single crystal manufacturing device

    公开(公告)号:US12091770B1

    公开(公告)日:2024-09-17

    申请号:US18326374

    申请日:2023-05-31

    CPC classification number: C30B15/206 C30B15/10 C30B15/14 C30B29/16

    Abstract: Disclosed herein is a furnace and a method of growing a high temperature oxide crystal. The furnace includes a cylindrical furnace wall, an induction coil disposed within the cylindrical furnace wall, a quartz tube disposed within the induction coil, a refractory lining disposed within the quartz tube, and a crucible disposed within the refractory lining, the crucible including a melt therein. A lid placed on the crucible. An asymmetric configuration of at least one of the crucible, the refractory lining, the quartz tube, the induction coil and the lid within the cylindrical furnace wall creates a thermal gradient that causes a cold spot in the melt to migrate from a first location to a second location of the melt. A rod having a seed crystal at an end thereof is lowered into the crucible to draw a boule from the melt via the seed crystal from the first location.

    Heater and Single Crystal Growing Apparatus
    8.
    发明公开

    公开(公告)号:US20240279841A1

    公开(公告)日:2024-08-22

    申请号:US18567705

    申请日:2022-09-30

    Inventor: Wenwu YANG

    CPC classification number: C30B15/14 C30B29/06

    Abstract: A heater that may be included in a single crystal growing apparatus includes a heating body. The heating body has a bowl shape and has a bottom having an opening. The heating body is divided into a first heating zone and a second heating zone in the circumferential direction. The first heating zone includes a first main heating area and the second heating zone includes a second main heating area. The first main heating area and the second main heating area are located at different position with different heights in the axial direction of the heating body.

    Methods and systems of capturing transient thermal responses of regions of crystal pullers

    公开(公告)号:US12018400B2

    公开(公告)日:2024-06-25

    申请号:US17651127

    申请日:2022-02-15

    CPC classification number: C30B29/06 C30B15/10 C30B15/14

    Abstract: A system for producing a silicon ingot, the system includes a crystal puller, a pyrometer, an infrared (IR) camera, and a controller. The crystal puller includes a hot zone having one or more components therein, and in which a silicon ingot may be pulled. The pyrometer is positioned to view a region of interest within the hot zone. The IR camera is positioned to view one or more additional regions of interest within the hot zone. The controller is connected to the crystal puller, the pyrometer, and the IR camera. The controller is programmed to control the crystal puller to produce a silicon ingot, receive temperature data of the region of interest within the hot zone from the pyrometer while producing the silicon ingot, and receive IR images of the one or more additional regions of interest from the IR camera while producing the silicon ingot.

    Semiconductor crystal growth method and device

    公开(公告)号:US12000060B2

    公开(公告)日:2024-06-04

    申请号:US17606694

    申请日:2020-01-16

    CPC classification number: C30B15/14 C30B15/10 C30B15/20 C30B29/06

    Abstract: A semiconductor crystal growth method and device are provided. The method comprises: obtaining an initial position of a graphite crucible when used in a semiconductor crystal growth process for the first time; obtaining a current production batch of the graphite crucible which characterizes a number of times of growth processes performed by the graphite crucible so far; and loading polysilicon raw materials into a quartz crucible sleeved in the graphite crucible based on the current production batch, wherein a total weight of the materials is called a charging amount, and the charging amount is adjusted based on the current production batch to keep an initial position of a silicon melt liquid surface in the quartz crucible stable while keeping the initial position of the graphite crucible unchanged. The present invention ensures the stability of each parameter in the crystal pulling process, and enhances the crystal pulling speed and quality.

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