公开(公告)号：US07161874B2

公开(公告)日：2007-01-09

申请号：US10069489

申请日：2001-06-21

Applicant: Masakazu Ichikawa ,  Isao Kitazawa

Inventor： Masakazu Ichikawa ,  Isao Kitazawa

IPC: G04C3/00

CPC classification number: G04C10/00 ,  G04G19/08

Abstract: The power generated by a power generating means (1) of a power-generating type electronic clock is measured by a first power generating sensing means (101) and a second power generating sensing means (102). The power generation level required when the operation is changed from a normal mode to a power-saving mode and the power generation level required when the operation is changed from the power-saving mode back to the normal mode are made different to prevent the phenomenon that the operation changes frequently by imparting hysteresis characteristics to the power generation level which causes a change in the mode, thereby improving the power-saving effect.

Abstract translation: 由发电型电子时钟的发电装置（1）产生的功率由第一功率产生感测装置（101）和第二发电感测装置（102）测量。 当操作从正常模式切换到省电模式时所需的发电电平和将操作从节电模式改变回正常模式所需的发电电平被设定为不同，以防止 通过给发电电平赋予滞后特性而频繁地变化，这导致模式的改变，从而提高了省电效果。

公开(公告)号：US5563465A

公开(公告)日：1996-10-08

申请号：US225978

申请日：1994-04-12

Applicant: Hitoshi Nakahara ,  Masakazu Ichikawa ,  Yuishin Tanaka ,  Sakae Saitou ,  Shigeo Moriyama

Inventor： Hitoshi Nakahara ,  Masakazu Ichikawa ,  Yuishin Tanaka ,  Sakae Saitou ,  Shigeo Moriyama

IPC: H02N2/00 ,  H01L41/09 ,  H01L41/08

CPC classification number: H02N2/026 ,  H02N2/0025 ,  H02N2/067

Abstract: An actuator includes piezo electric devices which are installed in contact with a drive head and a driven body which is contact-driven by the drive head. Thus, only one mechanism performs coarse motion and micromotion by forming a gap between the drive head and driven body. The high precision positioning mechanism can be miniaturized and constructed at a low price.

Abstract translation: 致动器包括安装成与驱动头接触的压电装置和由驱动头接触驱动的从动体。 因此，只有一个机构通过在驱动头和被驱动体之间形成间隙来执行粗略运动和微动作。 高精度定位机构可以以低价格小型化和建造。

公开(公告)号：US5345080A

公开(公告)日：1994-09-06

申请号：US960503

申请日：1992-10-13

Applicant: Yusuke Yajima ,  Masakazu Ichikawa ,  Hiroyuki Shinada

Inventor： Yusuke Yajima ,  Masakazu Ichikawa ,  Hiroyuki Shinada

IPC: H01J37/04 ,  H01J37/09 ,  H01J37/147 ,  H01J37/20 ,  H01J37/22 ,  H01J37/26 ,  H01J37/295

CPC classification number: H01J37/26 ,  H01J37/045 ,  H01J2237/24455

Abstract: An electron microscopic image observing method and an apparatus for carrying out the same enables the observation of an electron microscopic image of a specimen by irradiating the specimen with an electron beam and detecting the electron beam after it has transmitted through the specimen. The electron beam transmitted through the specimen is deflected so that the deflection thereof varies with time, and is allowed to pass through an aperture only when the deflection thereof is within a predetermined range of deflection, whereby the electron beam transmitted through the specimen and passed through the aperture is then detected. Thus, the electron microscopic image observing method and the apparatus for carrying out the same enables the observation of time-resolved electron microscopic images of a specimen having internal physical properties varying with time.

Abstract translation: 电子显微镜图像观察方法及其执行装置能够通过用电子束照射样本来观察样品的电子显微镜图像，并且在透射通过样品之后检测电子束。 透过试样的电子束被偏转，使其挠曲随时间而变化，只有当其偏转在预定的偏转范围内时才允许通过孔，由此电子束透过试样并通过 然后检测孔径。 因此，电子显微镜图像观察方法及其执行装置能够观察具有随时间变化的内部物理性质的样品的时间分辨电子显微镜图像。

公开(公告)号：US5298747A

公开(公告)日：1994-03-29

申请号：US794007

申请日：1991-11-19

Applicant: Masakazu Ichikawa ,  Yusuke Yajima ,  Masatoshi Takeshita ,  Toshio Kobayashi

Inventor： Masakazu Ichikawa ,  Yusuke Yajima ,  Masatoshi Takeshita ,  Toshio Kobayashi

IPC: G01Q30/02 ,  H01J37/28 ,  H01J37/26

CPC classification number: H01J37/28 ,  H01J2237/1514

Abstract: A scanning interference electron microscope includes an electron source, a focusing lens, an electron beam deflection system and a biprism. The biprism separates the primary electron beam emanating from the electron source into two beams. One of the separated beams is controlled by the deflection system to scan the sample surface, thereafter interfering with the other separated beam to generated interference fringes. The phase difference due to interaction of the first electron beam with a sample surface produces changes in the interference intensity of the interference fringes, which represent a microscopic image of the sample.

Abstract translation: 扫描干涉电子显微镜包括电子源，聚焦透镜，电子束偏转系统和双棱镜。 双棱镜将从电子源发射的一次电子束分离成两束。 分离的光束中的一个由偏转系统控制，以扫描样品表面，此后干扰另一个分离的光束以产生干涉条纹。 由于第一电子束与样品表面的相互作用导致的相位差产生干涉条纹的干涉强度的变化，其表示样品的微观图像。

公开(公告)号：US06747748B2

公开(公告)日：2004-06-08

申请号：US09974195

申请日：2001-10-10

Applicant: Tatsuo Matsudo ,  Tomohiro Ohta ,  Tetsuji Yasuda ,  Masakazu Ichikawa ,  Takashi Nakayama

Inventor： Tatsuo Matsudo ,  Tomohiro Ohta ,  Tetsuji Yasuda ,  Masakazu Ichikawa ,  Takashi Nakayama

IPC: G01B1106

CPC classification number: H01L21/67167 ,  H01L21/28167 ,  H01L21/28185 ,  H01L21/28194 ,  H01L21/28211 ,  H01L21/67253 ,  H01L22/26 ,  H01L29/511 ,  H01L29/513 ,  H01L29/517

Abstract: In a process of forming a film on a surface of a wafer by thermal processing, laser light generated by a light source is depolarized by a depolarizer and the deporlarized light is irradiated upon the surface of wafer. As for the light reflected from the surface of wafer, polarization components in predetermined two directions perpendicular to each other are extracted by a beam splitter, and optical sensors receive the extracted light components to detect each intensity. An analytical processing unit determines a thickness of a formed film based on a change in a difference in intensity.

Abstract translation: 在通过热处理在晶片的表面上形成膜的过程中，由光源产生的激光由去偏振器去极化，并且去角化的光被照射在晶片的表面上。 对于从晶片表面反射的光，通过分束器提取彼此垂直的预定的两个方向的偏振分量，并且光学传感器接收提取的光分量以检测每个强度。 分析处理单元基于强度差的变化来确定成膜的厚度。

公开(公告)号：US5521390A

公开(公告)日：1996-05-28

申请号：US341949

申请日：1994-11-16

Applicant: Toshihiko Sato ,  Masakazu Ichikawa ,  Toshikazu Shimada

Inventor： Toshihiko Sato ,  Masakazu Ichikawa ,  Toshikazu Shimada

IPC: G02F1/39 ,  G01B11/14 ,  G01Q90/00 ,  G12B1/00 ,  H01J37/20

CPC classification number: G01Q10/04 ,  B82Y35/00 ,  G12B1/00 ,  H01J37/20 ,  Y10S977/868

Abstract: An optical nanodisplacement producing apparatus is realized by employing an optical parametric oscillator of which cavity length is varied in correspondence with a wavelength or the intensity of the output light signal to achieve a fine-displacement producing mechanism. An optical nanodisplacement producing apparatus having high resolution less than 0.1 nm and a highly stable characteristic is realized as a very fine pattern forming/monitoring apparatus.

Abstract translation: 通过采用光学参数振荡器来实现光学纳米位置产生装置，其中腔长度与输出光信号的波长或强度相对应地变化，以实现精细位移产生机制。 作为非常精细的图案形成/监视装置，实现了具有小于0.1nm的高分辨率和高度稳定特性的光学纳米置换产生装置。

公开(公告)号：US5229607A

公开(公告)日：1993-07-20

申请号：US714018

申请日：1991-06-12

Applicant: Hironobu Matsui ,  Mikio Ichihashi ,  Sumio Hosaka ,  Yoshinori Nakayama ,  Satoshi Haraichi ,  Fumikazu Itoh ,  Akira Shimase ,  Yoshimasa Kondo ,  Shigeyuki Hosoki ,  Masakazu Ichikawa ,  Yukio Honda ,  Tsuyoshi Hasegawa ,  Shiji Okazaki ,  Shunji Maeda ,  Hitoshi Kubota

Inventor： Hironobu Matsui ,  Mikio Ichihashi ,  Sumio Hosaka ,  Yoshinori Nakayama ,  Satoshi Haraichi ,  Fumikazu Itoh ,  Akira Shimase ,  Yoshimasa Kondo ,  Shigeyuki Hosoki ,  Masakazu Ichikawa ,  Yukio Honda ,  Tsuyoshi Hasegawa ,  Shiji Okazaki ,  Shunji Maeda ,  Hitoshi Kubota

IPC: G01Q10/04 ,  G01Q30/02 ,  G01Q30/12 ,  G01Q30/18 ,  G01Q60/00 ,  H01J37/252 ,  H01J37/28

CPC classification number: H01J37/28 ,  B82Y35/00 ,  G01Q30/02 ,  H01J37/252 ,  H01J37/3056

Abstract: A combination apparatus having a scanning electron microscope includes equipment for performing any of observing, measuring and processing operations on a sample placed in a sample chamber. The sample chamber contains a focused electron beam irradiating unit apart from the components for performing the observing, measuring and processing operations. The focused electron beam irradiating unit irradiates a finely focused electron beam onto the surface of the sample for electron microscopic observation in scanning fashion. This setup allows the observing, measuring or processing equipment to combine with the scanning electron microscope without appreciably enlarging the construction of the combination apparatus.

Abstract translation: 具有扫描电子显微镜的组合装置包括用于对放置在样品室中的样品进行观察，测量和处理操作的任何设备。 样品室包含聚焦电子束照射单元，与用于进行观察，测量和处理操作的部件分开。 聚焦电子束照射单元以扫描方式将精细聚焦的电子束照射到用于电子显微镜观察的样品表面上。 该设置允许观察，测量或处理设备与扫描电子显微镜组合，而不会明显地扩大组合装置的结构。

公开(公告)号：US5144128A

公开(公告)日：1992-09-01

申请号：US649898

申请日：1991-02-01

Applicant: Tsuyoshi Hasegawa ,  Sumio Hosaka ,  Shigeyuki Hosoki ,  Yukio Honda ,  Masakazu Ichikawa

Inventor： Tsuyoshi Hasegawa ,  Sumio Hosaka ,  Shigeyuki Hosoki ,  Yukio Honda ,  Masakazu Ichikawa

IPC: G01N23/00 ,  G01N27/00 ,  G01Q10/06 ,  G01Q20/00 ,  G01Q30/02 ,  G01Q30/16 ,  G01Q60/00 ,  G01Q70/02 ,  H01J37/252

CPC classification number: G01Q10/06 ,  B82Y35/00 ,  G01Q20/00 ,  G01Q30/16 ,  G01Q70/02 ,  Y10S977/852 ,  Y10S977/86 ,  Y10S977/861 ,  Y10S977/863 ,  Y10S977/873

Abstract: An atomic force microscope is provided for sensing displacement of a cantilever based on scanning tunneling microscopy. The atomic force microscope includes a cantilever moving system which allows the cantilever to be moved or slipped between an STM tip and a sample. This results in the microscope being able to carry out atomic force microscopy and tunneling microscopy without changing a single STM tip and to control the very small force between the sample and the tip to be constant.

公开(公告)号：US06876602B2

公开(公告)日：2005-04-05

申请号：US10368012

申请日：2003-02-19

Applicant: Masakazu Ichikawa ,  Isao Kitazawa ,  Masao Sakuyama ,  Tomio Okigami

Inventor： Masakazu Ichikawa ,  Isao Kitazawa ,  Masao Sakuyama ,  Tomio Okigami

IPC: G04G19/00 ,  G01R31/36 ,  G04C10/02 ,  G04C10/04 ,  H02J7/00

CPC classification number: G04C10/04 ,  G04C10/02 ,  Y10S320/21

Abstract: A first voltage detector detects whether the voltage of a secondary cell has reached to 1.2V and a first timer counts a time duration for which the voltage is equal to or above 1.2V. If the time counted by the first timer reaches one hour, a second timer starts counting time for one hour. An amount of charge accumulated in the secondary cell is displays after counting of the one hour by the second timer is over. As a result, an accurate display of the amount of charge accumulated in the secondary cell can be achieved.

Abstract translation: 第一电压检测器检测二次电池的电压是否达到1.2V，并且第一定时器计数电压等于或高于1.2V的持续时间。 如果第一计时器计时的时间达到1小时，则第二计时器开始计时1小时。 在第二计时器的计数1小时结束之后，显示在二次电池中累积的电量。 结果，可以实现二次电池中累积的电荷量的精确显示。

公开(公告)号：US5940348A

公开(公告)日：1999-08-17

申请号：US66372

申请日：1998-06-08

Applicant: Tomomi Murakami ,  Masakazu Ichikawa ,  Norio Miyauchi

Inventor： Tomomi Murakami ,  Masakazu Ichikawa ,  Norio Miyauchi

IPC: G04G13/02 ,  G04C10/04 ,  G04C21/02 ,  G04G19/08 ,  G04G19/12 ,  G04G99/00 ,  H02J1/00 ,  G04B47/06 ,  G04B9/00 ,  G04B23/02

CPC classification number: G04G19/08 ,  G04C10/04 ,  G04C21/02

Abstract: An electronic timepiece in accordance with the present invention includes a time clocking circuit for counting reference signals from a reference signal generating circuit to provide time information as its output; a warning device for warning the user of a specific time, by use of vibrations or a buzzer, on the basis of time information derived from the time clocking circuit; and a timepiece state detection device for detecting the states of the temperature and the power source voltage of the timepiece and, if the detection values deviate from predetermined values, the detection device operates to stop the warning action of the warning means. The timings of time information derived from the time clocking circuit differ from each other between when the timepiece state detection device has detected a low temperature of the timepiece and when it has detected a low voltage at the power source, and differ from the time information timing at the normal state. This prevents any batteries' consumption which may otherwise be caused by the meaningless warning, and makes it possible to inform the user of the states of the timepiece through the movement of the hands.

Abstract translation: PCT No.PCT / JP97 / 03034 Sec。 371日期：1998年4月30日 102（e）1998年4月30日PCT PCT 1997年8月29日PCT公布。 出版物WO98 / 09202 1998年3月5日根据本发明的电子钟表包括用于对来自参考信号发生电路的参考信号进行计数以提供时间信息作为其输出的时间计时电路; 基于来自时刻电路的时间信息，通过使用振动或蜂鸣器来警告用户特定时间的警告装置; 以及钟表状态检测装置，用于检测时钟的温度和电源电压的状态，并且如果检测值偏离预定值，则检测装置操作以停止警告装置的警告动作。 来自时钟电路的时间信息的定时在钟表状态检测装置已经检测到时钟的低温时和在电源处检测到低电压之间彼此不同，并且与时间信息定时不同 在正常状态。 这可以防止由无意义的警告引起的任何电池的消耗，并且可以通过手的移动来通知用户该钟表的状态。