摘要:
The present invention suppresses the refresh failure of a DRAM due to the dispersion of a threshold of a MOSFET. The DRAM has a first unit for recording a set value of a back bias potential to be applied to a back gate of a cell transistor and a second unit for generating a back bias potential based on the set value of the back bias potential recorded in the first unit and supplying the generated back bias potential to the back gate, wherein when a threshold of a MOSFET which has a structure identical to the cell transistor and which has been fabricated in the same process as the cell transistor is greater than a target value which the cell transistor should have, a value shallower than the back bias potential for the target value is recorded in the second unit.
摘要:
A delay circuit includes: an input signal line (IN) through which an input signal is inputted; a capacitor (106) charged with and discharging electric charge; a first switch (101) connected to the input signal line and operating according to the input signal when the capacitor is to be charged with electric charge; a second switch (102) connected to the input signal line and operating according to the input signal when the electric charge is to be discharged from the capacitor; and a comparison circuit (107) comparing a voltage of the capacitor and a reference voltage to output a delay signal of the input signal.
摘要:
The gates of each pair of second transistors receive a pair of delayed timing signals whose rising and falling edges are adjacent to each other, respectively, and gradually discharge the charges at a first node pre-charged to a first power supply voltage. The discharge speed varies depending on the threshold voltage, operating temperature, and power supply voltage of the transistors. A plurality of detection circuits operates at timings different from each other to detect the voltage at the first node as logic values. A selector selects any one of the second timing signals depending on a detection result provided by the detection circuit. An internal circuit operates in synchronization with the second timing signal selected. Accordingly, the operation timing of the internal circuit can be optimally adjusted in response to a change in operating environments. This allows the improvement in operation margin of the semiconductor integrated circuit.
摘要:
The present invention relates to a SDRAM and its control method which write or read data in synchronization with the external clock and its object is to provide a semiconductor memory device and its method which can be easily tested and evaluated by the conventional memory test equipment having a transfer type which transfers the data in synchronization with the rising and falling edges of the external clock. The semiconductor memory device has a write amplifier control section 14 and I/O data buffer/register 22 as a data transfer circuit corresponding to the data transfer type for the DDR type and SDR type. Also, a mode register 28 is formed to be used as a switch signal to switch the data transfer circuit to either DDR type or SDR type.
摘要:
In performing a read operation or a write operation in a memory cell, a row control circuit is first operated to activate a word line. Subsequently, a command control circuit receives a column operation command in synchronization with a clock signal so as to operate a column control circuit. Here, under the control of a timing adjusting circuit, the column control circuit starts operating a predetermined delay time after the reception of the column operation command. By delaying the operation of the column control circuit, the read operation or the write operation in the memory cell can be performed at the optimum timing corresponding to the operating timing of an internal circuit independent of the cycle of the clock signal. As a result, the number of times in receiving commands per unit time can be increased to enhance the bus occupation rate of data. Since the column control circuit is operated at the optimum timing corresponding to the operating timing of the internal circuit, a read cycle time and a write cycle time can be shortened.
摘要:
A semiconductor device receiving a stable external power voltage includes a reduced-voltage-generation circuit which generates an internally reduced power voltage, an input circuit which operates based on the internally reduced power voltage, causing the internally reduced power voltage to fluctuate, a clock-control circuit which generates an internal clock signal, an output circuit which outputs a data signal to an exterior of the device at output timings responsive to the internal clock signal, a clock-delivery circuit which conveys the internal clock signal from the clock-control circuit to the output circuit, and operates based on the external power voltage such as to make the output timings substantially unaffected by fluctuation of the internally reduced power voltage.
摘要:
A semiconductor integrated circuit comprising memory cells and a holding unit. The holding unit holds write data to the memory cell and mask information for masking a predetermined bit or bits of the write data, both supplied corresponding to a write command, as held write data and held mask information. On receiving a next write command, the semiconductor integrated circuit masks held write data in accordance with held mask information and writes the resultant to the memory cell. The holding unit holds next write data and next mask information supplied corresponding to this write command as held write data and held mask information. That is, the held write data and the held mask information are rewritten. Thereby, the semiconductor integrated circuit which writes write data previously accepted upon the reception of a next write command can mask the write data.
摘要:
The present invention internally latches a write data signal applied in synchronous with an external data strobe signal in response to an internal data strobe signal which is generated in response to this external data strobe signal, and furthermore, supplies the write data signal to a memory cell array from a write circuit such as a write amplifier in response to a write signal generated from this external data strobe signal. Meanwhile, an address signal is introduced internally in accordance with an external clock. Therefore, since the driving of the data bus connected to a memory cell array from a write amplifier, which constitutes a write operation internal to memory, commences in accordance with an external data strobe signal, a write operation can be ended in the shortest possible time from write data signal input. The above-described invention is especially effective when memory comprises a 2-bit pre-fetch. That is, a 2-bit write data signal is supplied time-sequentially in synchronous with an external data strobe signal. Since an internal write operation can commence after receiving for the input of that second write data signal, it enables the shortest write operation.
摘要:
A semiconductor apparatus includes a voltage unit which supplies a down voltage produced at a node, the voltage unit having a plurality of resistors connected in series between a power supply line and a grounding line, the node being a connection point between the plurality of resistors. A backup unit pulls up the node of the voltage unit when a voltage at the node is below a lower limit of the down voltage, so that the voltage at the node increases to the lower limit, and pulls down the node of the voltage unit when the voltage at the node is above an upper limit of the down voltage, so that the voltage at the node decreases to the upper limit. A control unit sets the backup unit in one of an active state and an inactive state in response to a control signal.
摘要:
A semiconductor memory device includes a memory cell array in which a number of sense amplifiers are provided, a plurality of segmented drive lines each connected to a group of sense amplifiers for driving the same, each of the segmented drive lines being formed of first and second drive line segments forming a pair, and a number of trunks for supplying electric power to the segmented drive lines. Each of the trunks includes a first conductor strip extending from a first side of the memory cell array toward a second side for connection to a plurality of the first drive line segments upon crossing the same, and a second conductor strip extending from the second side of the memory cell array toward the first side for connection to a plurality of the second drive line segments upon crossing the same. The first and second conductor strips have distal end parts having a reduced width and a mutually complementary shape, such that the first and second conductor strips are disposed to form a straight strip having a substantially constant width throughout the memory cell array.