MAGNET CONFIGURATIONS FOR RADIAL UNIFORMITY TUNING OF ICP PLASMAS
    21.
    发明申请
    MAGNET CONFIGURATIONS FOR RADIAL UNIFORMITY TUNING OF ICP PLASMAS 审中-公开
    ICP等离子体径向均匀调谐的磁铁配置

    公开(公告)号:US20160225590A1

    公开(公告)日:2016-08-04

    申请号:US14985688

    申请日:2015-12-31

    IPC分类号: H01J37/32

    CPC分类号: H01J37/32669 H01J37/3211

    摘要: Embodiments described herein generally relate to plasma process apparatus. In one embodiment, the plasma process apparatus includes a plasma source assembly. The plasma source assembly may include a first coil, a second coil surrounding the first coil, and a magnetic device disposed outside the first and inside the second coil. The magnet enables additional tuning which improves uniformity control of the processes on the substrate.

    摘要翻译: 本文描述的实施例一般涉及等离子体处理装置。 在一个实施例中,等离子体处理装置包括等离子体源组件。 等离子体源组件可以包括第一线圈,围绕第一线圈的第二线圈和设置在第二线圈的第一和内侧的磁性装置。 该磁体可实现额外的调谐,从而提高基板上工艺的均匀性控制。

    Digital phase controller for two-phase operation of a plasma reactor
    22.
    发明授权
    Digital phase controller for two-phase operation of a plasma reactor 有权
    数字相位控制器,用于等离子体反应器的两相操作

    公开(公告)号:US09312106B2

    公开(公告)日:2016-04-12

    申请号:US14174511

    申请日:2014-02-06

    IPC分类号: H05B41/16 H01J37/32

    摘要: Phase angle between opposing electrodes in a plasma reactor is controlled in accordance with a user selected phase angle. Direct digital synthesis of RF waveforms of different phases for the different electrodes is employed. The synthesis is synchronized with a reference clock. The address generator employed for direct digital synthesis is synchronized with an output clock signal that is generated in phase with the reference clock using a phase lock loop. The phase lock loop operates only during a limited initialization period.

    摘要翻译: 根据用户选择的相位角来控制等离子体反应器中的相对电极之间的相位角。 采用不同电极的不同相的RF波形的直接数字合成。 该合成与参考时钟同步。 用于直接数字合成的地址发生器与使用锁相环与参考时钟同相产生的输出时钟信号同步。 锁相环只在有限的初始化时段内工作。

    Photoresist treatment method by low bombardment plasma
    23.
    发明授权
    Photoresist treatment method by low bombardment plasma 有权
    光刻胶处理方法采用低轰击等离子体

    公开(公告)号:US09177824B2

    公开(公告)日:2015-11-03

    申请号:US14301847

    申请日:2014-06-11

    摘要: Methods for reducing the line width roughness on a photoresist pattern are provided herein. In some embodiments, a method of processing a patterned photoresist layer disposed atop a substrate includes flowing a process gas into a processing volume of a process chamber having the substrate disposed therein; forming a plasma within the process chamber from the process gas, wherein the plasma has a ion energy of about 1 eV to about 10 eV; and etching the patterned photoresist layer with species from the plasma to at least one of smooth a line width roughness of a sidewall of the patterned photoresist layer or remove debris.

    摘要翻译: 本文提供了减少光致抗蚀剂图案上的线宽粗糙度的方法。 在一些实施例中,处理设置在基板顶上的图案化光致抗蚀剂层的方法包括将工艺气体流入其中布置有衬底的处理室的处理容积; 在所述处理室内从所述处理气体形成等离子体,其中所述等离子体具有约1eV至约10eV的离子能; 以及将来自等离子体的物质的图案化光致抗蚀剂层蚀刻成图案化光致抗蚀剂层的侧壁的线宽粗糙度的至少一个或去除碎屑。

    SEMICONDUCTOR SYSTEM ASSEMBLIES AND METHODS OF OPERATION
    25.
    发明申请
    SEMICONDUCTOR SYSTEM ASSEMBLIES AND METHODS OF OPERATION 审中-公开
    半导体系统组装和操作方法

    公开(公告)号:US20150170879A1

    公开(公告)日:2015-06-18

    申请号:US14108683

    申请日:2013-12-17

    IPC分类号: H01J37/32

    摘要: An exemplary semiconductor processing system may include a high-frequency electrical source that has an outlet plug. The system may include a processing chamber having a top plate, and an inlet assembly coupled with the top plate. The inlet assembly may include an electrode defining an aperture at a first end and configured to receive the outlet plug. The aperture may be characterized at the first end by a first diameter, and a second end of the aperture opposite the first end may be characterized by a second diameter less than the first diameter. The inlet assembly may further include an inlet insulator coupled with the top plate and configured to electrically insulate the top plate from the electrode.

    摘要翻译: 示例性的半导体处理系统可以包括具有出口插头的高频电源。 该系统可以包括具有顶板的处理室和与顶板联接的入口组件。 入口组件可以包括在第一端限定孔并且被配置为接收出口塞的电极。 孔可以在第一端被表征为第一直径,并且与第一端相对的孔的第二端的特征在于小于第一直径的第二直径。 入口组件还可包括与顶板耦合的入口绝缘体并且构造成使顶板与电极电绝缘。

    Methods and apparatus for processing a substrate

    公开(公告)号:US11538663B2

    公开(公告)日:2022-12-27

    申请号:US17183034

    申请日:2021-02-23

    IPC分类号: H03H7/38 H01J37/32

    摘要: Methods and apparatus for processing a substrate are provided herein. For example, a matching network configured for use with a plasma processing chamber comprises an input configured to receive one or more radio frequency (RF) signals, an output configured to deliver the one or more RF signals to a processing chamber, a first variable capacitor disposed between the input and the output, a second variable capacitor disposed in parallel to the first variable capacitor, a third variable capacitor connected in parallel with each of the first variable capacitor and the second variable capacitor and in series with a transistor switch, and a controller configured to tune the matching network between a first frequency for high-power operation and a second frequency for low-power operation.