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公开(公告)号:US20230175123A1
公开(公告)日:2023-06-08
申请号:US18051321
申请日:2022-10-31
Applicant: APPLIED MATERIALS, INC.
Inventor: James D. Carducci , Kenneth S. Collins , Kartik Ramaswamy
IPC: C23C16/44 , C23C16/455 , C23C16/458
CPC classification number: C23C16/4401 , C23C16/4412 , C23C16/45565 , C23C16/4585 , C23C16/4586
Abstract: Certain embodiments of the present disclosure relate to chamber liners, processing chambers that include chamber liners, and methods of using the same. In one embodiment, a method of operating a processing chamber includes causing a chamber liner within the processing chamber to move to a loading position to allow a substrate to be inserted through an access port of the processing chamber into an interior volume of the processing chamber. The method further includes causing the chamber liner to move to an operation position that blocks the access port after the substrate has been inserted into the interior volume. The method further includes generating a plasma using a cathode assembly.
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公开(公告)号:US20230057145A1
公开(公告)日:2023-02-23
申请号:US17831781
申请日:2022-06-03
Applicant: Applied Materials, Inc.
Inventor: DAISUKE SHIMIZU , Kenji Takeshita , James D. Carducci , Li Ling , Hikaru Watanabe , Kenneth S. Collins , Michael R. Rice
IPC: H01J37/32 , H01L21/3065
Abstract: A plasma treatment chamber comprises one or more sidewalls and a support surface within the sidewalls holds a workpiece. An array of individual gas injectors is distributed about the sidewalls. Pump ports are along the sidewalls to eject gas from the chamber. Aa etch rate uniformity of a material on the workpiece is controlled by: using the array gas injectors to inject one or more gas flows in across the workpiece; injecting a first gas flow from a first set of adjacent individual gas injectors to etch the materials on the workpiece; and simultaneously injecting a second gas flow from remaining gas injectors. The second gas flow either dilutes the first gas flow to reduce an area on the workpiece having a faster etch rate, or acts as an additional etchant to increase the etch rate in the area of the workpiece having the faster etch rate.
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公开(公告)号:US11355321B2
公开(公告)日:2022-06-07
申请号:US15630828
申请日:2017-06-22
Applicant: Applied Materials, Inc.
Inventor: Kenneth S. Collins , Michael R. Rice , Kartik Ramaswamy , James D. Carducci
IPC: H01J37/32 , C23C16/458 , C23C16/54 , C23C16/509 , C23C16/455
Abstract: A processing tool for a plasma process includes a chamber body that has an interior space that provides a plasma chamber and that has a ceiling and an opening on a side opposite the ceiling, a workpiece support to hold a workpiece such that at least a portion of a front surface of the workpiece faces the opening, an actuator to generate relative motion between the chamber body and the workpiece support such that the opening moves laterally across the workpiece, a gas distributor to deliver a processing gas to the plasma chamber, an electrode assembly comprising a plurality of coplanar filaments extending laterally through the plasma chamber between the workpiece support and the ceiling, each of the plurality of filaments including a conductor, and a first RF power source to supply a first RF power to the conductors of the electrode assembly to form a plasma.
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公开(公告)号:US10475626B2
公开(公告)日:2019-11-12
申请号:US14660531
申请日:2015-03-17
Applicant: APPLIED MATERIALS, INC.
Inventor: Kenneth S. Collins , Kartik Ramaswamy , James D. Carducci , Shahid Rauf , Leonid Dorf , Yang Yang
Abstract: A reactor with an overhead electron beam source is capable of generating an ion-ion plasma for performing an atomic layer etch process.
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公开(公告)号:US20190330748A1
公开(公告)日:2019-10-31
申请号:US16505530
申请日:2019-07-08
Applicant: Applied Materials, Inc.
Inventor: Andrew Nguyen , Kenneth S. Collins , Kartik Ramaswamy
Abstract: A gas distribution hub for a plasma reactor chamber has a nozzle includes an inner gas injection passage and an outer gas injection passage, each open to a bottom surface of the hub. For each of the inner and outer gas injection passages, multiple radial elevated feed lines have input ends at a periphery of the hub to receive gas and output ends overlying the respective gas injection passage. Respective axial drop lines connect the respective output ends of the radial elevated feed lines to the respective gas injection passages.
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公开(公告)号:US10418225B2
公开(公告)日:2019-09-17
申请号:US16107855
申请日:2018-08-21
Applicant: Applied Materials, Inc.
Inventor: Kenneth S. Collins , Michael R. Rice , Kartik Ramaswamy , James D. Carducci , Yue Guo , Olga Regelman
IPC: H01J37/32
Abstract: Embodiments of the disclosure provide a plasma source assembly and process chamber design that can be used for any number of substrate processing techniques. The plasma source may include a plurality of discrete electrodes that are integrated with a reference electrode and a gas feed structure to generate a uniform, stable and repeatable plasma during processing. The plurality of discrete electrodes include an array of electrodes that can be biased separately, in groups or all in unison, relative to a reference electrode. The plurality of discrete electrodes may include a plurality of conductive rods that are positioned to generate a plasma within a processing region of a process chamber. The plurality of discrete electrodes is provided RF power from standing or traveling waves imposed on a power distribution element to which the electrodes are connected.
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公开(公告)号:US10312056B2
公开(公告)日:2019-06-04
申请号:US16059608
申请日:2018-08-09
Applicant: Applied Materials, Inc.
Inventor: Kenneth S. Collins , Michael R. Rice , Kartik Ramaswamy , James D. Carducci , Yue Guo , Olga Regelman
IPC: H01J37/32
Abstract: Embodiments of the disclosure provide a plasma source assembly and process chamber design that can be used for any number of substrate processing techniques. The plasma source may include a plurality of discrete electrodes that are integrated with a reference electrode and a gas feed structure to generate a uniform, stable and repeatable plasma during processing. The plurality of discrete electrodes include an array of electrodes that can be biased separately, in groups or all in unison, relative to a reference electrode. The plurality of discrete electrodes may include a plurality of conductive rods that are positioned to generate a plasma within a processing region of a process chamber. The plurality of discrete electrodes is provided RF power from standing or traveling waves imposed on a power distribution element to which the electrodes are connected.
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公开(公告)号:US10242888B2
公开(公告)日:2019-03-26
申请号:US13998723
申请日:2013-11-26
Applicant: Applied Materials, Inc.
Inventor: Jennifer Y. Sun , Ren-Guan Duan , Jie Yuan , Li Xu , Kenneth S. Collins
IPC: C04B35/486 , C04B35/505 , H01L21/67
Abstract: A solid solution-comprising ceramic article useful in semiconductor processing, which article may be in the form of a solid, bulk ceramic, or may be in the form of a substrate having a ceramic coating of the same composition as the bulk ceramic material on at least one outer surface. The ceramic article is resistant to erosion by halogen-containing plasmas and provides advantageous mechanical properties. The solid solution-comprising ceramic article is formed from a combination of yttrium oxide and zirconium oxide. The ceramic-comprising article includes ceramic which is formed from zirconium oxide at a molar concentration ranging from about 96 mole % to about 91 mole %, and yttrium oxide at a molar concentration ranging from about 4 mole % to about 9 mole %.
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公开(公告)号:US20180308661A1
公开(公告)日:2018-10-25
申请号:US15630748
申请日:2017-06-22
Applicant: Applied Materials, Inc.
Inventor: Kenneth S. Collins , Michael R. Rice , Kartik Ramaswamy , James D. Carducci
IPC: H01J37/32 , C23C16/507 , C23C16/54
CPC classification number: H01J37/32568 , C23C16/45536 , C23C16/45544 , C23C16/507 , C23C16/545 , H01J37/321 , H01J37/32449 , H01J37/32715 , H01J37/3277 , H01J37/32816 , H01J2237/3321 , H01J2237/334 , H01L21/67069 , H01L21/6831 , H01L21/68785
Abstract: A plasma reactor includes a chamber body having an interior space that provides a plasma chamber and having a ceiling, a gas distributor to deliver a processing gas to the plasma chamber, a pump coupled to the plasma chamber to evacuate the chamber, a workpiece support to hold a workpiece facing the ceiling, an intra-chamber electrode assembly that includes an insulating frame and a filament extending laterally through the plasma chamber between the ceiling and the workpiece support, the filament including a conductor at least partially surrounded by an insulating shell that extends from the insulating frame, and a first RF power source to supply a first RF power to the conductor of the intra-chamber electrode assembly.
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公开(公告)号:US20180134612A1
公开(公告)日:2018-05-17
申请号:US15865720
申请日:2018-01-09
Applicant: Applied Materials, Inc.
Inventor: Jennifer Y. Sun , Ren-Guan Duan , Kenneth S. Collins
CPC classification number: C03C10/16 , C03C3/247 , C03C3/325 , C03C8/24 , C03C2204/00 , C04B35/119 , C04B37/005 , C04B2235/3201 , C04B2235/3206 , C04B2235/3225 , C04B2235/445 , C04B2235/5445 , C04B2235/6562 , C04B2235/6565 , C04B2235/6567 , C04B2235/80 , C04B2237/06 , C04B2237/064 , C04B2237/08 , C04B2237/10 , C04B2237/34 , C04B2237/343 , C04B2237/60 , C04B2237/708 , C04B2237/72 , H01L21/6719
Abstract: A bonded ceramic component which is resistant to reactive halogen-containing plasmas, said component comprising ceramic portions which are bonded together by a bonding material which includes an oxyfluoride glass-ceramic-comprising transition area between interfaces of the ceramic portions, where the transition area includes form at least 0.1 volume % amorphous phase up to about 50 volume % amorphous phase.
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