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35 条记录 (耗时 0.019 秒)

    MICROSCOPE AND MICROSCOPY METHOD
    12.
    发明申请
    MICROSCOPE AND MICROSCOPY METHOD 审中-公开
    微观和微观方法

    公开(公告)号：US20170010453A1

    公开(公告)日：2017-01-12

    申请号：US15275359

    申请日：2016-09-24

    申请人： OLYMPUS CORPORATION

    发明人： Kentaro IMOTO ,  Shinichi TAKIMOTO ,  Shintaro TAKAHASHI ,  Atsushi DOI

    IPC分类号： G02B21/00 ,  G01N21/64

    CPC分类号： G02B21/0076 ,  G01N21/6458 ,  G01N2201/06113 ,  G01N2201/1053 ,  G01N2201/12 ,  G02B21/0032 ,  G02B21/006 ,  G02B21/0068 ,  G02B21/008 ,  G02B21/0084

    摘要： Provided is a microscope provided with: a scanner that scans an excitation beam coming from a light source; an objective optical system that focuses the scanned excitation beam onto a sample and that collects fluorescence generated at individual scanning positions in the sample; a detector that detects the collected fluorescence; a light blocking member that is disposed between the detector and the system and that partially blocks the collected fluorescence; a switching portion that switches the positional relationship between the member and a light-focusing point of the excitation beam in the sample between an optically conjugate positional relationship, in which an in-focus fluorescence generated at the light-focusing point passes through the member, and a non-conjugate positional relationship, in which the in-focus fluorescence is blocked by the member; and a computing portion that computes a difference between fluorescence signals acquired by the detector in the two positional relationships.

    摘要翻译： 提供了一种显微镜，其具有：扫描来自光源的激发光束的扫描仪; 物镜光学系统，其将扫描的激发光束聚焦到样品上并且收集样品中各个扫描位置产生的荧光; 检测所收集的荧光的检测器; 光阻挡构件，其设置在所述检测器和所述系统之间并部分阻挡所述收集的荧光; 切换部，其以在所述光聚合点处产生的聚焦荧光透过所述构件的光学共轭位置关系之间切换所述构件与所述样品中的所述激发光束的聚光点之间的位置关系， 以及非共轭位置关系，其中聚焦荧光被构件阻挡; 以及计算部分，其计算由两个位置关系中的检测器获取的荧光信号之间的差异。

    Non-ionizing imager
    13.
    发明授权
    Non-ionizing imager 有权
    非电离成像仪

    公开(公告)号：US09084535B2

    公开(公告)日：2015-07-21

    申请号：US12594095

    申请日：2008-03-28

    申请人： John Michael Girkin ,  Simon Poland ,  Christopher Longbottom

    发明人： John Michael Girkin ,  Simon Poland ,  Christopher Longbottom

    IPC分类号： A61B6/14 ,  A61B5/00 ,  G01N21/49 ,  G01N21/359 ,  G01N21/47

    CPC分类号： A61B5/0088 ,  A61B5/0082 ,  G01N21/359 ,  G01N21/49 ,  G01N2021/4707 ,  G01N2021/4719 ,  G01N2201/1053 ,  G01N2201/1085

    摘要： A medical imager, primarily for use in oral and dental applications. The imager has a source for providing a plurality of collimated beams of non-ionizing radiation, in particular near-infrared light, and a plurality of correlated detectors. Each detector is arranged to receive unscattered light from one or part of one of said collimated beams and scattered light from one or more other beams. The imager further comprises means for using both the unscattered and scattered light to form an image.

    摘要翻译： 一种医用成像仪，主要用于口腔和牙科应用。 成像器具有用于提供多个非电离辐射的准直束，特别是近红外光的源和多个相关检测器的源。 每个检测器布置成从所述准直束中的一个或一部分接收未散射的光并且来自一个或多个其它光束的散射光。 成像器还包括用于使用未散射光和散射光两者来形成图像的装置。

    OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE
    14.
    发明申请
    OPTICAL METROLOGY SYSTEM FOR SPECTRAL IMAGING OF A SAMPLE 有权
    用于光谱成像的光学计量系统

    公开(公告)号：US20150146193A1

    公开(公告)日：2015-05-28

    申请号：US14091199

    申请日：2013-11-26

    申请人： Nanometrics Incorporated

    发明人： Andrzej Buczkowski

    IPC分类号： G01N21/64 ,  G01N21/55 ,  G01N21/47

    CPC分类号： G01N21/6489 ,  G01B11/0625 ,  G01N21/47 ,  G01N21/55 ,  G01N21/6456 ,  G01N21/88 ,  G01N21/9501 ,  G01N2021/4735 ,  G01N2021/646 ,  G01N2021/8822 ,  G01N2201/06113 ,  G01N2201/1042 ,  G01N2201/1053 ,  H04N3/155

    摘要： An optical metrology device is capable of detection of any combination of photoluminescence light, specular reflection of broadband light, and scattered light from a line across the width of a sample. The metrology device includes a first light source that produces a first illumination line on the sample. A scanning system may be used to scan an illumination spot across the sample to form the illumination line. A detector spectrally images the photoluminescence light emitted along the illumination line. Additionally, a broadband illumination source may be used to produce a second illumination line on the sample, where the detector spectrally images specular reflection of the broadband illumination along the second illumination line. The detector may also image scattered light from the first illumination line. The illumination lines may be scanned across the sample so that all positions on the sample may be measured.

    摘要翻译： 光学测量装置能够检测光致发光的任何组合，宽带光的镜面反射以及穿过样品宽度的线的散射光。 测量装置包括在样品上产生第一照明线的第一光源。 可以使用扫描系统扫描样品上的照明点以形成照明线。 检测器对沿着照明线发射的光致发光进行光谱成像。 另外，宽带照明源可以用于在样本上产生第二照明线，其中检测器对第二照明线的宽带照明进行光谱反射。 检测器还可以对来自第一照明线的散射光进行成像。 可以在样品上扫描照明线，使得可以测量样品上的所有位置。

    Foreign particle detecting method and apparatus
    16.
    发明授权
    Foreign particle detecting method and apparatus 失效
    异物检测方法及装置

    公开(公告)号：US4669875A

    公开(公告)日：1987-06-02

    申请号：US548516

    申请日：1983-11-03

    申请人： Masataka Shiba ,  Sachio Uto ,  Mitsuyoshi Koizumi

    发明人： Masataka Shiba ,  Sachio Uto ,  Mitsuyoshi Koizumi

    IPC分类号： G01N15/02 ,  G01N21/94 ,  G01N21/32

    CPC分类号： G01N21/94 ,  G01N2015/0238 ,  G01N2021/4792 ,  G01N2201/1053

    摘要： The foreign particle detecting method and apparatus are disclosed wherein a polarized laser beam emitted by a laser beam irradiating system from a direction inclined with respect to the direction perpendicular to the surface of a substrate is used by a scanning means to linearly scan the substrate surface from a direction approximately 90.degree. with respect to the laser light irradiating direction; and the laser light reflected from a foreign particle on the substrate surface is detected by a polarized light analyzer and a photoelectric conversion device from a direction set approximately equal to said scanning direction and inclined with respect to the direction perpendicular to the substrate surface.

    摘要翻译： 公开了一种外来粒子检测方法和装置，其中通过扫描装置使用激光束照射系统从相对于垂直于衬底表面的方向倾斜的方向发射的偏振激光束线性扫描衬底表面 相对于激光照射方向大约90°的方向; 并且通过偏振光分析仪和光电转换装置从基本上等于所述扫描方向的方向检测从基板表面上的异物引起的反射的激光，并且相对于垂直于基板表面的方向倾斜。

    WELDING MONITORING SYSTEM AND WELDING MONITORING METHOD
    17.
    发明申请
    WELDING MONITORING SYSTEM AND WELDING MONITORING METHOD 审中-公开

    公开(公告)号：US20180321162A1

    公开(公告)日：2018-11-08

    申请号：US16032371

    申请日：2018-07-11

    申请人： Hitachi, Ltd.

    发明人： Ryoji NAKAGAWA ,  Hisashi ENDOU ,  Hiroshi YOSHIKAWA ,  Toshihiro YAMADA ,  Nobuhiro KAKENO

    IPC分类号： G01N21/88 ,  B23K37/04

    CPC分类号： G01N21/8806 ,  B23K31/125 ,  B23K37/04 ,  G01N2201/1053

    摘要： There are provided a welding monitoring system which can multidimensionally monitor a welding portion with high accuracy and a monitoring method thereof, by using a relatively simple configuration.There is provided a welding monitoring system which monitors a subject, including: a mechanical portion; and an imaging portion, in which the mechanical portion includes a transport arm which transports the subject, a subject holding portion which holds the subject, and an energizing device which causes welding with respect to the subject to be performed, and in which the imaging portion includes imaging means for obtaining imaging data of the subject, a data recording portion which records the imaging data, an analyzing portion which extracts predetermined characteristics from the imaging data, a comparison determination portion which compares the extracted characteristics and normal characteristics to each other to determine the presence or absence of abnormality, and a determination result output portion which outputs a determination result by the comparison determination portion.